C. P. Hunt

460 total citations
22 papers, 384 citations indexed

About

C. P. Hunt is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Computational Mechanics. According to data from OpenAlex, C. P. Hunt has authored 22 papers receiving a total of 384 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Electrical and Electronic Engineering, 12 papers in Surfaces, Coatings and Films and 8 papers in Computational Mechanics. Recurrent topics in C. P. Hunt's work include Electron and X-Ray Spectroscopy Techniques (12 papers), Ion-surface interactions and analysis (8 papers) and Non-Destructive Testing Techniques (6 papers). C. P. Hunt is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (12 papers), Ion-surface interactions and analysis (8 papers) and Non-Destructive Testing Techniques (6 papers). C. P. Hunt collaborates with scholars based in United Kingdom, Netherlands and Switzerland. C. P. Hunt's co-authors include M. P. Seah, D. Di Maio, C. T. H. Stoddart, H Mathieu, M. T. Anthony, B. D. Dunn, Ling Zou, Thomas C. English, Benjamin W. Lamb and Richard Müller and has published in prestigious journals such as Journal of Applied Physics, Corrosion Science and Surface Science.

In The Last Decade

C. P. Hunt

21 papers receiving 353 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
C. P. Hunt United Kingdom	9	212	212	162	103	85	22	384
Kazuo Kajiwara Japan	13	148 0.7×	307 1.4×	76 0.5×	49 0.5×	171 2.0×	45	470
L.J. Hanekamp Netherlands	11	150 0.7×	265 1.3×	62 0.4×	46 0.4×	226 2.7×	21	493
Guoping Fang China	9	186 0.9×	158 0.7×	366 2.3×	168 1.6×	51 0.6×	12	493
K. Takahiro Japan	13	58 0.3×	46 0.2×	56 0.3×	56 0.5×	265 3.1×	28	385
R. Tonini Italy	12	122 0.6×	408 1.9×	35 0.2×	152 1.5×	320 3.8×	64	598
Shigeo Sumita Japan	12	35 0.2×	306 1.4×	36 0.2×	18 0.2×	125 1.5×	19	453
R. R. Kola United States	10	29 0.1×	223 1.1×	55 0.3×	75 0.7×	80 0.9×	40	311
P. D. Davidse United States	8	79 0.4×	205 1.0×	15 0.1×	116 1.1×	107 1.3×	8	339
René Feder Germany	12	183 0.9×	204 1.0×	20 0.1×	112 1.1×	137 1.6×	23	366
Elisa García‐Tabarés Spain	11	41 0.2×	266 1.3×	40 0.2×	50 0.5×	93 1.1×	33	387

Countries citing papers authored by C. P. Hunt

Since Specialization

Citations

This map shows the geographic impact of C. P. Hunt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. P. Hunt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. P. Hunt more than expected).

Fields of papers citing papers by C. P. Hunt

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. P. Hunt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. P. Hunt. The network helps show where C. P. Hunt may publish in the future.

Co-authorship network of co-authors of C. P. Hunt

This figure shows the co-authorship network connecting the top 25 collaborators of C. P. Hunt. A scholar is included among the top collaborators of C. P. Hunt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. P. Hunt. C. P. Hunt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Hunt, C. P., et al.. (2009). Evaluation of the ability of conformal coatings to inhibit tin whiskering.. 3 indexed citations

2.

Maio, D. Di & C. P. Hunt. (2009). On the factors affecting the dissolution of copper in molten lead‐free solders and development of a method to assess the soldering parameters. Soldering and Surface Mount Technology. 21(4). 24–31. 6 indexed citations

3.

Maio, D. Di & C. P. Hunt. (2009). Monitoring the Growth of the α Phase in Tin Alloys by Electrical Resistance Measurements. Journal of Electronic Materials. 38(9). 1874–1880. 21 indexed citations

4.

Zou, Ling, et al.. (2006). Measuring the reliability of technology demonstrator manufactured with isotropic electrically conductive adhesives..

5.

