R. Swanepoel

5.1k total citations · 2 hit papers
22 papers, 4.4k citations indexed

About

R. Swanepoel is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, R. Swanepoel has authored 22 papers receiving a total of 4.4k indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 18 papers in Materials Chemistry and 5 papers in Computational Mechanics. Recurrent topics in R. Swanepoel's work include Thin-Film Transistor Technologies (14 papers), Phase-change materials and chalcogenides (7 papers) and Silicon Nanostructures and Photoluminescence (7 papers). R. Swanepoel is often cited by papers focused on Thin-Film Transistor Technologies (14 papers), Phase-change materials and chalcogenides (7 papers) and Silicon Nanostructures and Photoluminescence (7 papers). R. Swanepoel collaborates with scholars based in South Africa, Netherlands and Spain. R. Swanepoel's co-authors include J.B. Ramírez-Malo, P. Villares, E. Márquez, R. Jiménez-Garay, G. Myburg, Vivian Alberts, M.J. van Staden, M. J. Witcomb, P.C.P. Bronsveld and Kittessa T Roro and has published in prestigious journals such as Journal of Materials Science, Solar Energy Materials and Solar Cells and Thin Solid Films.

In The Last Decade

R. Swanepoel

22 papers receiving 4.2k citations

Hit Papers

Determination of the thickness and optical constants of a... 1983 2026 1997 2011 1983 1984 1000 2.0k 3.0k
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Determination of the thickness and optical constants of amorphous silicon
    1983 3.4k citations R. Swanepoel Journal of Physics E Scientific Instruments profile →
  2. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
    1984 632 citations R. Swanepoel Journal of Physics E Scientific Instruments profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Swanepoel South Africa 10 3.6k 3.2k 663 567 534 22 4.4k
J.-C. Manifacier France 16 2.1k 0.6× 2.2k 0.7× 313 0.5× 539 1.0× 327 0.6× 56 2.9k
W. Beyer Germany 39 3.9k 1.1× 4.2k 1.3× 269 0.4× 582 1.0× 278 0.5× 227 5.1k
T. Wágner Czechia 31 3.0k 0.8× 2.3k 0.7× 673 1.0× 425 0.7× 477 0.9× 220 3.8k
R. Carius Germany 36 3.8k 1.1× 4.3k 1.4× 634 1.0× 728 1.3× 201 0.4× 230 5.1k
A. Slaoui France 32 2.8k 0.8× 3.0k 0.9× 730 1.1× 536 0.9× 444 0.8× 289 4.0k
Dinesh K. Pandya India 30 4.4k 1.2× 3.7k 1.2× 363 0.5× 731 1.3× 1.1k 2.1× 154 5.2k
C. H. Kam Singapore 33 2.1k 0.6× 1.6k 0.5× 596 0.9× 889 1.6× 335 0.6× 159 3.1k
A. H. Mahan United States 35 3.0k 0.8× 4.0k 1.2× 206 0.3× 282 0.5× 400 0.7× 149 4.5k
V. Cimalla Germany 39 2.8k 0.8× 3.3k 1.0× 1.5k 2.3× 1.1k 1.9× 1.3k 2.5× 263 5.5k
G. Lucovsky United States 33 2.8k 0.8× 3.5k 1.1× 464 0.7× 745 1.3× 522 1.0× 136 4.2k

Countries citing papers authored by R. Swanepoel

Since Specialization
Citations

This map shows the geographic impact of R. Swanepoel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Swanepoel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Swanepoel more than expected).

Fields of papers citing papers by R. Swanepoel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Swanepoel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Swanepoel. The network helps show where R. Swanepoel may publish in the future.

