Te-Chih Chen

1.0k total citations
36 papers, 921 citations indexed

About

Te-Chih Chen is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, Te-Chih Chen has authored 36 papers receiving a total of 921 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 22 papers in Materials Chemistry and 4 papers in Biomedical Engineering. Recurrent topics in Te-Chih Chen's work include Thin-Film Transistor Technologies (34 papers), Semiconductor materials and devices (22 papers) and ZnO doping and properties (18 papers). Te-Chih Chen is often cited by papers focused on Thin-Film Transistor Technologies (34 papers), Semiconductor materials and devices (22 papers) and ZnO doping and properties (18 papers). Te-Chih Chen collaborates with scholars based in Taiwan, Germany and United States. Te-Chih Chen's co-authors include Ting‐Chang Chang, Tien‐Yu Hsieh, Chia-Sheng Lin, Ming-Yen Tsai, Chih-Tsung Tsai, Fu-Yen Jian, Shih-Ching Chen, Ming‐Chin Hung, Chun‐Hao Tu and Po-Lun Chen and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Physics D Applied Physics.

In The Last Decade

Te-Chih Chen

35 papers receiving 898 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Te-Chih Chen Taiwan 16 907 507 156 59 25 36 921
Tien‐Yu Hsieh Taiwan 17 1.0k 1.1× 556 1.1× 166 1.1× 88 1.5× 28 1.1× 40 1.0k
Kwang Hwan Ji South Korea 11 849 0.9× 628 1.2× 221 1.4× 50 0.8× 31 1.2× 14 864
Tae Kyung Ahn South Korea 7 736 0.8× 444 0.9× 211 1.4× 59 1.0× 26 1.0× 8 752
Md Delwar Hossain Chowdhury South Korea 14 875 1.0× 570 1.1× 194 1.2× 59 1.0× 25 1.0× 17 892
J.H. Jeong South Korea 3 696 0.8× 585 1.2× 240 1.5× 43 0.7× 42 1.7× 5 729
Jang Yeon Kwon South Korea 10 875 1.0× 542 1.1× 194 1.2× 88 1.5× 49 2.0× 25 895
Hyuck Lim South Korea 8 573 0.6× 365 0.7× 124 0.8× 60 1.0× 26 1.0× 15 580
Khashayar Ghaffarzadeh United Kingdom 7 597 0.7× 365 0.7× 161 1.0× 44 0.7× 52 2.1× 7 631
Li-Feng Teng Taiwan 7 540 0.6× 346 0.7× 151 1.0× 55 0.9× 23 0.9× 9 544
Yusaku Magari Japan 14 481 0.5× 337 0.7× 160 1.0× 49 0.8× 59 2.4× 37 525

Countries citing papers authored by Te-Chih Chen

Since Specialization
Citations

This map shows the geographic impact of Te-Chih Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Te-Chih Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Te-Chih Chen more than expected).

Fields of papers citing papers by Te-Chih Chen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Te-Chih Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Te-Chih Chen. The network helps show where Te-Chih Chen may publish in the future.

