D. Chandler‐Horowitz

909 total citations
28 papers, 615 citations indexed

About

D. Chandler‐Horowitz is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, D. Chandler‐Horowitz has authored 28 papers receiving a total of 615 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 8 papers in Materials Chemistry. Recurrent topics in D. Chandler‐Horowitz's work include Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor materials and devices (6 papers) and Thin-Film Transistor Technologies (5 papers). D. Chandler‐Horowitz is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor materials and devices (6 papers) and Thin-Film Transistor Technologies (5 papers). D. Chandler‐Horowitz collaborates with scholars based in United States, Canada and Germany. D. Chandler‐Horowitz's co-authors include P. M. Amirtharaj, Nhan V. Nguyen, Martin M. Frank, Albert V. Davydov, George A. Candela, J. Pellegrino, Berend T. Jonker, R. A. Bartynski, Nibir K. Dhar and Wendy L. Sarney and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

D. Chandler‐Horowitz

28 papers receiving 579 citations

Peers

D. Chandler‐Horowitz
W.T. Pawlewicz United States
A.W. Smith United States
R. Schindler Germany
M. Vogt Germany
H.H. Busta United States
R.A. Murphy United States
R. Forman United States
Yan-Feng Lao China
L. Ward United Kingdom
A. Waldorf Canada
W.T. Pawlewicz United States
D. Chandler‐Horowitz
Citations per year, relative to D. Chandler‐Horowitz D. Chandler‐Horowitz (= 1×) peers W.T. Pawlewicz

Countries citing papers authored by D. Chandler‐Horowitz

Since Specialization
Citations

This map shows the geographic impact of D. Chandler‐Horowitz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Chandler‐Horowitz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Chandler‐Horowitz more than expected).

Fields of papers citing papers by D. Chandler‐Horowitz

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Chandler‐Horowitz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Chandler‐Horowitz. The network helps show where D. Chandler‐Horowitz may publish in the future.

Co-authorship network of co-authors of D. Chandler‐Horowitz

This figure shows the co-authorship network connecting the top 25 collaborators of D. Chandler‐Horowitz. A scholar is included among the top collaborators of D. Chandler‐Horowitz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Chandler‐Horowitz. D. Chandler‐Horowitz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Chandler‐Horowitz, D. & P. M. Amirtharaj. (2005). High-accuracy, midinfrared (450cm−1⩽ω⩽4000cm−1) refractive index values of silicon. Journal of Applied Physics. 97(12). 160 indexed citations
2.
Brill, G., Y. Chen, P. M. Amirtharaj, et al.. (2005). Molecular beam epitaxial growth and characterization of Cd-based II–VI wide-bandgap compounds on Si substrates. Journal of Electronic Materials. 34(5). 655–661. 30 indexed citations
3.
Ehrstein, James R., Curt A. Richter, D. Chandler‐Horowitz, et al.. (2005). A Comparison of Thickness Values for Very Thin SiO[sub 2] Films by Using Ellipsometric, Capacitance-Voltage, and HRTEM Measurements. Journal of The Electrochemical Society. 153(1). F12–F12. 6 indexed citations
4.
Birdwell, A. Glen, D. Chandler‐Horowitz, M. Rebien, et al.. (2004). Excitonic transitions in β-FeSi2 epitaxial films and single crystals. Journal of Applied Physics. 95(5). 2441–2447. 10 indexed citations
5.
Nguyen, Nhan V., James E. Maslar, Jin‐Yong Kim, et al.. (2004). Crystalline quality of bonded silicon-on-insulator characterized by spectroscopic ellipsometry and Raman spectroscopy. Applied Physics Letters. 85(14). 2765–2767. 2 indexed citations
6.
Tseng, W. F., D. Chandler‐Horowitz, N. A. Papanicolaou, & J.B. Boos. (1996). Interdigitated hetero InGaAs/GaAs n-i-p-i modulators. Materials Letters. 29(4-6). 249–253. 1 indexed citations
7.
Tobin, S. P., P. W. Norton, D. Chandler‐Horowitz, et al.. (1995). A comparison of techniques for nondestructive composition measurements in CdZnTe substrates. Journal of Electronic Materials. 24(5). 697–705. 48 indexed citations
8.
Amirtharaj, P. M., D. Chandler‐Horowitz, & D. P. Bour. (1995). Double Modulation and Selective Excitation Photoreflectance for Characterizing Highly Luminescent Semiconductor Structures and Samples with Poor Surface Morphology. MRS Proceedings. 406. 6 indexed citations
9.
Chandler‐Horowitz, D., D.W. Berning, John H. Burnett, et al.. (1995). Double-Modulation and Selective Excitation Photoreflectance for Wafer-Level Characterization of Quantum-Well Laser Structures. 1 indexed citations
10.
Nguyen, Nhan V., et al.. (1994). Determination of the optical constants of ZnSe films by spectroscopic ellipsometry. Journal of Applied Physics. 76(1). 514–517. 47 indexed citations
11.
Salamanca‐Riba, L., et al.. (1994). Strain effects on the energy bands of ZnSe films grown on GaAs substrates by spectroscopic ellipsometry. Applied Physics Letters. 64(26). 3620–3622. 2 indexed citations
12.
Nguyen, Nhan V., D. Chandler‐Horowitz, P. M. Amirtharaj, & J. Pellegrino. (1994). Spectroscopic ellipsometry determination of the properties of the thin underlying strained Si layer and the roughness at SiO2/Si interface. Applied Physics Letters. 64(20). 2688–2690. 47 indexed citations
13.
Vorburger, Theodore V., et al.. (1992). <title>Effects of thin films on interferometric step height measurements</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1776. 2–13. 5 indexed citations
14.
Geist, Jon, et al.. (1991). Numerical modeling of silicon photodiodes for high-accuracy applications, Part I. simulation programs. Journal of Research of the National Institute of Standards and Technology. 96(4). 463–463. 9 indexed citations
15.
Dutta, Pradip Kr., George A. Candela, D. Chandler‐Horowitz, J. F. Marchiando, & Martin Peckerar. (1988). Nondestructive characterization of oxygen-ion-implanted silicon- on-insulator using multiple-angle ellipsometry. Journal of Applied Physics. 64(5). 2754–2756. 5 indexed citations
16.
Chandler‐Horowitz, D.. (1986). Ellipsometric Metrology Of Ultrathin Films: Dual Angle Of Incidence. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 565. 93–93. 1 indexed citations
17.
Candela, George A., et al.. (1986). Film Thickness And Refractive Index Standard Reference Material Calibrated By Ellipsometry And Profilometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 661. 402–402. 1 indexed citations
18.
Forman, Richard A., M. I. Bell, David R. Myers, & D. Chandler‐Horowitz. (1985). The Raman Spectrum of Carbon in Silicon. Japanese Journal of Applied Physics. 24(10A). L848–L848. 11 indexed citations
19.
Candela, George A. & D. Chandler‐Horowitz. (1984). An Ellipsometry System For High Accuracy Metrology Of Thin Films. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 480. 2–2. 6 indexed citations
20.
Chandler‐Horowitz, D. & George A. Candela. (1983). ON THE ACCURACY OF ELLIPSOMETRIC THICKNESS DETERMINATIONS FOR VERY THIN FILMS. Le Journal de Physique Colloques. 44(C10). C10–23. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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