Ya‐Hsiang Tai

3.0k total citations
166 papers, 2.6k citations indexed

About

Ya‐Hsiang Tai is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Polymers and Plastics. According to data from OpenAlex, Ya‐Hsiang Tai has authored 166 papers receiving a total of 2.6k indexed citations (citations by other indexed papers that have themselves been cited), including 145 papers in Electrical and Electronic Engineering, 49 papers in Materials Chemistry and 19 papers in Polymers and Plastics. Recurrent topics in Ya‐Hsiang Tai's work include Thin-Film Transistor Technologies (122 papers), Semiconductor materials and devices (40 papers) and CCD and CMOS Imaging Sensors (38 papers). Ya‐Hsiang Tai is often cited by papers focused on Thin-Film Transistor Technologies (122 papers), Semiconductor materials and devices (40 papers) and CCD and CMOS Imaging Sensors (38 papers). Ya‐Hsiang Tai collaborates with scholars based in Taiwan, United Kingdom and China. Ya‐Hsiang Tai's co-authors include J.R. Yates, Ting‐Chang Chang, M. Zanganeh, Yi‐Chun Chen, Kuan‐Chang Chang, Tseung‐Yuen Tseng, Shih‐Che Huang, Shih-Ching Chen, C. Lira and Fabrizio Scarpa and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Ya‐Hsiang Tai

158 papers receiving 2.5k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ya‐Hsiang Tai Taiwan 27 1.9k 835 396 367 344 166 2.6k
Yue Zhu-feng China 24 417 0.2× 457 0.5× 969 2.4× 247 0.7× 644 1.9× 137 2.2k
Suresh K. Sitaraman United States 24 1.9k 1.0× 586 0.7× 651 1.6× 164 0.4× 829 2.4× 259 2.9k
Byeongjin Park South Korea 23 293 0.2× 283 0.3× 478 1.2× 323 0.9× 620 1.8× 64 1.9k
Yong Shi United States 17 800 0.4× 519 0.6× 1.0k 2.6× 468 1.3× 59 0.2× 88 2.2k
Keh-Chih Hwang China 16 257 0.1× 347 0.4× 438 1.1× 212 0.6× 491 1.4× 67 1.4k
Y.C. Chan Hong Kong 30 2.2k 1.1× 271 0.3× 1.2k 3.0× 81 0.2× 301 0.9× 113 2.5k
Jianguo Zhu China 27 386 0.2× 440 0.5× 470 1.2× 70 0.2× 586 1.7× 128 1.9k
Soon-Bok Lee South Korea 22 625 0.3× 449 0.5× 959 2.4× 71 0.2× 913 2.7× 113 1.9k
Zhigang Dong China 29 862 0.5× 578 0.7× 1.6k 4.1× 222 0.6× 346 1.0× 162 2.6k
Jianming Wen China 25 616 0.3× 108 0.1× 486 1.2× 219 0.6× 166 0.5× 99 1.7k

Countries citing papers authored by Ya‐Hsiang Tai

Since Specialization
Citations

This map shows the geographic impact of Ya‐Hsiang Tai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ya‐Hsiang Tai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ya‐Hsiang Tai more than expected).

Fields of papers citing papers by Ya‐Hsiang Tai

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ya‐Hsiang Tai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ya‐Hsiang Tai. The network helps show where Ya‐Hsiang Tai may publish in the future.