Co-authorship network of co-authors of Te-Chih Chen

This figure shows the co-authorship network connecting the top 25 collaborators of Te-Chih Chen. A scholar is included among the top collaborators of Te-Chih Chen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Te-Chih Chen. Te-Chih Chen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Chen, Te-Chih, Yue Kuo, Ting‐Chang Chang, Min-Chen Chen, & Hua-Mao Chen. (2017). Mechanism of a-IGZO TFT device deterioration—illumination light wavelength and substrate temperature effects. Journal of Physics D Applied Physics. 50(42). 42LT02–42LT02. 11 indexed citations
2.
Hsieh, Tien‐Yu, Ting‐Chang Chang, Te-Chih Chen, & Ming-Yen Tsai. (2014). Review of Present Reliability Challenges in Amorphous In-Ga-Zn-O Thin Film Transistors. ECS Journal of Solid State Science and Technology. 3(9). Q3058–Q3070. 41 indexed citations
3.
Tsai, Ming-Yen, Ting‐Chang Chang, Ann‐Kuo Chu, et al.. (2013). Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor. Applied Physics Letters. 103(14). 19 indexed citations
4.
Tsai, Ming-Yen, Ting‐Chang Chang, Ann‐Kuo Chu, et al.. (2013). High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors. Applied Physics Letters. 103(1). 30 indexed citations
5.
Hsieh, Tien‐Yu, Ting‐Chang Chang, Po‐Yung Liao, et al.. (2013). Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors. IEEE Transactions on Electron Devices. 60(5). 1681–1688. 9 indexed citations
6.
Hsieh, Tien‐Yu, Ting‐Chang Chang, Te-Chih Chen, et al.. (2012). Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments. Surface and Coatings Technology. 231. 478–481. 6 indexed citations
7.
Tsai, Ming-Yen, et al.. (2012). Investigating Degradation Behavior under Hot Carrier Stress in InGaZnO TFT with Symmetric and Asymmetric Structure. ECS Transactions. 45(7). 119–131. 2 indexed citations
8.
Huang, Sheng-Yao, Ting‐Chang Chang, Min-Chen Chen, et al.. (2012). Improvement in the bias stability of amorphous InGaZnO TFTs using an Al 2 O 3 passivation layer. Surface and Coatings Technology. 231. 117–121. 31 indexed citations
9.
Tsai, Ming-Yen, Ting‐Chang Chang, Ann‐Kuo Chu, et al.. (2012). Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures. Thin Solid Films. 528. 57–60. 18 indexed citations
10.
Hsieh, Tien‐Yu, Ting‐Chang Chang, Te-Chih Chen, et al.. (2012). Application of in-cell touch sensor using photo-leakage current in dual gate a-InGaZnO thin-film transistors. Applied Physics Letters. 101(21). 20 indexed citations
11.
Hsieh, Tien‐Yu, Ting‐Chang Chang, Te-Chih Chen, et al.. (2012). Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors. Applied Physics Letters. 100(23). 31 indexed citations
12.
Hsieh, Tien‐Yu, Ting‐Chang Chang, Te-Chih Chen, et al.. (2012). Investigating Degradation Behaviors Induced by DC and AC Bias-Stress under Light Illumination in InGaZnO Thin-Film Transistors. ECS Journal of Solid State Science and Technology. 1(1). Q6–Q10. 13 indexed citations
13.
Chen, Te-Chih, Ting‐Chang Chang, Tien‐Yu Hsieh, et al.. (2012). Self-heating enhanced charge trapping effect for InGaZnO thin film transistor. Applied Physics Letters. 101(4). 42101–42101. 40 indexed citations
14.
Lin, Chia-Sheng, Ying-Chung Chen, Ting‐Chang Chang, et al.. (2011). Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress. Applied Physics Letters. 98(12). 5 indexed citations
15.
Lin, Chia-Sheng, Ying-Chung Chen, Ting‐Chang Chang, et al.. (2011). Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress. IEEE Electron Device Letters. 32(3). 321–323. 4 indexed citations
16.
Chen, Te-Chih, Ting‐Chang Chang, Shih-Ching Chen, et al.. (2010). Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation. IEEE Electron Device Letters. 31(12). 1413–1415. 6 indexed citations
17.
Jian, Fu-Yen, Ting‐Chang Chang, Ann‐Kuo Chu, et al.. (2010). A 2 Bit Nonvolatile Memory Device with a Transistor Switch Function Accomplished with Edge-FN Tunneling Operation. Electrochemical and Solid-State Letters. 13(5). H166–H166. 2 indexed citations
18.
Jian, Fu-Yen, Ting‐Chang Chang, A. K. Chu, et al.. (2010). Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect. Electrochemical and Solid-State Letters. 13(4). H95–H95. 1 indexed citations
19.
Chen, Te-Chih, Ting‐Chang Chang, Chih-Tsung Tsai, et al.. (2010). Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress. Applied Physics Letters. 97(11). 166 indexed citations
20.
Chen, Te-Chih, et al.. (2008). Time Budget of Polyandrous Pheasant-Tailed Jacana (Hydrophasianus chirurgus) during Breeding Seaon in Taiwan. SHILAP Revista de lepidopterología. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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