Y. Eo
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- Electromagnetic Compatibility and Noise Suppression 3
- Low-power high-performance VLSI design 2
- Advancements in Semiconductor Devices and Circuit Design 2
- Radio Frequency Integrated Circuit Design 2
- Microwave and Dielectric Measurement Techniques 2
- Semiconductor materials and devices 2
- VLSI and FPGA Design Techniques 1
- Hardware and Architecture top 10%
- Aerospace Engineering top 10%
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- Copper Interconnects and Reliability 1
- Co-authors
- W.R. EisenstadtJong‐In ShimJin WuHaiming YuSeung‐Jun ShinJae-Kyung WeeOh‐Kyong KwonDong-Hoon Jang
- Journals
- Electronics Letters (2 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)IEEE Transactions on Components Hybrids and Manufacturing Technology (2 papers)
- Partner nations
- South KoreaUnited States
In The Last Decade
Y. Eo
7 papers receiving 718 citations
Hit Papers
Peers
Comparison fields: 5 of 29
- Electrical and Electronic Engineering 733
- Hardware and Architecture 32
- Aerospace Engineering 98
- Electronic, Optical and Magnetic Materials 40
- Atomic and Molecular Physics, and Optics 55
Countries citing papers authored by Y. Eo
This map shows the geographic impact of Y. Eo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Eo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Eo more than expected).
Fields of papers citing papers by Y. Eo
This network shows the impact of papers produced by Y. Eo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Eo. The network helps show where Y. Eo may publish in the future.
Co-authorship network
The 8 scholars most cited alongside Y. Eo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 2 | |
| 2 | 2004 | 11 | |
| 3 | 2004 | 2 | |
| 4 | 2002 | 18 | |
| 5 | 2002 | 15 | |
| 6 | 1993 | 227 | |
| 7 | S-parameter-based IC interconnect transmission line characterizationbreakdown → | 1992 | 478 |
About Y. Eo
Y. Eo is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 7 papers that have together received 753 indexed citations. Recurring topics across this work include Electromagnetic Compatibility and Noise Suppression (3 papers), Low-power high-performance VLSI design (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Radio Frequency Integrated Circuit Design (2 papers), Microwave and Dielectric Measurement Techniques (2 papers), Semiconductor materials and devices (2 papers), Copper Interconnects and Reliability (1 paper) and VLSI and FPGA Design Techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (733 citations), Hardware and Architecture (32 citations) and Aerospace Engineering (98 citations). Y. Eo has collaborated with scholars based in South Korea and United States. Frequent co-authors include W.R. Eisenstadt, Jong‐In Shim, Jin Wu, Haiming Yu, Seung‐Jun Shin, Jae-Kyung Wee, Oh‐Kyong Kwon and Dong-Hoon Jang. Their work appears in journals such as Electronics Letters, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Components Hybrids and Manufacturing Technology and The Royal Society of Chemistry’s Journals, Books and Databases (The Royal Society of Chemistry).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.