Abhijit Jas

1.7k total citations
34 papers, 1.3k citations indexed

About

Abhijit Jas is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, Abhijit Jas has authored 34 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Hardware and Architecture, 29 papers in Electrical and Electronic Engineering and 7 papers in Control and Systems Engineering. Recurrent topics in Abhijit Jas's work include VLSI and Analog Circuit Testing (29 papers), Radiation Effects in Electronics (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). Abhijit Jas is often cited by papers focused on VLSI and Analog Circuit Testing (29 papers), Radiation Effects in Electronics (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). Abhijit Jas collaborates with scholars based in United States, Iran and Italy. Abhijit Jas's co-authors include Nur A. Touba, J. Ghosh-Dastidar, C. Vamsi Krishna, B. Pouya, Yiorgos Makris, Michail Maniatakos, Naghmeh Karimi, Jacob A. Abraham, Sreejit Chakravarty and Yi-Shing Chang and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

In The Last Decade

Abhijit Jas

34 papers receiving 1.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Abhijit Jas United States 16 1.2k 1.2k 235 95 94 34 1.3k
Sybille Hellebrand Germany 19 1.3k 1.1× 1.3k 1.1× 206 0.9× 177 1.9× 37 0.4× 81 1.5k
J. Rajski United States 24 1.9k 1.6× 1.9k 1.6× 284 1.2× 59 0.6× 44 0.5× 68 2.0k
E.M. Rudnick United States 22 1.1k 0.9× 1.1k 0.9× 127 0.5× 43 0.5× 83 0.9× 67 1.3k
J. Savir United States 19 1.4k 1.2× 1.4k 1.2× 223 0.9× 20 0.2× 36 0.4× 73 1.5k
N. Kranitis Greece 17 609 0.5× 609 0.5× 89 0.4× 106 1.1× 31 0.3× 47 771
B. Koenemann United States 9 1.5k 1.2× 1.4k 1.2× 258 1.1× 59 0.6× 31 0.3× 15 1.5k
McCluskey United States 13 740 0.6× 718 0.6× 103 0.4× 84 0.9× 65 0.7× 16 901
Mark Kassab United States 16 1.6k 1.3× 1.5k 1.3× 242 1.0× 43 0.5× 21 0.2× 49 1.6k
N. Tamarapalli United States 14 1.2k 1.0× 1.2k 1.0× 192 0.8× 28 0.3× 15 0.2× 17 1.3k
M. Favalli Italy 19 879 0.7× 983 0.8× 28 0.1× 143 1.5× 58 0.6× 112 1.1k

Countries citing papers authored by Abhijit Jas

Since Specialization
Citations

This map shows the geographic impact of Abhijit Jas's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Abhijit Jas with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Abhijit Jas more than expected).

Fields of papers citing papers by Abhijit Jas

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Abhijit Jas. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Abhijit Jas. The network helps show where Abhijit Jas may publish in the future.

Co-authorship network of co-authors of Abhijit Jas

This figure shows the co-authorship network connecting the top 25 collaborators of Abhijit Jas. A scholar is included among the top collaborators of Abhijit Jas based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Abhijit Jas. Abhijit Jas is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Rossi, Daniele, et al.. (2013). Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder. Journal of Electronic Testing. 29(3). 401–413. 1 indexed citations
2.
Maniatakos, Michail, et al.. (2011). AVF Analysis Acceleration via Hierarchical Fault Pruning. 87–92. 13 indexed citations
3.
Gulati, Kanupriya, et al.. (2009). FPGA-based hardware acceleration for Boolean satisfiability. ACM Transactions on Design Automation of Electronic Systems. 14(2). 1–11. 15 indexed citations
4.
Chakrabarty, Krishnendu, et al.. (2009). RT-Level Deviation-Based Grading of Functional Test Sequences. 264–269. 18 indexed citations
5.
Metra, Cecilia, et al.. (2008). Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic. ePrints Soton (University of Southampton). 20 indexed citations
6.
Dutta, Avijit & Abhijit Jas. (2008). Combinational Logic Circuit Protection Using Customized Error Detecting and Correcting Codes. 35. 68–73. 1 indexed citations
7.
Karimi, Naghmeh, Michail Maniatakos, Abhijit Jas, & Yiorgos Makris. (2008). On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. 1–10. 19 indexed citations
8.
Jas, Abhijit, et al.. (2008). A low-cost concurrent error detection technique for processor control logic. 2008 Design, Automation and Test in Europe. 897–902. 7 indexed citations
9.
Kashyap, Chandramouli, et al.. (2008). Pessimism reduction in coupling-aware static timing analysis using timing and logic filtering. 486–491. 1 indexed citations
10.
Jas, Abhijit, et al.. (2008). A low-cost concurrent error detection technique for processor control logic. 897–902. 21 indexed citations
11.
Jas, Abhijit, Yi-Shing Chang, & Sreejit Chakravarty. (2006). An Approach to Minimizing Functional Constraints. 215–226. 15 indexed citations
12.
Krishna, C. Vamsi, Abhijit Jas, & Nur A. Touba. (2004). Achieving high encoding efficiency with partial dynamic LFSR reseeding. ACM Transactions on Design Automation of Electronic Systems. 9(4). 500–516. 28 indexed citations
13.
Jas, Abhijit, B. Pouya, & Nur A. Touba. (2004). Test data compression technique for embedded cores using virtual scan chains. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 12(7). 775–781. 11 indexed citations
14.
Jas, Abhijit, Kartik Mohanram, & Nur A. Touba. (2003). An embedded core DFT scheme to obtain highly compressed test sets. 275–280. 12 indexed citations
15.
Jas, Abhijit, J. Ghosh-Dastidar, & Nur A. Touba. (2003). Scan vector compression/decompression using statistical coding. 114–120. 190 indexed citations
16.
Krishna, C. Vamsi, Abhijit Jas, & Nur A. Touba. (2002). Test vector encoding using partial LFSR reseeding. 885–893. 185 indexed citations
17.
Jas, Abhijit & Nur A. Touba. (2002). Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor. Journal of Electronic Testing. 18(4-5). 503–514. 13 indexed citations
18.
Jas, Abhijit, C. Vamsi Krishna, & Nur A. Touba. (2002). Hybrid BIST based on weighted pseudo-random testing: a new test resource partitioning scheme. 2–8. 53 indexed citations
19.
Jas, Abhijit, B. Pouya, & Nur A. Touba. (2002). Virtual scan chains: a means for reducing scan length in cores. 73–78. 77 indexed citations
20.
Jas, Abhijit & Nur A. Touba. (2002). Test vector decompression via cyclical scan chains and its application to testing core-based designs. 458–464. 212 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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