M. P. Seah

26.0k total citations · 6 hit papers
315 papers, 21.8k citations indexed

About

M. P. Seah is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Electrical and Electronic Engineering. According to data from OpenAlex, M. P. Seah has authored 315 papers receiving a total of 21.8k indexed citations (citations by other indexed papers that have themselves been cited), including 171 papers in Surfaces, Coatings and Films, 129 papers in Computational Mechanics and 118 papers in Electrical and Electronic Engineering. Recurrent topics in M. P. Seah's work include Electron and X-Ray Spectroscopy Techniques (170 papers), Ion-surface interactions and analysis (126 papers) and X-ray Spectroscopy and Fluorescence Analysis (93 papers). M. P. Seah is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (170 papers), Ion-surface interactions and analysis (126 papers) and X-ray Spectroscopy and Fluorescence Analysis (93 papers). M. P. Seah collaborates with scholars based in United Kingdom, United States and Japan. M. P. Seah's co-authors include W. A. Dench, D. Briggs, Ian S. Gilmore, E. D. Hondros, Steven J. Spencer, Peter J. Cumpson, C. H. Lea, Charles A. Clifford, M. T. Anthony and Graham C. Smith and has published in prestigious journals such as Nature, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

M. P. Seah

308 papers receiving 20.6k citations

Hit Papers

5 papers align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

1979 4.5k citations M. P. Seah, W. A. Dench Surface and Interface Analysis profile →
Practical surface analysis: By auger and x-ray photoelectron spectroscopy

1983 3.8k citations M. P. Seah et al. profile →
Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments

1997 467 citations M. P. Seah et al. Surface and Interface Analysis profile →
Auger and X-ray Photoelectron Spectroscopy

1990 444 citations M. P. Seah et al. profile →
Grain boundary segregation

1973 438 citations M. P. Seah, E. D. Hondros Proceedings of the Royal Society of London A Mathematical and Physical Sciences profile →
The quantitative analysis of surfaces by XPS: A review

1980 382 citations M. P. Seah Surface and Interface Analysis profile →

Peers

Countries citing papers authored by M. P. Seah

Since Specialization

Citations

This map shows the geographic impact of M. P. Seah's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. P. Seah with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. P. Seah more than expected).

Fields of papers citing papers by M. P. Seah

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. P. Seah. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. P. Seah. The network helps show where M. P. Seah may publish in the future.

Co-authorship network of co-authors of M. P. Seah

This figure shows the co-authorship network connecting the top 25 collaborators of M. P. Seah. A scholar is included among the top collaborators of M. P. Seah based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. P. Seah. M. P. Seah is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure 2021 ·Surface and Interface Analysis ·(unknown), M. P. Seah, Gustavo F. Trindade, Alexander Pirkl, Rasmus Havelund, Jean‐Luc Vorng, E. Niehuis, Ian S. Gilmore	9
2	Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles 2020 ·The Journal of Physical Chemistry C ·Yiwen Pei, David J. H. Cant, Rasmus Havelund, Mark Stewart, Ken Mingard, M. P. Seah, Caterina Minelli, Alexander G. Shard	9
3	Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry 2019 ·ACS Applied Materials & Interfaces ·(unknown), (unknown), M. P. Seah, Gustavo F. Trindade, Felix Kollmer, Clive J. Roberts, Richard Hague, Guido Mula, Ian S. Gilmore, Rasmus Havelund	8
4	Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues 2012 ·Nanotechnology ·Charles A. Clifford, M. P. Seah	15
5	Nanoindentation measurement of Young’s modulus for compliant layers on stiffer substrates including the effect of Poisson’s ratios 2009 ·Nanotechnology ·Charles A. Clifford, M. P. Seah	34
6	G‐SIMS: relative effectiveness of different monatomic primary ion source combinations 2009 ·Rapid Communications in Mass Spectrometry ·M. P. Seah, Ian S. Gilmore, Felicia M. Green	5
7	Imaging G‐SIMS: a novel bismuth‐manganese source emitter 2008 ·Rapid Communications in Mass Spectrometry ·Felicia M. Green, Felix Kollmer, E. Niehuis, Ian S. Gilmore, M. P. Seah	22
8	Cluster ion beam profiling of organics by secondary ion mass spectrometry – does sodium affect the molecular ion intensity at interfaces? 2008 ·Rapid Communications in Mass Spectrometry ·Felicia M. Green, Ian S. Gilmore, M. P. Seah	3
9	Ultra‐thin SiO ₂ on Si VIII. Accuracy of method, linearity and attenuation lengths for XPS 2007 ·Surface and Interface Analysis ·Kyung Joong Kim, M. P. Seah	30
10	Recent Advances to Establish XPS as an Accurate Metrology Tool (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara) 2006 ·Journal of Surface Analysis ·M. P. Seah	2
11	Repeatable intensity calibration of an X-ray photoelectron spectrometer 2006 ·Journal of Electron Spectroscopy and Related Phenomena ·M. P. Seah, Steven J. Spencer	14
12	Quantification issues in ToF‐SSIMS and AFM co‐analysis in two‐phase systems, exampled by a polymer blend 2003 ·Surface and Interface Analysis ·Ian S. Gilmore, M. P. Seah, (unknown)	15
13	Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPS 1990 ·Surface and Interface Analysis ·M. P. Seah, Graham C. Smith	87
14	VAMAS Surface chemical analysis standard data transfer format with skeleton decoding programs 1988 ·Surface and Interface Analysis ·W. A. Dench, L. B. Hazell, M. P. Seah	43
15	Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments 1984 ·Surface and Interface Analysis ·M. P. Seah, Michael E. Jones, M. T. Anthony	48
16	The role of solute segregation in grain boundary diffusion 1982 ·Proceedings of the Royal Society of London A Mathematical and Physical Sciences ·J. Bernardini, P. Gas, E. D. Hondros, M. P. Seah	67
17	Impurities, segregation and creep embrittlement 1980 ·Philosophical Transactions of the Royal Society of London Series A Mathematical and Physical Sciences ·M. P. Seah	39
18	Adsorption-induced interface decohesion 1980 ·Acta Metallurgica ·M. P. Seah	297
19	Segregation and the strength of grain boundaries 1976 ·Proceedings of the Royal Society of London A Mathematical and Physical Sciences ·M. P. Seah	39
20	Grain boundary segregation breakdown → 1973 ·Proceedings of the Royal Society of London A Mathematical and Physical Sciences ·M. P. Seah, E. D. Hondros	438

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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