A. J. Syllaios

700 total citations
35 papers, 527 citations indexed

About

A. J. Syllaios is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, A. J. Syllaios has authored 35 papers receiving a total of 527 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 13 papers in Materials Chemistry and 12 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in A. J. Syllaios's work include Advanced Semiconductor Detectors and Materials (16 papers), Thin-Film Transistor Technologies (15 papers) and Semiconductor Quantum Structures and Devices (9 papers). A. J. Syllaios is often cited by papers focused on Advanced Semiconductor Detectors and Materials (16 papers), Thin-Film Transistor Technologies (15 papers) and Semiconductor Quantum Structures and Devices (9 papers). A. J. Syllaios collaborates with scholars based in United States, United Kingdom and Canada. A. J. Syllaios's co-authors include Sameer K. Ajmera, J. H. Tregilgas, Thomas R. Schimert, Roland W. Gooch, C. L. Littler, W. H. Wright, R. E. Hollingsworth, M. J. Williams, Thomas N. Jackson and Elizabeth C. Dickey and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Journal of Non-Crystalline Solids.

In The Last Decade

A. J. Syllaios

32 papers receiving 494 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. J. Syllaios United States 12 489 179 163 123 73 35 527
Vishnu Gopal India 11 422 0.9× 165 0.9× 127 0.8× 131 1.1× 103 1.4× 48 489
J. H. Tregilgas United States 14 436 0.9× 217 1.2× 134 0.8× 46 0.4× 41 0.6× 39 503
Gabriel Lantz Switzerland 10 182 0.4× 277 1.5× 335 2.1× 33 0.3× 20 0.3× 18 602
A. Cornfeld United States 13 572 1.2× 271 1.5× 181 1.1× 19 0.2× 23 0.3× 38 654
Yu. A. Goldberg Russia 11 347 0.7× 200 1.1× 167 1.0× 23 0.2× 13 0.2× 27 485
K. Shinagawa Japan 11 143 0.3× 233 1.3× 106 0.7× 40 0.3× 16 0.2× 81 445
Tadashi Serikawa Japan 11 340 0.7× 54 0.3× 200 1.2× 64 0.5× 11 0.2× 41 420
Per‐Erik Hellström Sweden 16 725 1.5× 204 1.1× 154 0.9× 17 0.1× 11 0.2× 104 811
Tomonobu Hata Japan 13 237 0.5× 56 0.3× 297 1.8× 18 0.1× 25 0.3× 60 449

Countries citing papers authored by A. J. Syllaios

Since Specialization
Citations

This map shows the geographic impact of A. J. Syllaios's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. J. Syllaios with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. J. Syllaios more than expected).

Fields of papers citing papers by A. J. Syllaios

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. J. Syllaios. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. J. Syllaios. The network helps show where A. J. Syllaios may publish in the future.

Co-authorship network of co-authors of A. J. Syllaios

This figure shows the co-authorship network connecting the top 25 collaborators of A. J. Syllaios. A scholar is included among the top collaborators of A. J. Syllaios based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. J. Syllaios. A. J. Syllaios is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Syllaios, A. J., et al.. (2024). Analyzing thermal conductance measurements in microbolometers. 6–6.
2.
Syllaios, A. J., Usha Philipose, C. L. Littler, et al.. (2021). Anomalous hopping in hydrogenated amorphous silicon doped with phosphine. Journal of Non-Crystalline Solids. 564. 120845–120845. 2 indexed citations
3.
Syllaios, A. J., et al.. (2015). 1/f Noise in Mott Variable Range Hopping Conduction in p-type Amorphous Silicon. MRS Proceedings. 1770. 25–30. 1 indexed citations
4.
Syllaios, A. J., et al.. (2014). Raman spectroscopic investigation of boron doped hydrogenated amorphous silicon thin films. Journal of Non-Crystalline Solids. 403. 80–83. 9 indexed citations
5.
Ajmera, Sameer K., et al.. (2011). Influence of microstructure and composition on hydrogenated silicon thin film properties for uncooled microbolometer applications. Journal of Applied Physics. 110(3). 36 indexed citations
6.
Ajmera, Sameer K., et al.. (2011). Performance improvement in amorphous silicon based uncooled microbolometers through pixel design and materials development. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8012. 80121L–80121L. 9 indexed citations
7.
Ajmera, Sameer K., et al.. (2010). Amorphous silicon thin-films for uncooled infrared microbolometer sensors. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7660. 766012–766012. 34 indexed citations
8.
Syllaios, A. J., et al.. (2009). Raman Characterization of Protocrystalline Silicon Films. MRS Proceedings. 1153. 1 indexed citations
9.
Syllaios, A. J., et al.. (2000). Amorphous Silicon Microbolometer Technology. MRS Proceedings. 609. 78 indexed citations
10.
Syllaios, A. J., et al.. (1998). Optical absorption of un-implanted and implanted HgCdTe. Journal of Electronic Materials. 27(6). 703–708. 4 indexed citations
11.
Bevan, M. J., et al.. (1997). Growth of high quality ZnSe on closely lattice-matched InGaAs substrates by metal organic chemical vapor deposition. Journal of Crystal Growth. 170(1-4). 467–471. 3 indexed citations
12.
Syllaios, A. J., et al.. (1997). Application of urbach rule optical absorption to composition measurement of Cd1−yZnyTe. Journal of Electronic Materials. 26(6). 567–570. 11 indexed citations
13.
Tobin, S. P., P. W. Norton, D. Chandler‐Horowitz, et al.. (1995). A comparison of techniques for nondestructive composition measurements in CdZnTe substrates. Journal of Electronic Materials. 24(5). 697–705. 48 indexed citations
14.
Littler, C. L., et al.. (1994). The effect of deep levels on lifetimes in Hg1−xCdxTe. Progress in Crystal Growth and Characterization of Materials. 28(1-2). 145–164. 3 indexed citations
15.
Syllaios, A. J., et al.. (1993). Faraday rotation analysis of HgCdTe. Semiconductor Science and Technology. 8(6S). 953–957.
16.
Syllaios, A. J., et al.. (1986). Electromigration of Copper in HgCdTe. Journal of The Electrochemical Society. 133(1). 230–232. 11 indexed citations
17.
Syllaios, A. J., et al.. (1985). MOS Capacitors on Cadmium Telluride. Journal of The Electrochemical Society. 132(4). 887–889. 3 indexed citations
18.
Colombo, Luigi, et al.. (1985). Growth of large diameter (Hg,Cd)Te crystals by incremental quenching. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(1). 100–104. 6 indexed citations
19.
Syllaios, A. J., et al.. (1985). Reaction Kinetics of Hg1 − xCdxTe / Br2 ‐  CH 3 OH. Journal of The Electrochemical Society. 132(3). 656–659. 9 indexed citations
20.
Syllaios, A. J. & M. J. Williams. (1982). Conductivity type conversion in (Hg,Cd)Te. Journal of Vacuum Science and Technology. 21(1). 201–204. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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