C. J. Mogab

2.5k citations
49 papers · 1.9k indexed · 1 hit paper · h-index 23
Topics
Semiconductor materials and devices (24 papers)Copper Interconnects and Reliability (10 papers)Plasma Diagnostics and Applications (9 papers)
Partner nations
United States

In The Last Decade

C. J. Mogab

48 papers receiving 1.8k citations

Hit Papers

Plasma etching of Si and SiO2—The effect of oxygen additi...19782026199420101978100200300400

Peers

C. J. Mogab
Comparison fields: 5 of 58
  • Electrical and Electronic Engineering 1.5k
  • Materials Chemistry 861
  • Electronic, Optical and Magnetic Materials 438
  • Mechanics of Materials 433
  • Biomedical Engineering 332
Replace D. V. Tsu with:
D. V. Tsu United States
J.-C. Manifacier France
L.S. Wieluński United States
Jan‐Otto Carlsson Sweden
Tatsuro Miyasato Japan
E. S. Lambers United States
Peter Mascher Canada
B. G. Yacobi United States
P. Pongratz Austria
K. Zellama France
C. J. Mogab relative to D. V. Tsu United States D. V. Tsu's profile →
Citations per field
00.5×1.5×2.1×
D. V. Tsu · 1×
Citations per year

Countries citing papers authored by C. J. Mogab

Since Specialization
Citations

This map shows the geographic impact of C. J. Mogab's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. J. Mogab with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. J. Mogab more than expected).

Fields of papers citing papers by C. J. Mogab

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. J. Mogab. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. J. Mogab. The network helps show where C. J. Mogab may publish in the future.

Co-authorship network of co-authors of C. J. Mogab

This figure shows the co-authorship network connecting the top 25 collaborators of C. J. Mogab. A scholar is included among the top collaborators of C. J. Mogab based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. J. Mogab. C. J. Mogab is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 1
2 2
3 3
4 10
5 118
6 2
7 5
8 47
9 26
10 3
11 63
12 98
13 79
14 19
15 158
16 36
17 23
18 8
19 3
20 32

About C. J. Mogab

C. J. Mogab is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 49 papers that have together received 1.9k indexed citations. Recurring topics across this work include Semiconductor materials and devices (24 papers), Copper Interconnects and Reliability (10 papers) and Plasma Diagnostics and Applications (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.5k citations), Electronic, Optical and Magnetic Materials (438 citations) and Materials Chemistry (861 citations). C. J. Mogab has collaborated with scholars based in United States. Frequent co-authors include Daniel Flamm, A. C. Adams, J. O. Olowolafe, H. J. Leamy, Robert E. Jones, A. C. Campbell, R. B. Gregory, H. J. Levinstein, M. Kottke and P.D. Maniar. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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