Co-authorship network of co-authors of Ya‐Hsiang Tai

This figure shows the co-authorship network connecting the top 25 collaborators of Ya‐Hsiang Tai. A scholar is included among the top collaborators of Ya‐Hsiang Tai based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ya‐Hsiang Tai. Ya‐Hsiang Tai is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Tai, Ya‐Hsiang, et al.. (2025). Reliability of Gap-Type Thin Film Transistors Under Low Illumination for Imaging Sensing Applications. IEEE Journal of the Electron Devices Society. 13. 524–531.
2.
Tai, Ya‐Hsiang, et al.. (2024). P‐9: Integrated Ambipolar a‐Si TFT with Active Pixel Sensing Array Applied for Ambient Color Temperature and UV Sensing. SID Symposium Digest of Technical Papers. 55(1). 1396–1399.
3.
Tai, Ya‐Hsiang, et al.. (2021). The time response for the low-temperature poly-silicon thin-film transistors to x-ray irradiation pulse. Semiconductor Science and Technology. 36(4). 45003–45003. 2 indexed citations
4.
Tai, Ya‐Hsiang, et al.. (2020). P‐10: Advantages of Active Pixel Circuit Using Gap‐Type TFT as the Photo Device to Sense Low Intensity Light. SID Symposium Digest of Technical Papers. 51(1). 1346–1349. 4 indexed citations
5.
Tai, Ya‐Hsiang, et al.. (2019). Negative threshold voltage shift for LTPS TFTs under x-ray irradiation and gate bias. Semiconductor Science and Technology. 34(9). 95012–95012. 6 indexed citations
6.
Tai, Ya‐Hsiang, et al.. (2018). The Vacancy Pool Model for Amorphous In-Ga-Zn-O Thin-Film Transistors. IEEE Journal of the Electron Devices Society. 7. 33–37. 1 indexed citations
7.
Tai, Ya‐Hsiang, et al.. (2018). Degradation of a-IGZO Thin-Film Transistors Under Negative Bias and Illumination Stress in the Time Span of a Few Seconds. IEEE Electron Device Letters. 39(5). 696–698. 19 indexed citations
8.
Liu, Han‐Wen, et al.. (2017). Analysis of the Short-Term Response in the Drain Current of a-IGZO TFT to Light Pulses. IEEE Electron Device Letters. 38(7). 887–889. 4 indexed citations
9.
Yates, J.R., et al.. (2013). QUANTIFYING CRACK TIP DISPLACEMENT FIELDS: TSTRESS AND CTOA. Gruppo Italiano Frattura Digital Repository (Gruppo Italiano Frattura). 4 indexed citations
10.
Tai, Ya‐Hsiang, et al.. (2013). Test and Analysis of the ESD Robustness for the Diode-Connected a-IGZO Thin Film Transistors. Journal of Display Technology. 9(8). 613–618. 11 indexed citations
11.
Huang, Yi‐Pai, Guozhen Wang, Shu‐Yi Huang, Ya‐Hsiang Tai, & Tsuhan Chen. (2012). Camera free 3-dimensional virtual touch display with multi-user identification. National University of Singapore. 1965–1968. 4 indexed citations
12.
Tsai, Tsung‐Ming, Kuan‐Chang Chang, Ting‐Chang Chang, et al.. (2012). Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications. IEEE Electron Device Letters. 33(12). 1696–1698. 45 indexed citations
13.
Tai, Ya‐Hsiang, Shih‐Che Huang, Po‐Ting Chen, & Chih‐Jung Lin. (2011). Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC Operations. IEEE Transactions on Device and Materials Reliability. 11(1). 194–200. 10 indexed citations
14.
Chang, Ting‐Chang, Geng-Wei Chang, Chia-Sheng Lin, et al.. (2011). Effect of Lateral Body Terminal on Silicon–Oxide–Nitride–Oxide–Silicon Thin-Film Transistors. IEEE Electron Device Letters. 32(10). 1394–1396. 2 indexed citations
15.
Lin, Chia-Sheng, Ying-Chung Chen, Ting‐Chang Chang, et al.. (2011). Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress. Applied Physics Letters. 98(12). 5 indexed citations
16.
Chang, Ting‐Chang, et al.. (2010). Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs. Journal of The Electrochemical Society. 157(11). H1003–H1003. 4 indexed citations
17.
Tai, Ya‐Hsiang, et al.. (2007). Investigation of source-follower type analog buffer using low temperature poly-Si TFTs. Solid-State Electronics. 51(3). 354–359. 1 indexed citations
18.
Tai, Ya‐Hsiang, et al.. (2005). A novel analogue buffer using poly-Si TFTs for active matrix displays. 483–486. 1 indexed citations
19.
Tai, Ya‐Hsiang, et al.. (1996). Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers. Solid-State Electronics. 39(6). 901–908. 1 indexed citations
20.
Tai, Ya‐Hsiang, et al.. (1996). Electrical properties of amorphous silicon films with different thicknesses in metal/insulator/semiconductor structures. Materials Chemistry and Physics. 44(2). 182–185. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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