David C. Gray

400 citations
8 papers · 349 indexed · h-index 5
Topics
Semiconductor materials and devices (7 papers)Plasma Diagnostics and Applications (7 papers)Metal and Thin Film Mechanics (3 papers)
Journals
Journal of The Electrochemical SocietyJournal of Vacuum Science & Technology A Vacuum Surfaces and FilmsJournal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
Partner nations
United States

In The Last Decade

David C. Gray

8 papers receiving 335 citations

Peers

David C. Gray
Comparison fields: 5 of 26
  • Electrical and Electronic Engineering 319
  • Mechanics of Materials 167
  • Materials Chemistry 89
  • Computational Mechanics 67
  • Electronic, Optical and Magnetic Materials 39
Replace L. M. Ephrath with:
L. M. Ephrath United States
Takashi Yunogami Japan
Andrea Dagmar Pajdarová Czechia
A I Zotovich Russia
E. Petrillo United States
A. Grouillet France
B. Anthony United States
D. Barr United States
H. Curtins Switzerland
B. Mizuno Japan
David C. Gray relative to L. M. Ephrath United States L. M. Ephrath's profile →
Citations per field
00.5×
L. M. Ephrath · 1×
Citations per year

Countries citing papers authored by David C. Gray

Since Specialization
Citations

This map shows the geographic impact of David C. Gray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David C. Gray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David C. Gray more than expected).

Fields of papers citing papers by David C. Gray

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David C. Gray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David C. Gray. The network helps show where David C. Gray may publish in the future.

Co-authorship network of co-authors of David C. Gray

This figure shows the co-authorship network connecting the top 25 collaborators of David C. Gray. A scholar is included among the top collaborators of David C. Gray based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David C. Gray. David C. Gray is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

8 of 8 papers shown
#WorkIndexed citations
1 3
2 1
3 45
4 221
5 32
6 3
7 37
8 7

About David C. Gray

David C. Gray is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Mechanics of Materials, having authored 8 papers that have together received 349 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Plasma Diagnostics and Applications (7 papers) and Metal and Thin Film Mechanics (3 papers). The work is most often cited by research in Mechanics of Materials (167 citations), Electrical and Electronic Engineering (319 citations) and Computational Mechanics (67 citations). David C. Gray has collaborated with scholars based in United States. Frequent co-authors include Herbert H. Sawin, John Arnold, Jeffery W. Butterbaugh and Michael T. Mocella. Their work appears in journals such as Journal of The Electrochemical Society, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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