Shohei Hayashi
- Electrical and Electronic Engineering
- Materials Chemistry
- Electronic, Optical and Magnetic Materials
- Biomedical Engineering
- Control and Systems Engineering
- Co-authors
- Ryoichi TakayamaTakashi HiraoIsaku KannoHajime OkumuraSeiichiro HigashiTomohisa KatoKatsuhiko UemuraF. Ishiguro
- Topics
- Thin-Film Transistor Technologies (16 papers)Silicon Carbide Semiconductor Technologies (13 papers)Semiconductor materials and devices (8 papers)
- Cited by
- Electrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsCeramics and Composites
- Partner nations
- JapanUnited States
In The Last Decade
Shohei Hayashi
35 papers receiving 402 citations
Peers
Comparison fields: 5 of 47
- Electrical and Electronic Engineering 305
- Materials Chemistry 149
- Electronic, Optical and Magnetic Materials 93
- Biomedical Engineering 66
- Control and Systems Engineering 31
Countries citing papers authored by Shohei Hayashi
This map shows the geographic impact of Shohei Hayashi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shohei Hayashi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shohei Hayashi more than expected).
Fields of papers citing papers by Shohei Hayashi
This network shows the impact of papers produced by Shohei Hayashi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shohei Hayashi. The network helps show where Shohei Hayashi may publish in the future.
Co-authorship network of co-authors of Shohei Hayashi
This figure shows the co-authorship network connecting the top 25 collaborators of Shohei Hayashi. A scholar is included among the top collaborators of Shohei Hayashi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shohei Hayashi. Shohei Hayashi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 0 | |
| 3 | 1 | |
| 4 | 3 | |
| 5 | 1 | |
| 6 | 2 | |
| 7 | 18 | |
| 8 | 10 | |
| 9 | 9 | |
| 10 | 31 | |
| 11 | 2 | |
| 12 | 23 | |
| 13 | 4 | |
| 14 | 0 | |
| 15 | 3 | |
| 16 | Highly-Crystallized Ge:H Film Growth from GeH | 0 |
| 17 | 3 | |
| 18 | 4 | |
| 19 | 2 | |
| 20 | 2 |
About Shohei Hayashi
Shohei Hayashi is a scholar working on Electrical and Electronic Engineering, Ceramics and Composites and Computational Mechanics, having authored 39 papers that have together received 416 indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (16 papers), Silicon Carbide Semiconductor Technologies (13 papers) and Semiconductor materials and devices (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (305 citations), Electronic, Optical and Magnetic Materials (93 citations) and Ceramics and Composites (21 citations). Shohei Hayashi has collaborated with scholars based in Japan and United States. Frequent co-authors include Ryoichi Takayama, Takashi Hirao, Isaku Kanno, Hajime Okumura, Seiichiro Higashi, Tomohisa Kato, Katsuhiko Uemura, F. Ishiguro, Junji Senzaki and Kazutoshi Kojima. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.