Y. Eo

997 total citations · 1 hit paper
7 papers, 753 citations indexed

About

Y. Eo is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Hardware and Architecture. According to data from OpenAlex, Y. Eo has authored 7 papers receiving a total of 753 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Electrical and Electronic Engineering, 1 paper in Atomic and Molecular Physics, and Optics and 1 paper in Hardware and Architecture. Recurrent topics in Y. Eo's work include Electromagnetic Compatibility and Noise Suppression (3 papers), Low-power high-performance VLSI design (2 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). Y. Eo is often cited by papers focused on Electromagnetic Compatibility and Noise Suppression (3 papers), Low-power high-performance VLSI design (2 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). Y. Eo collaborates with scholars based in South Korea and United States. Y. Eo's co-authors include W.R. Eisenstadt, Jong‐In Shim, Jin Wu, Seung‐Jun Shin, Haiming Yu, Jae-Kyung Wee, Oh‐Kyong Kwon and Dong-Hoon Jang and has published in prestigious journals such as Electronics Letters, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Components Hybrids and Manufacturing Technology.

In The Last Decade

Y. Eo

7 papers receiving 718 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

S-parameter-based IC interconnect transmission line characterization

1992 478 citations W.R. Eisenstadt, Y. Eo IEEE Transactions on Components Hybrids and Manufacturing Technology profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Y. Eo South Korea	5	733	98	56	55	40	7	753
Kristof Vaesen Belgium	19	1.0k 1.4×	171 1.7×	169 3.0×	46 0.8×	13 0.3×	64	1.1k
M. Tazlauanu United States	8	531 0.7×	83 0.8×	52 0.9×	40 0.7×	9 0.2×	23	542
Reydezel Torres‐Torres Mexico	14	641 0.9×	62 0.6×	51 0.9×	53 1.0×	31 0.8×	99	686
Haigang Feng China	17	995 1.4×	334 3.4×	90 1.6×	43 0.8×	25 0.6×	93	1.0k
D. Gloria France	16	589 0.8×	158 1.6×	43 0.8×	71 1.3×	6 0.1×	57	654
Scott S. Gerber United States	15	372 0.5×	109 1.1×	42 0.8×	20 0.4×	13 0.3×	40	438
L. Pradell Spain	15	657 0.9×	198 2.0×	170 3.0×	96 1.7×	9 0.2×	94	683
Philippe Eudeline France	9	563 0.8×	117 1.2×	51 0.9×	35 0.6×	16 0.4×	42	588
O K.K. United States	20	1.2k 1.6×	71 0.7×	207 3.7×	73 1.3×	8 0.2×	32	1.2k
Peng Gu China	11	453 0.6×	127 1.3×	43 0.8×	30 0.5×	12 0.3×	39	518

Countries citing papers authored by Y. Eo

Since Specialization

Citations

This map shows the geographic impact of Y. Eo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Eo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Eo more than expected).

Fields of papers citing papers by Y. Eo

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Eo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Eo. The network helps show where Y. Eo may publish in the future.

Co-authorship network of co-authors of Y. Eo

This figure shows the co-authorship network connecting the top 25 collaborators of Y. Eo. A scholar is included among the top collaborators of Y. Eo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. Eo. Y. Eo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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7 of 7 papers shown

1.

Eo, Y., et al.. (2013). Experimental characterisations of thin film transmission line losses. Electronics Letters. 49(17). 1084–1086. 2 indexed citations

2.

Eo, Y., Seung‐Jun Shin, W.R. Eisenstadt, & Jong‐In Shim. (2004). A Decoupling Technique for Efficient Timing Analysis of VLSI Interconnects With Dynamic Circuit Switching. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 23(9). 1321–1337. 11 indexed citations

3.

Shim, Jong‐In, et al.. (2004). Fe-doped InP semi-insulating buried heterostructure for high speed and high power operations in directly modulated semiconductor laser. Electronics Letters. 40(15). 937–938. 2 indexed citations

4.

Wu, Jin, et al.. (2002). Silicon substrate coupling noise modeling, analysis, and experimental verification for mixed signal integrated circuit design. The Royal Society of Chemistry’s Journals, Books and Databases (The Royal Society of Chemistry). 3. 1727–1730. 18 indexed citations

5.

Eo, Y., et al.. (2002). Interconnect capacitance, crosstalk, and signal delay for 0.35 μm CMOS technology. 619–622. 15 indexed citations

6.

Eo, Y. & W.R. Eisenstadt. (1993). High-speed VLSI interconnect modeling based on S-parameter measurements. IEEE Transactions on Components Hybrids and Manufacturing Technology. 16(5). 555–562. 227 indexed citations

7.

Eisenstadt, W.R. & Y. Eo. (1992). S-parameter-based IC interconnect transmission line characterization. IEEE Transactions on Components Hybrids and Manufacturing Technology. 15(4). 483–490. 478 indexed citations breakdown →

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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