Todd W. Simpson

645 citations
37 papers · 534 indexed · h-index 15
Topics
Ion-surface interactions and analysis (12 papers)Semiconductor materials and devices (11 papers)Silicon and Solar Cell Technologies (10 papers)

In The Last Decade

Todd W. Simpson

36 papers receiving 520 citations

Peers

Todd W. Simpson
Comparison fields: 5 of 70
  • Electrical and Electronic Engineering 241
  • Materials Chemistry 205
  • Atomic and Molecular Physics, and Optics 94
  • Computational Mechanics 92
  • Ceramics and Composites 79
Replace G. Lucas with:
G. Lucas Switzerland
G. R. Woolhouse United States
R. B. Marcus United States
M. Hecker Germany
W. Seifert Germany
V.G. Glebovsky Russia
K. Scheerschmidt Germany
Thomas Weber Germany
U. Pedersen United Kingdom
K. F. Hale United Kingdom
Todd W. Simpson relative to G. Lucas Switzerland G. Lucas's profile →
Citations per field
00.5×1.6×
G. Lucas · 1×
Citations per year

Countries citing papers authored by Todd W. Simpson

Since Specialization
Citations

This map shows the geographic impact of Todd W. Simpson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Todd W. Simpson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Todd W. Simpson more than expected).

Fields of papers citing papers by Todd W. Simpson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Todd W. Simpson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Todd W. Simpson. The network helps show where Todd W. Simpson may publish in the future.

Co-authorship network of co-authors of Todd W. Simpson

This figure shows the co-authorship network connecting the top 25 collaborators of Todd W. Simpson. A scholar is included among the top collaborators of Todd W. Simpson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Todd W. Simpson. Todd W. Simpson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 8
2 18
3 34
4 11
5 16
6 8
7 4
8 19
9 9
10 68
11 4
12 2
13 9
14 2
15 2
16 27
17 1
18 1
19 27
20 4

About Todd W. Simpson

Todd W. Simpson is a scholar working on Discrete Mathematics and Combinatorics, Computational Mechanics and Ceramics and Composites, having authored 37 papers that have together received 534 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (12 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (10 papers). The work is most often cited by research in Structural Biology (23 citations), Ceramics and Composites (79 citations) and Surfaces, Coatings and Films (39 citations). Todd W. Simpson has collaborated with scholars based in Canada, United States and Australia. Frequent co-authors include I. V. Mitchell, Ning Yu, Qingzhe Wen, David Clarke, Mukesh Jain, Y. Ososkov, David S. Wilkinson, Jeffrey C. McCallum, Paul C. McIntyre and R. D. Goldberg. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Carbon.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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