Ivan Ohlı́dal
- Surfaces, Coatings and Films top 0.5%
- Optical Coatings and Gratings 54
- Computational Mechanics top 1%
- Surface Roughness and Optical Measurements 112
- Biomedical Engineering top 5%
- Optical Polarization and Ellipsometry 31
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- Thin-Film Transistor Technologies 29
- Materials Chemistry top 10%
- Diamond and Carbon-based Materials Research 15
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- Advanced Measurement and Metrology Techniques 21
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- Optical measurement and interference techniques 18
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- Force Microscopy Techniques and Applications 14
Ivan Ohlı́dal
174 papers receiving 2.3k citations
Peers
Comparison fields: 5 of 92
- Surfaces, Coatings and Films 624
- Computational Mechanics 1.0k
- Biomedical Engineering 747
- Electrical and Electronic Engineering 966
- Materials Chemistry 719
Countries citing papers authored by Ivan Ohlı́dal
This map shows the geographic impact of Ivan Ohlı́dal's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ivan Ohlı́dal with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ivan Ohlı́dal more than expected).
Fields of papers citing papers by Ivan Ohlı́dal
This network shows the impact of papers produced by Ivan Ohlı́dal. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ivan Ohlı́dal. The network helps show where Ivan Ohlı́dal may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Ivan Ohlı́dal, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2024 | 1 | |
| 3 | 2024 | 2 | |
| 4 | 2023 | 3 | |
| 5 | 2023 | 8 | |
| 6 | 2023 | 1 | |
| 7 | 2023 | 1 | |
| 8 | 2020 | 3 | |
| 9 | 2019 | 13 | |
| 10 | 2013 | 14 | |
| 11 | Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films | 2009 | 2 |
| 12 | 2008 | 11 | |
| 13 | Application of the wavelet transformation in AFM data analysis | 2005 | 4 |
| 14 | Optical Characterization of TiO2 Thin Films by the CombinedMethod of Spectroscopic Ellipsometry and SpectroscopicPhotometry | 2005 | 1 |
| 15 | Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films | 2004 | 5 |
| 16 | Atomic force microscopy characterization of ZnTe epitaxialfilms | 2003 | 17 |
| 17 | New Dispersion Model of the Optical Constants of the DLC Films | 2003 | 3 |
| 18 | Optical constants of ZnTe and ZnSe epitaxial thin films | 2003 | 2 |
| 19 | Matrix formalism for imperfect thin films | 2000 | 6 |
| 20 | Ellipsometry of thin films | 1998 | 0 |
About Ivan Ohlı́dal
Ivan Ohlı́dal is a scholar working on Surfaces, Coatings and Films, Computational Mechanics, Biomedical Engineering, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 179 papers that have together received 2.4k indexed citations. Recurring topics across this work include Surface Roughness and Optical Measurements (112 papers), Optical Coatings and Gratings (54 papers), Optical Polarization and Ellipsometry (31 papers), Thin-Film Transistor Technologies (29 papers), Advanced Measurement and Metrology Techniques (21 papers), Optical measurement and interference techniques (18 papers), Diamond and Carbon-based Materials Research (15 papers) and Force Microscopy Techniques and Applications (14 papers). The work is most often cited by research in Surfaces, Coatings and Films (624 citations), Computational Mechanics (1.0k citations), Biomedical Engineering (747 citations), Electrical and Electronic Engineering (966 citations) and Materials Chemistry (719 citations). Ivan Ohlı́dal has collaborated with scholars based in Czechia, Austria and Japan. Frequent co-authors include Daniel Franta, F. Lukeš, David Nečas, K. Navrátil, Petr Klapetek, Miloslav Ohlídal, Jiří Vohánka, Martin Čermák, Lenka Zajı́čková and Vilma Buršı́ková. Their work appears in journals such as Thin Solid Films, Applied Surface Science, Surface and Interface Analysis, Journal of Modern Optics and Diamond and Related Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.