S. Huh

537 total citations
10 papers, 447 citations indexed

About

S. Huh is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, S. Huh has authored 10 papers receiving a total of 447 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Electrical and Electronic Engineering, 4 papers in Surfaces, Coatings and Films and 3 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in S. Huh's work include Advancements in Photolithography Techniques (4 papers), Silicon Carbide Semiconductor Technologies (4 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). S. Huh is often cited by papers focused on Advancements in Photolithography Techniques (4 papers), Silicon Carbide Semiconductor Technologies (4 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). S. Huh collaborates with scholars based in United States, South Korea and Russia. S. Huh's co-authors include Marek Skowroński, A. Y. Polyakov, Joseph J. Sumakeris, B. V. Shanabrook, P. B. Klein, Michael O’Loughlin, Jang‐Ming Lee, Chan Kyu Kim, John Yoo and Hyun‐Jong Chung and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and European Journal of Cancer Prevention.

In The Last Decade

S. Huh

10 papers receiving 423 citations

Peers

S. Huh
Comparison fields: 5 of 70
  • Electrical and Electronic Engineering 272
  • Pathology and Forensic Medicine 89
  • Atomic and Molecular Physics, and Optics 68
  • Molecular Biology 47
  • Biochemistry 47
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Citations per field, relative to S. Huh
S. Huh · 1×
Citations per year, relative to S. Huh
S. Huh · 1×

Countries citing papers authored by S. Huh

Since Specialization
Citations

This map shows the geographic impact of S. Huh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Huh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Huh more than expected).

Fields of papers citing papers by S. Huh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Huh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Huh. The network helps show where S. Huh may publish in the future.

Co-authorship network of co-authors of S. Huh

This figure shows the co-authorship network connecting the top 25 collaborators of S. Huh. A scholar is included among the top collaborators of S. Huh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Huh. S. Huh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

10 of 10 papers shown
# Work Indexed citations
1
Particle removal challenges with EUV patterned mask for the sub-22nm HP node
2
2 6
3 1
4
Achieving diffraction-limited EUV aerial image microscopy
1
5 18
6 187
7 17
8 32
9 14
10 169

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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