D. Coulman
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
-
- Advanced Chemical Physics Studies
- Semiconductor materials and interfaces
- Force Microscopy Techniques and Applications
Papers in
-
- X-ray Spectroscopy and Fluorescence Analysis 4
-
- Electron and X-Ray Spectroscopy Techniques 3
- Co-authors
- D. MenzelA. PuschmannHans‐Peter SteinrückW. WürthR. BeyersPaul MerchantU. HöferP. Feulner
- Journals
- Journal of Applied Physics (3 papers)Surface Science (2 papers)The Journal of Chemical Physics (2 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (2 papers)Chemical Physics Letters (1 paper)
- Partner nations
- United StatesGermany
In The Last Decade
D. Coulman
17 papers receiving 606 citations
Peers
Comparison fields: 5 of 41
- Surfaces, Coatings and Films 103
- Atomic and Molecular Physics, and Optics 452
- Radiation 88
- Electrical and Electronic Engineering 283
- Spectroscopy 70
Countries citing papers authored by D. Coulman
This map shows the geographic impact of D. Coulman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Coulman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Coulman more than expected).
Fields of papers citing papers by D. Coulman
This network shows the impact of papers produced by D. Coulman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Coulman. The network helps show where D. Coulman may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Coulman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1996 | 1 | |
| 2 | 1996 | 4 | |
| 3 | 1993 | 85 | |
| 4 | 1992 | 87 | |
| 5 | 1991 | 20 | |
| 6 | 1991 | 9 | |
| 7 | 1990 | 26 | |
| 8 | 1990 | 26 | |
| 9 | 1990 | 107 | |
| 10 | 1989 | 41 | |
| 11 | 1989 | 2 | |
| 12 | 1988 | 38 | |
| 13 | 1987 | 5 | |
| 14 | 1987 | 100 | |
| 15 | 1987 | 13 | |
| 16 | 1987 | 63 | |
| 17 | 1986 | 10 |
About D. Coulman
D. Coulman is a scholar working on Radiation, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Physical and Theoretical Chemistry, having authored 17 papers that have together received 637 indexed citations. Recurring topics across this work include Advanced Chemical Physics Studies (6 papers), Semiconductor materials and devices (5 papers), Semiconductor materials and interfaces (4 papers), X-ray Spectroscopy and Fluorescence Analysis (4 papers), Spectroscopy and Quantum Chemical Studies (3 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Force Microscopy Techniques and Applications (2 papers) and Ion-surface interactions and analysis (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (103 citations), Atomic and Molecular Physics, and Optics (452 citations), Radiation (88 citations), Electrical and Electronic Engineering (283 citations) and Spectroscopy (70 citations). D. Coulman has collaborated with scholars based in United States and Germany. Frequent co-authors include D. Menzel, A. Puschmann, Hans‐Peter Steinrück, W. Würth, R. Beyers, Paul Merchant, U. Höfer, P. Feulner, William F. Stickle and G. Rocker. Their work appears in journals such as Journal of Applied Physics, Surface Science, The Journal of Chemical Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Chemical Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.