E. Lane
Impact in
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- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- 3D IC and TSV technologies
- Plasma Diagnostics and Applications
- Advancements in Semiconductor Devices and Circuit Design
- General Materials Science top 10%
Papers in ⓘ
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- Semiconductor materials and devices 21
- Plasma Diagnostics and Applications 7
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- Metal and Thin Film Mechanics 8
- Adhesion, Friction, and Surface Interactions 4
- Co-authors
- S. J. Pearton (18 shared papers)A. Katz (17 shared papers)K. S. Jones (6 shared papers)F. A. Baiocchi (7 shared papers)U. K. Chakrabarti (5 shared papers)S. Nakahara (8 shared papers)M. Geva (10 shared papers)W. S. Hobson (5 shared papers)
- Journals
- Journal of Applied Physics (9 papers)Applied Physics Letters (5 papers)Semiconductor Science and Technology (2 papers)Journal of The Electrochemical Society (2 papers)Materials Chemistry and Physics (1 paper)
- Partner nations
- United StatesGermany
In The Last Decade
E. Lane
30 papers receiving 349 citations
Peers
Comparison fields: 5 of 36
- Electrical and Electronic Engineering 321
- General Materials Science 15
- Mechanics of Materials 116
- Atomic and Molecular Physics, and Optics 116
- Surfaces, Coatings and Films 21
Countries citing papers authored by E. Lane
This map shows the geographic impact of E. Lane's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Lane with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Lane more than expected).
Fields of papers citing papers by E. Lane
This network shows the impact of papers produced by E. Lane. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Lane. The network helps show where E. Lane may publish in the future.
Co-authors
The 25 scholars most cited alongside E. Lane, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1992 | 38 | |
| 2 | 1991 | 37 | |
| 3 | 1989 | 34 | |
| 4 | 1993 | 26 | |
| 5 | 1988 | 25 | |
| 6 | 1992 | 25 | |
| 7 | 1992 | 25 | |
| 8 | 1984 | 18 | |
| 9 | 1989 | 17 | |
| 10 | 1992 | 17 | |
| 11 | 1993 | 15 | |
| 12 | 1994 | 13 | |
| 13 | 1973 | 11 | |
| 14 | 1994 | 11 | |
| 15 | 1983 | 8 | |
| 16 | 1992 | 7 | |
| 17 | 1993 | 7 | |
| 18 | 1992 | 6 | |
| 19 | 1991 | 5 | |
| 20 | 1989 | 5 |
About E. Lane
E. Lane is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Atomic and Molecular Physics, and Optics, Condensed Matter Physics and Materials Chemistry, having authored 31 papers that have together received 374 indexed citations. Recurring topics across this work include Semiconductor materials and devices (21 papers), Metal and Thin Film Mechanics (8 papers), Plasma Diagnostics and Applications (7 papers), Semiconductor Quantum Structures and Devices (6 papers), GaN-based semiconductor devices and materials (6 papers), Semiconductor materials and interfaces (6 papers), Adhesion, Friction, and Surface Interactions (4 papers) and Copper Interconnects and Reliability (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (321 citations), General Materials Science (15 citations), Mechanics of Materials (116 citations), Atomic and Molecular Physics, and Optics (116 citations) and Surfaces, Coatings and Films (21 citations). E. Lane has collaborated with scholars based in United States and Germany. Frequent co-authors include S. J. Pearton, A. Katz, K. S. Jones, F. A. Baiocchi, U. K. Chakrabarti, S. Nakahara, M. Geva, W. S. Hobson, K. Tai and C. J. Doherty. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Semiconductor Science and Technology, Journal of The Electrochemical Society and Materials Chemistry and Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.