M. T. Anthony

4.9k total citations
8 papers, 501 citations indexed

About

M. T. Anthony is a scholar working on Surfaces, Coatings and Films, Radiation and Electrical and Electronic Engineering. According to data from OpenAlex, M. T. Anthony has authored 8 papers receiving a total of 501 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Surfaces, Coatings and Films, 6 papers in Radiation and 5 papers in Electrical and Electronic Engineering. Recurrent topics in M. T. Anthony's work include Electron and X-Ray Spectroscopy Techniques (8 papers), X-ray Spectroscopy and Fluorescence Analysis (6 papers) and Advancements in Photolithography Techniques (4 papers). M. T. Anthony is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (8 papers), X-ray Spectroscopy and Fluorescence Analysis (6 papers) and Advancements in Photolithography Techniques (4 papers). M. T. Anthony collaborates with scholars based in United Kingdom. M. T. Anthony's co-authors include M. P. Seah, Michael E. Jones, C. P. Hunt and Graham C. Smith and has published in prestigious journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Electron Spectroscopy and Related Phenomena and Surface and Interface Analysis.

In The Last Decade

M. T. Anthony

8 papers receiving 475 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. T. Anthony United Kingdom 7 290 196 188 170 78 8 501
P. L. J. Gunter Netherlands 8 133 0.5× 207 1.1× 395 2.1× 19 0.1× 116 1.5× 10 627
L. C. A. van den Oetelaar Netherlands 14 49 0.2× 87 0.4× 387 2.1× 45 0.3× 86 1.1× 18 555
J.-L. Vignes France 13 82 0.3× 166 0.8× 298 1.6× 22 0.1× 83 1.1× 27 494
Jonathan D. P. Counsell United Kingdom 12 72 0.2× 158 0.8× 226 1.2× 37 0.2× 30 0.4× 21 381
M. Henriot France 9 78 0.3× 168 0.9× 347 1.8× 20 0.1× 102 1.3× 11 505
C. Quet France 10 113 0.4× 109 0.6× 131 0.7× 13 0.1× 85 1.1× 15 371
Douglas A. Asbury United States 15 68 0.2× 253 1.3× 289 1.5× 12 0.1× 46 0.6× 22 423
A. Steinbrunn France 11 50 0.2× 154 0.8× 259 1.4× 22 0.1× 44 0.6× 27 372
J.G. Chen United States 9 98 0.3× 142 0.7× 318 1.7× 11 0.1× 195 2.5× 10 476
M. Azizan France 12 63 0.2× 235 1.2× 237 1.3× 14 0.1× 151 1.9× 39 431

Countries citing papers authored by M. T. Anthony

Since Specialization
Citations

This map shows the geographic impact of M. T. Anthony's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. T. Anthony with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. T. Anthony more than expected).

Fields of papers citing papers by M. T. Anthony

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. T. Anthony. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. T. Anthony. The network helps show where M. T. Anthony may publish in the future.

Co-authorship network of co-authors of M. T. Anthony

This figure shows the co-authorship network connecting the top 25 collaborators of M. T. Anthony. A scholar is included among the top collaborators of M. T. Anthony based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. T. Anthony. M. T. Anthony is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

8 of 8 papers shown
1.
Seah, M. P., Graham C. Smith, & M. T. Anthony. (1987). Summary Abstract: Calibration of Auger electron spectrometers for energy and intensity measurement. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 5(4). 1221–1222. 2 indexed citations
2.
Seah, M. P. & M. T. Anthony. (1985). A verification of the relativistic correction for electro-static electron spectrometers. Journal of Electron Spectroscopy and Related Phenomena. 35(1). 145–153. 8 indexed citations
3.
Seah, M. P., Michael E. Jones, & M. T. Anthony. (1984). Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments. Surface and Interface Analysis. 6(5). 242–254. 48 indexed citations
4.
Seah, M. P. & M. T. Anthony. (1984). Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 1—The establishment of reference procedures and instrument behaviour. Surface and Interface Analysis. 6(5). 230–241. 66 indexed citations
5.
Anthony, M. T. & M. P. Seah. (1984). XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies. Surface and Interface Analysis. 6(3). 95–106. 265 indexed citations
6.
Hunt, C. P., M. T. Anthony, & M. P. Seah. (1984). AES and XPS depth profiling certified reference material. Surface and Interface Analysis. 6(2). 92–93. 21 indexed citations
7.
Anthony, M. T. & M. P. Seah. (1984). XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparison. Surface and Interface Analysis. 6(3). 107–115. 71 indexed citations
8.
Seah, M. P. & M. T. Anthony. (1983). An atomic standard to calibrate analyser modulation in AES. Journal of Electron Spectroscopy and Related Phenomena. 32(1). 87–97. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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