Etienne Auvray
- Electrical and Electronic Engineering
- Hardware and Architecture top 10%
- Industrial and Manufacturing Engineering
- Biomedical Engineering
- Oncology
- Co-authors
- Emmanuel SimeuAlberto BosioA. VirazelPatrick GirardLuigi DililloA DaverFabrice KwiatkowskiPaolo Bernardi
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (14 papers)VLSI and Analog Circuit Testing (13 papers)Industrial Vision Systems and Defect Detection (5 papers)
- Cited by
- Hardware and ArchitectureIndustrial and Manufacturing EngineeringElectrical and Electronic Engineering
In The Last Decade
Etienne Auvray
23 papers receiving 71 citations
Peers
Comparison fields: 5 of 26
- Electrical and Electronic Engineering 52
- Hardware and Architecture 49
- Industrial and Manufacturing Engineering 10
- Biomedical Engineering 8
- Oncology 6
Countries citing papers authored by Etienne Auvray
This map shows the geographic impact of Etienne Auvray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Etienne Auvray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Etienne Auvray more than expected).
Fields of papers citing papers by Etienne Auvray
This network shows the impact of papers produced by Etienne Auvray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Etienne Auvray. The network helps show where Etienne Auvray may publish in the future.
Co-authorship network of co-authors of Etienne Auvray
This figure shows the co-authorship network connecting the top 25 collaborators of Etienne Auvray. A scholar is included among the top collaborators of Etienne Auvray based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Etienne Auvray. Etienne Auvray is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 4 | |
| 3 | 0 | |
| 4 | 2 | |
| 5 | 3 | |
| 6 | 5 | |
| 7 | 4 | |
| 8 | 2 | |
| 9 | 5 | |
| 10 | 6 | |
| 11 | 2 | |
| 12 | 2 | |
| 13 | 9 | |
| 14 | 3 | |
| 15 | 2 | |
| 16 | 2 | |
| 17 | [Pulmonary cancer and recurrent arterial and venous thromboses]. | 1 |
| 18 | Proton NMR spectroscopy of plasma lipoproteins in the experimental Lewis lung carcinoma. | 1 |
| 19 | [The value and limitations of carcinoembryonic antigen levels (CEA) in colorectal cancers (author's transl)]. | 1 |
| 20 | 2 |
About Etienne Auvray
Etienne Auvray is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering and Surfaces, Coatings and Films, having authored 24 papers that have together received 73 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (14 papers), VLSI and Analog Circuit Testing (13 papers) and Industrial Vision Systems and Defect Detection (5 papers). The work is most often cited by research in Hardware and Architecture (49 citations), Industrial and Manufacturing Engineering (10 citations) and Electrical and Electronic Engineering (52 citations). Etienne Auvray has collaborated with scholars based in France, Italy and Czechia. Frequent co-authors include Emmanuel Simeu, Alberto Bosio, A. Virazel, Patrick Girard, Luigi Dilillo, A Daver, Fabrice Kwiatkowski, Paolo Bernardi, H Allannic and M. Sonza Reorda. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Emerging Topics in Computing and Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.