R. Sporken
- Materials Chemistry top 2%
- Electrical and Electronic Engineering top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Catalysis top 5%
- Biomedical Engineering top 10%
- Co-authors
- R. CaudanoAnouk GaltayriesM. D. LangeS. SivananthanJ. P. FaurieRobert L. JohnsonG. BlanchardJ. Riga
- Topics
- Advanced Semiconductor Detectors and Materials (37 papers)Chalcogenide Semiconductor Thin Films (30 papers)Semiconductor materials and devices (30 papers)
- Partner nations
- BelgiumUnited StatesFrance
In The Last Decade
R. Sporken
142 papers receiving 2.7k citations
Peers
Comparison fields: 5 of 76
- Materials Chemistry 1.8k
- Electrical and Electronic Engineering 1.4k
- Atomic and Molecular Physics, and Optics 745
- Catalysis 306
- Biomedical Engineering 296
Countries citing papers authored by R. Sporken
This map shows the geographic impact of R. Sporken's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Sporken with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Sporken more than expected).
Fields of papers citing papers by R. Sporken
This network shows the impact of papers produced by R. Sporken. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Sporken. The network helps show where R. Sporken may publish in the future.
Co-authorship network of co-authors of R. Sporken
This figure shows the co-authorship network connecting the top 25 collaborators of R. Sporken. A scholar is included among the top collaborators of R. Sporken based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Sporken. R. Sporken is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 9 | |
| 4 | 15 | |
| 5 | 20 | |
| 6 | 12 | |
| 7 | 88 | |
| 8 | 43 | |
| 9 | 4 | |
| 10 | 7 | |
| 11 | 10 | |
| 12 | 11 | |
| 13 | Atomic scale analysis of defect structures and properties in III-nitride materials by Z-contrast imaging and EELS in STEM | 0 |
| 14 | 16 | |
| 15 | 17 | |
| 16 | 2 | |
| 17 | 3 | |
| 18 | 33 | |
| 19 | 21 | |
| 20 | 15 |
About R. Sporken
R. Sporken is a scholar working on Surfaces, Coatings and Films, Acoustics and Ultrasonics and Atomic and Molecular Physics, and Optics, having authored 146 papers that have together received 2.8k indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (37 papers), Chalcogenide Semiconductor Thin Films (30 papers) and Semiconductor materials and devices (30 papers). The work is most often cited by research in Catalysis (306 citations), Materials Chemistry (1.8k citations) and Electrical and Electronic Engineering (1.4k citations). R. Sporken has collaborated with scholars based in Belgium, United States and France. Frequent co-authors include R. Caudano, Anouk Galtayries, M. D. Lange, S. Sivananthan, J. P. Faurie, S. Sivananthan, Robert L. Johnson, G. Blanchard, J. Riga and J. Ghijsen. Their work appears in journals such as Nano Letters, Physical review. B, Condensed matter and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.