Co-authorship network of co-authors of R. Swanepoel

This figure shows the co-authorship network connecting the top 25 collaborators of R. Swanepoel. A scholar is included among the top collaborators of R. Swanepoel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Swanepoel. R. Swanepoel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Knoesen, D., R. Swanepoel, B.A. Julies, et al.. (2010). Synthesis of nanocrystalline silicon thin films using the increase of the deposition pressure in the hot-wire chemical vapour deposition technique. South African Journal of Science. 105(7/8). 7 indexed citations
2.
Knoesen, D., R. Swanepoel, B.A. Julies, et al.. (2007). Improved stability of intrinsic nanocrystalline Si thin films deposited by hot-wire chemical vapour deposition technique. Thin Solid Films. 515(20-21). 8040–8044. 14 indexed citations
3.
Roro, Kittessa T, et al.. (2007). Infrared characterization of ZnO films on Si substrates. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 5(2). 566–568. 6 indexed citations
4.
5.
Swanepoel, R., et al.. (1998). The role of the ZnO buffer layer in Al/Si interdiffusion in α-Si:H solar cells on flexible substrates. Solar Energy Materials and Solar Cells. 51(3-4). 425–432. 13 indexed citations
6.
Swanepoel, R., et al.. (1998). The influence of metal contacts and ZnO buffer-layer on the low-temperature crystallization of α-Si:H in flexible solar cells. Solar Energy Materials and Solar Cells. 53(3-4). 329–332. 2 indexed citations
7.
Alberts, Vivian, R. Swanepoel, & M. J. Witcomb. (1998). Material properties of CuInSe2 prepared by H2Se treatment of CuIn alloys. Journal of Materials Science. 33(11). 2919–2925. 6 indexed citations
8.
Swanepoel, R., et al.. (1997). XRD analysis of ZnO thin films prepared by spray pyrolysis. Thin Solid Films. 299(1-2). 72–77. 119 indexed citations
9.
Alberts, Vivian & R. Swanepoel. (1996). Structural analysis of CuInSe2 thin films prepared by selenization of Cu-In films. Journal of Materials Science Materials in Electronics. 7(2). 19 indexed citations
10.
Ramírez-Malo, J.B., et al.. (1995). Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only. Applied Optics. 34(34). 7907–7907. 18 indexed citations
11.
Márquez, E., J.B. Ramírez-Malo, P. Villares, R. Jiménez-Garay, & R. Swanepoel. (1995). Optical characterization of wedge-shaped thin films of amorphous arsenic trisulphide based only on their shrunk transmission spectra. Thin Solid Films. 254(1-2). 83–91. 97 indexed citations
12.
Myburg, G. & R. Swanepoel. (1988). On the Uniformity of Thin a-Si:H Films Prepared in an RF-Glow Discharge System. Japanese Journal of Applied Physics. 27(6R). 899–899. 3 indexed citations
13.
14.
Myburg, G. & R. Swanepoel. (1987). The influence of substrate temperature on the deposition rate and optical properties of a-Si:H thin films prepared by RF-glow discharge. Journal of Non-Crystalline Solids. 89(1-2). 13–23. 14 indexed citations
15.
16.
Swanepoel, R., Pieter L. Swart, & H. Aharoni. (1985). Influence of argon partial pressure on the electrical and optical properties of sputtered hydrogenated amorphous silicon. Thin Solid Films. 128(3-4). 191–203. 6 indexed citations
17.
Swanepoel, R.. (1985). Determining refractive index and thickness of thin films from wavelength measurements only. Journal of the Optical Society of America A. 2(8). 1339–1339. 110 indexed citations
18.
Swanepoel, R.. (1984). Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films. Journal of Physics E Scientific Instruments. 17(10). 896–903. 632 indexed citations breakdown →
19.
Swanepoel, R.. (1983). Determination of the thickness and optical constants of amorphous silicon. Journal of Physics E Scientific Instruments. 16(12). 1214–1222. 3353 indexed citations breakdown →
20.
Swanepoel, R. & P T Wedepohl. (1981). Carrier scattering by defect clusters in neutron irradiated silicon. Radiation Effects. 55(1-2). 43–47. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by J.-C. Manifacier Breakdown of academic impact, for papers by W. Beyer Breakdown of academic impact, for papers by T. Wágner Breakdown of academic impact, for papers by R. Carius Breakdown of academic impact, for papers by A. Slaoui Breakdown of academic impact, for papers by Dinesh K. Pandya Breakdown of academic impact, for papers by C. H. Kam Breakdown of academic impact, for papers by A. H. Mahan Breakdown of academic impact, for papers by V. Cimalla Breakdown of academic impact, for papers by G. Lucovsky
Rankless by CCL
2026