R R Varma
- Electrical and Electronic Engineering top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Materials Chemistry
- Surfaces, Coatings and Films top 10%
- Biomedical Engineering
- Co-authors
- R. H. WilliamsV. MontgomeryA. GoswamiAllan J. McKinleyP. G. Le ComberW. E. SpearE. LaneA. Katz
- Topics
- Semiconductor materials and devices (9 papers)Semiconductor materials and interfaces (6 papers)Surface and Thin Film Phenomena (4 papers)
- Cited by
- Surfaces, Coatings and FilmsAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Partner nations
- United KingdomUnited StatesIndia
In The Last Decade
R R Varma
15 papers receiving 415 citations
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 367
- Atomic and Molecular Physics, and Optics 287
- Materials Chemistry 124
- Surfaces, Coatings and Films 74
- Biomedical Engineering 32
Countries citing papers authored by R R Varma
This map shows the geographic impact of R R Varma's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R R Varma with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R R Varma more than expected).
Fields of papers citing papers by R R Varma
This network shows the impact of papers produced by R R Varma. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R R Varma. The network helps show where R R Varma may publish in the future.
Co-authorship network of co-authors of R R Varma
This figure shows the co-authorship network connecting the top 25 collaborators of R R Varma. A scholar is included among the top collaborators of R R Varma based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R R Varma. R R Varma is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 4 | |
| 4 | 26 | |
| 5 | 6 | |
| 6 | 16 | |
| 7 | 25 | |
| 8 | 72 | |
| 9 | 89 | |
| 10 | 32 | |
| 11 | 16 | |
| 12 | 17 | |
| 13 | 58 | |
| 14 | 71 | |
| 15 | 14 |
About R R Varma
R R Varma is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 15 papers that have together received 449 indexed citations. Recurring topics across this work include Semiconductor materials and devices (9 papers), Semiconductor materials and interfaces (6 papers) and Surface and Thin Film Phenomena (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (74 citations), Atomic and Molecular Physics, and Optics (287 citations) and Electrical and Electronic Engineering (367 citations). R R Varma has collaborated with scholars based in United Kingdom, United States and India. Frequent co-authors include R. H. Williams, V. Montgomery, A. Goswami, Allan J. McKinley, P. G. Le Comber, W. E. Spear, E. Lane, A. Katz, F. A. Baiocchi and Richard H. Williams. Their work appears in journals such as Journal of Physics D Applied Physics, Thin Solid Films and Materials Chemistry and Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.