Todd W. Simpson

645 total citations
37 papers, 534 citations indexed

About

Todd W. Simpson is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Materials Chemistry. According to data from OpenAlex, Todd W. Simpson has authored 37 papers receiving a total of 534 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 12 papers in Computational Mechanics and 10 papers in Materials Chemistry. Recurrent topics in Todd W. Simpson's work include Ion-surface interactions and analysis (12 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (10 papers). Todd W. Simpson is often cited by papers focused on Ion-surface interactions and analysis (12 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (10 papers). Todd W. Simpson collaborates with scholars based in Canada, United States and Australia. Todd W. Simpson's co-authors include I. V. Mitchell, Ning Yu, Qingzhe Wen, David Clarke, Mukesh Jain, Y. Ososkov, David S. Wilkinson, Jeffrey C. McCallum, Paul C. McIntyre and R. D. Goldberg and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Carbon.

In The Last Decade

Todd W. Simpson

36 papers receiving 520 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Todd W. Simpson Canada 15 241 205 94 92 79 37 534
R. Etemadi France 12 265 1.1× 244 1.2× 87 0.9× 34 0.4× 41 0.5× 19 456
G. Lucas Switzerland 14 197 0.8× 427 2.1× 67 0.7× 56 0.6× 103 1.3× 20 644
В. И. Сахаров Russia 12 277 1.1× 501 2.4× 82 0.9× 113 1.2× 53 0.7× 122 717
K. S. Harshavardhan United States 15 354 1.5× 474 2.3× 94 1.0× 55 0.6× 59 0.7× 53 716
Kou Kurosawa Japan 11 222 0.9× 155 0.8× 98 1.0× 149 1.6× 56 0.7× 75 435
W.T. Pawlewicz United States 12 336 1.4× 286 1.4× 86 0.9× 101 1.1× 32 0.4× 29 560
R. W. Tustison United States 15 341 1.4× 456 2.2× 189 2.0× 31 0.3× 114 1.4× 32 757
Ralf Jedamzik Germany 12 238 1.0× 126 0.6× 213 2.3× 126 1.4× 180 2.3× 90 656
Laurent Roux France 11 373 1.5× 294 1.4× 117 1.2× 94 1.0× 24 0.3× 52 662
N. Yamada Japan 12 224 0.9× 213 1.0× 112 1.2× 25 0.3× 44 0.6× 37 794

Countries citing papers authored by Todd W. Simpson

Since Specialization
Citations

This map shows the geographic impact of Todd W. Simpson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Todd W. Simpson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Todd W. Simpson more than expected).

Fields of papers citing papers by Todd W. Simpson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Todd W. Simpson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Todd W. Simpson. The network helps show where Todd W. Simpson may publish in the future.

Co-authorship network of co-authors of Todd W. Simpson

This figure shows the co-authorship network connecting the top 25 collaborators of Todd W. Simpson. A scholar is included among the top collaborators of Todd W. Simpson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Todd W. Simpson. Todd W. Simpson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Manwar, Rayyan, et al.. (2016). Fabrication and characterization of a high frequency and high coupling coefficient CMUT array. Microsystem Technologies. 23(10). 4965–4977. 18 indexed citations
3.
Hanson, Ronald, et al.. (2013). Microfabrication of dielectric barrier discharge plasma actuators for flow control. Sensors and Actuators A Physical. 201. 101–104. 34 indexed citations
4.
Barth, Ruth, Florian Staier, Todd W. Simpson, et al.. (2010). Soft X-ray holographic microscopy of chromosomes with high aspect ratio pinholes. Journal of Biotechnology. 149(4). 238–242. 11 indexed citations
5.
Rosenhahn, Axel, Ruth Barth, Florian Staier, et al.. (2008). Digital in-line soft x-ray holography with element contrast. Journal of the Optical Society of America A. 25(2). 416–416. 16 indexed citations
6.
Lennard, W.N., et al.. (2002). Wavelength-Invariant Resist Composed of Bimetallic Layers. MRS Proceedings. 745. 8 indexed citations
7.
Simpson, Todd W. & I. V. Mitchell. (2001). Annealing behavior of implanted helium in indium phosphide. Applied Physics Letters. 78(2). 207–209. 4 indexed citations
8.
Lennard, W.N., G.R. Massoumi, Todd W. Simpson, & I. V. Mitchell. (1999). Improved stoichiometry measurements using 4He elastic backscattering: experiment and simulation. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 152(2-3). 370–376. 19 indexed citations
9.
Simpson, Todd W., I. V. Mitchell, G. Este, & F. R. Shepherd. (1999). Ion implantation induced selective area exfoliation of InP and GaAs. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 148(1-4). 381–385. 9 indexed citations
10.
Simpson, Todd W., Qingzhe Wen, Ning Yu, & David Clarke. (1998). Kinetics of the Amorphous →γ→α Transformations in Aluminum Oxide: Effect of Crystallographic Orientation. Journal of the American Ceramic Society. 81(1). 61–66. 68 indexed citations
11.
Simpson, Todd W.. (1997). Another Deformation of Weyl's Denominator Formula. Journal of Combinatorial Theory Series A. 77(2). 349–356. 4 indexed citations
12.
Simpson, Todd W., I. V. Mitchell, & J.‐M. Baribeau. (1997). Boron Clustering in Silicon Under an Interstitial Flux: A Study Using Delta Doped Structures. MRS Proceedings. 469. 2 indexed citations
13.
Simpson, Todd W. & I. V. Mitchell. (1997). Extended defect formation and the flux of interstitials in Si-ion implanted silicon. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 127-128. 94–97. 9 indexed citations
14.
Simpson, Todd W.. (1996). Three generalizations of Weyl's denominator formula. The Electronic Journal of Combinatorics. 3(1). 2 indexed citations
15.
Endisch, D., David A. Love, Todd W. Simpson, I. V. Mitchell, & J.‐M. Baribeau. (1995). High depth resolution Rutherford scattering using forward angles. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 100(1). 159–164. 2 indexed citations
16.
Yu, Ning, Qingzhe Wen, David R. Clarke, et al.. (1995). Formation of iron or chromium doped epitaxial sapphire thin films on sapphire substrates. Journal of Applied Physics. 78(9). 5412–5421. 27 indexed citations
17.
Simpson, Todd W., David A. Love, D. Endisch, et al.. (1994). Amorphization Threshold in Si-Implanted Strained Sige Alloy Layers. MRS Proceedings. 373. 1 indexed citations
18.
Simpson, Todd W., I. V. Mitchell, Ning Yu, M. Nastasi, & Paul C. McIntyre. (1994). Crystallization Kinetics of Fe-DOPED A1203. MRS Proceedings. 357. 1 indexed citations
19.
Simpson, Todd W., I. V. Mitchell, Jeffrey C. McCallum, & L. A. Boatner. (1994). Hydrogen catalyzed crystallization of strontium titanate. Journal of Applied Physics. 76(5). 2711–2718. 27 indexed citations
20.
Goldberg, R. D., Todd W. Simpson, I. V. Mitchell, & Peter J. Schultz. (1993). Studies of Dislocation Formation in Annealed Self-Ion Irradiated Silicon. MRS Proceedings. 316. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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