M. Kottke

1.2k total citations
37 papers, 910 citations indexed

About

M. Kottke is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, M. Kottke has authored 37 papers receiving a total of 910 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 10 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in M. Kottke's work include Semiconductor materials and devices (19 papers), Copper Interconnects and Reliability (9 papers) and Cold Atom Physics and Bose-Einstein Condensates (8 papers). M. Kottke is often cited by papers focused on Semiconductor materials and devices (19 papers), Copper Interconnects and Reliability (9 papers) and Cold Atom Physics and Bose-Einstein Condensates (8 papers). M. Kottke collaborates with scholars based in United States, Germany and Netherlands. M. Kottke's co-authors include L. Cacciapuoti, J. Arlt, K. Sengstock, C. J. Mogab, R. B. Gregory, Kai Bongs, M. Erhard, H. Schmaljohann, Jochen Kronjäger and J. O. Olowolafe and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

M. Kottke

33 papers receiving 867 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Kottke United States 13 498 402 194 166 138 37 910
T. Laine Finland 13 315 0.6× 460 1.1× 293 1.5× 328 2.0× 313 2.3× 31 937
Leroy L. Chang United States 4 434 0.9× 282 0.7× 75 0.4× 221 1.3× 54 0.4× 5 629
A. Piotrowska Poland 16 380 0.8× 436 1.1× 60 0.3× 199 1.2× 77 0.6× 83 661
В. Н. Гриднев Russia 17 708 1.4× 521 1.3× 286 1.5× 303 1.8× 46 0.3× 58 1.1k
Mathew C. Abraham United States 16 497 1.0× 450 1.1× 124 0.6× 247 1.5× 37 0.3× 24 879
J. Jorzick Germany 13 947 1.9× 378 0.9× 392 2.0× 148 0.9× 42 0.3× 19 1.1k
Kunio Tada Japan 20 754 1.5× 956 2.4× 132 0.7× 180 1.1× 43 0.3× 98 1.1k
A. P. Payne United States 12 369 0.7× 107 0.3× 192 1.0× 145 0.9× 103 0.7× 27 523
K. Kusunoki Japan 5 306 0.6× 175 0.4× 42 0.2× 215 1.3× 45 0.3× 12 485
N. S. Averkiev Russia 14 760 1.5× 388 1.0× 274 1.4× 492 3.0× 94 0.7× 115 1.2k

Countries citing papers authored by M. Kottke

Since Specialization
Citations

This map shows the geographic impact of M. Kottke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Kottke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Kottke more than expected).

Fields of papers citing papers by M. Kottke

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Kottke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Kottke. The network helps show where M. Kottke may publish in the future.

Co-authorship network of co-authors of M. Kottke

This figure shows the co-authorship network connecting the top 25 collaborators of M. Kottke. A scholar is included among the top collaborators of M. Kottke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Kottke. M. Kottke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Volinsky, Alex A., et al.. (2013). Fiducial marks as a measure of thin film crack arrest toughness. Gruppo Italiano Frattura Digital Repository (Gruppo Italiano Frattura).
2.
Kottke, M., et al.. (2012). Observation of an exceptionally high apparent kinetic order in the thermal desorption of D2from the Si(100) surface. Molecular Physics. 110(15-16). 1953–1966. 1 indexed citations
3.
Schaeffer, J., C. Capasso, R. Gregory, et al.. (2007). Tantalum carbonitride electrodes and the impact of interface chemistry on device characteristics. Journal of Applied Physics. 101(1). 41 indexed citations
4.
Kottke, M., Thomas Schulte, L. Cacciapuoti, et al.. (2005). Collective excitation of Bose-Einstein condensates in the transition region between three and one dimensions. Physical Review A. 72(5). 11 indexed citations
5.
Schmaljohann, H., M. Erhard, M. Kottke, et al.. (2004). Magnetism in ultracold quantum gases. Journal of Modern Optics. 51(12). 1829–1841. 1 indexed citations
6.
Schmaljohann, H., M. Erhard, Jochen Kronjäger, et al.. (2004). Dynamics ofF=2Spinor Bose-Einstein Condensates. Physical Review Letters. 92(4). 40402–40402. 262 indexed citations
7.
Schmaljohann, H., M. Erhard, Jochen Kronjäger, et al.. (2004). Magnetism in ultracold quantum gases. Journal of Modern Optics. 51(12). 1829–1841. 1 indexed citations
8.
Hellweg, D., L. Cacciapuoti, M. Kottke, et al.. (2003). Measurement of the Spatial Correlation Function of Phase Fluctuating Bose-Einstein Condensates. Physical Review Letters. 91(1). 10406–10406. 96 indexed citations
9.
Bongs, Kai, Sven Burger, D. Hellweg, et al.. (2003). Spectroscopy of dark soliton states in Bose Einstein condensates. Journal of Optics B Quantum and Semiclassical Optics. 5(2). S124–S130. 13 indexed citations
10.
Tompkins, Harland G., Steve Smith, Diana Convey, et al.. (2003). Determining the amount of Si–Si bonding in CVD oxynitrides. Surface and Interface Analysis. 35(2). 136–140. 5 indexed citations
11.
Paulson, W. M., et al.. (2002). A scalable submicron contact technology using conformal LPCVD TiN. 47–50. 1 indexed citations
12.
Liaw, H.M., K. J. Linthicum, R. F. Davis, et al.. (1999). Epitaxial Growth of AlN on Si Substrates with Intermediate 3C-SiC as Buffer Layers. MRS Proceedings. 572. 1 indexed citations
13.
Kottke, M., et al.. (1997). Stoichiometric Effects of Sputtered Barium Strontium Titanate Films. MRS Proceedings. 493. 4 indexed citations
14.
Jones, Robert E., P.D. Maniar, A. C. Campbell, et al.. (1995). Materials interactions in the integration of PZT ferroelectric capacitors. Integrated ferroelectrics. 6(1-4). 81–92. 17 indexed citations
15.
Jones, Robert E., et al.. (1994). Impact of A Ti Adhesion Layer on Pt/PZT/Pt Capacitors. MRS Proceedings. 361. 3 indexed citations
16.
Kottke, M., et al.. (1992). Ti/borophosphosilicate glass interfacial reactions and their effects on adhesion. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(3). 1124–1132. 6 indexed citations
17.
Kottke, M., et al.. (1991). Auger electron spectroscopy and Rutherford backscattering characterization of TiNx/TiSiy contact barrier metallization. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(1). 74–88. 21 indexed citations
18.
Wilson, S. R., et al.. (1990). The Effects of SI Addition on the Properties of AICu Films used in Multilevel Metal Systems. MRS Proceedings. 181. 3 indexed citations
19.
Kottke, M., et al.. (1986). Redistribution of excess Si in chemical vapor deposited WSix films upon post-deposition annealing. Journal of Applied Physics. 60(8). 2835–2841. 15 indexed citations
20.
Tobin, P.J., et al.. (1984). Antimony Diffusion in Silicon: Effects of Ambient Gas and Time. Journal of The Electrochemical Society. 131(8). 1875–1883.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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