Zou, Ling, et al.. (1999). An evaluation of the effect of ageing on the cleanability of solder flux residues. Soldering and Surface Mount Technology. 11(1). 27–35. 6 indexed citations

6.

Seah, M. P. & C. P. Hunt. (1994). Optimisation and specification of Auger electron spectrometers for signal-to-noise ratio performance. Journal of Electron Spectroscopy and Related Phenomena. 67(1). 151–157. 5 indexed citations

7.

Seah, M. P., C. P. Hunt, D. E. Sykes, et al.. (1993). Interlaboratory tests of a composite reference sample to calibrate Auger electron spectrometers in the differential mode. Journal of Electron Spectroscopy and Related Phenomena. 61(2). 173–182. 5 indexed citations

8.

Seah, M. P., C. P. Hunt, C.M. Younes, et al.. (1992). Submonolayer adsorbate reference material based on a low alloy steel fracture sample for Auger electron spectroscopy Part 2 Interlaboratory tests. Materials Science and Technology. 8(11). 1036–1042. 2 indexed citations

9.

Hunt, C. P. & M. P. Seah. (1992). Submonolayer adsorbate reference material based on a low alloy steel fracture sample for Auger electron spectroscopy Part 1 Characterisation. Materials Science and Technology. 8(11). 1023–1035. 1 indexed citations

10.

Seah, M. P., C. P. Hunt, C.M. Younes, et al.. (1992). Submonolayer adsorbate reference material based on a low alloy steel fracture sample for Auger electron spectroscopy Part 2 Interlaboratory tests. Materials Science and Technology. 8(11). 1036–1042. 4 indexed citations

11.

Hunt, C. P. & M. P. Seah. (1992). Submonolayer adsorbate reference material based on a low alloy steel fracture sample for Auger electron spectroscopy Part 1 Characterisation. Materials Science and Technology. 8(11). 1023–1035. 7 indexed citations

12.

Hunt, C. P. & M. P. Seah. (1990). Method for the alignment of samples and the attainment of ultra‐high‐resolution depth profiles in Auger electron spectroscopy. Surface and Interface Analysis. 15(4). 254–258. 6 indexed citations

13.

Hunt, C. P.. (1988). The effect of impurities on the intergranular stress corrosion cracking of a C/Mn steel. Corrosion Science. 28(9). 901–922. 8 indexed citations

14.

Seah, M. P. & C. P. Hunt. (1988). Auger electron spectroscopy: Method for the accurate measurement of signal and noise and a figure of merit for the performance of AES instrument sensitivity. Review of Scientific Instruments. 59(2). 217–227. 18 indexed citations

15.

Seah, M. P. & C. P. Hunt. (1984). Atomic mixing and electron range effects in ultrahigh-resolution profiles of the Ta2O5/Ta interface by argon sputtering with Auger electron spectroscopy. Journal of Applied Physics. 56(7). 2106–2113. 27 indexed citations

16.

Seah, M. P., H Mathieu, & C. P. Hunt. (1984). The ultra-high resolution depth profiling reference material — Ta2O5 anodically grown on Ta. Surface Science. 139(2-3). 549–557. 35 indexed citations

17.

Hunt, C. P., M. T. Anthony, & M. P. Seah. (1984). AES and XPS depth profiling certified reference material. Surface and Interface Analysis. 6(2). 92–93. 21 indexed citations

18.

Hunt, C. P. & M. P. Seah. (1983). Characterization of a high depth‐resolution tantalum pentoxide sputter profiling reference material. Surface and Interface Analysis. 5(5). 199–209. 83 indexed citations

19.

Seah, M. P. & C. P. Hunt. (1983). The depth dependence of the depth resolution in composition–depth profiling with Auger Electron Spectroscopy. Surface and Interface Analysis. 5(1). 33–37. 88 indexed citations

20.

Hunt, C. P., C. T. H. Stoddart, & M. P. Seah. (1981). The surface analysis of insulators by SIMS: Charge neutralization and stabilization of the surface potential. Surface and Interface Analysis. 3(4). 157–160. 33 indexed citations

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