R. Liu

569 total citations
17 papers, 469 citations indexed

About

R. Liu is a scholar working on Electrical and Electronic Engineering, Computer Networks and Communications and Materials Chemistry. According to data from OpenAlex, R. Liu has authored 17 papers receiving a total of 469 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 4 papers in Computer Networks and Communications and 4 papers in Materials Chemistry. Recurrent topics in R. Liu's work include Semiconductor materials and devices (17 papers), Advanced Memory and Neural Computing (12 papers) and Advancements in Semiconductor Devices and Circuit Design (8 papers). R. Liu is often cited by papers focused on Semiconductor materials and devices (17 papers), Advanced Memory and Neural Computing (12 papers) and Advancements in Semiconductor Devices and Circuit Design (8 papers). R. Liu collaborates with scholars based in Taiwan. R. Liu's co-authors include Hang-Ting Lue, Chih-Yuan Lu, Kuang-Yeu Hsieh, Erh-Kun Lai, K. Y. Hsieh, Yang‐Hsin Shih, Chih‐Yuan Lu, Yen-Hao Shih, Szu-Yu Wang and Sheng-Chih Lai and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters and IEEE Transactions on Device and Materials Reliability.

In The Last Decade

R. Liu

17 papers receiving 448 citations

Peers

Countries citing papers authored by R. Liu

Since Specialization

Citations

This map shows the geographic impact of R. Liu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Liu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Liu more than expected).

Fields of papers citing papers by R. Liu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Liu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Liu. The network helps show where R. Liu may publish in the future.

Co-authorship network of co-authors of R. Liu

This figure shows the co-authorship network connecting the top 25 collaborators of R. Liu. A scholar is included among the top collaborators of R. Liu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Liu. R. Liu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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17 of 17 papers shown

#	Work	Indexed citations
1	Unipolar Switching Behaviors of RTO $\hbox{WO}_{X}$ RRAM 2010 ·IEEE Electron Device Letters ·Wei-Chih Chien, (unknown), Erh-Kun Lai, (unknown), Peng Lin, S. F. Horng, Jingjing Gong, (unknown), (unknown), (unknown), Yang‐Hsin Shih, K. Y. Hsieh, R. Liu, Chih-Yuan Lu	95
2	Pulse-$IV$ Characterization of Charge-Transient Behavior of SONOS-Type Devices With or Without a Thin Tunnel Oxide 2009 ·IEEE Electron Device Letters ·Pei-Ying Du, Hang-Ting Lue, (unknown), Tiao−Yuan Huang, Kuang-Yeu Hsieh, R. Liu, (unknown)	1
3	Multi-Level Operation of Fully CMOS Compatible WOX Resistive Random Access Memory (RRAM) 2009 ·Wei-Chih Chien, (unknown), (unknown), Erh-Kun Lai, (unknown), Peng Lin, Jingjing Gong, Stella Chin‐Shaw Tsai, (unknown), (unknown), K. Y. Hsieh, R. Liu, Chih‐Yuan Lu	21
4	A critical review of charge-trapping NAND flash devices 2008 ·Hang-Ting Lue, Sheng-Chih Lai, Tzu‐Hsuan Hsu, Yi‐Hsuan Hsiao, Pei-Ying Du, Szu-Yu Wang, Kuang-Yeu Hsieh, R. Liu, Chih‐Yuan Lu	12
5	Improved Reliability Performances of SONOS-Type Devices Using Hot-Hole Erase Method by Novel Negative FN Operations 2008 ·IEEE Transactions on Device and Materials Reliability ·Yi‐Hsuan Hsiao, Hang-Ting Lue, Yen-Hao Shih, Erh-Kun Lai, Kuang-Yeu Hsieh, R. Liu, Chih‐Yuan Lu	1
6	Multi-Level Switching Characteristics for WO<sub>X</sub> Resistive RAM (RRAM) 2008 ·Wei-Chih Chien, (unknown), (unknown), Erh-Kun Lai, Hannes Mähne, (unknown), Peng Lin, Jingjing Gong, (unknown), K. Y. Hsieh, R. Liu, (unknown)	6
7	A novel buried-channel FinFET BE-SONOS NAND Flash with improved memory window and cycling endurance 2006 ·Symposium on VLSI Technology ·Hang-Ting Lue, Yi‐Hsuan Hsiao, Pei-Ying Du, Sheng-Chih Lai, Tzu‐Hsuan Hsu, (unknown), M. T. Wu, (unknown), (unknown), (unknown), Jung-Yu Hsieh, Ling-Wu Yang, Tahone Yang, Kuang‐Chao Chen, Kuang-Yeu Hsieh, R. Liu, Chih‐Yuan Lu	5
8	BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability 2006 ·Hang-Ting Lue, Szu-Yu Wang, Erh-Kun Lai, Yen-Hao Shih, Sheng-Chih Lai, Ling-Wu Yang, Kuang‐Chao Chen, J. Ku, Kuang-Yeu Hsieh, R. Liu, Chih‐Yuan Lu	108
9	A Highly Stackable Thin-Film Transistor (TFT) NAND-Type Flash Memory 2006 ·Erh-Kun Lai, Hang-Ting Lue, Yi‐Hsuan Hsiao, (unknown), Si‐Chen Lee, Chia-Hui Lu, (unknown), Ling Yang, (unknown), Jiangdong Gong, K. Y. Hsieh, J. Ku, R. Liu, C.-Y. Lu	22
10	A novel P-channel nitride-trapping nonvolatile memory device with excellent reliability properties 2005 ·IEEE Electron Device Letters ·Hang-Ting Lue, Kuang-Yeu Hsieh, R. Liu, Chih-Yuan Lu	4
11	An Asymmetric Two-Side Program With One-Side Read (ATPOR) Device for MultiBit Per Cell MLC Nitride-Trapping Flash Memories 2005 ·IEEE Transactions on Electron Devices ·J. Y. Wu, (unknown), (unknown), (unknown), H.L. Lung, R. Liu, Chun‐Yi Lu	3
12	A novel 2-bit/cell nitride storage flash memory with greater than 1M P/E-cycle endurance 2005 ·Yang‐Hsin Shih, Hang-Ting Lue, Kuang-Yeu Hsieh, R. Liu, (unknown)	17
13	Novel soft erase and re-fill methods for a P/sup +/-poly gate nitride trapping non-volatile memory device with excellent endurance and retention properties 2005 ·Hang-Ting Lue, Yen-Hao Shih, (unknown), R. Liu, Chih‐Yuan Lu	21
14	Studies of the reverse read method and second-bit effect of 2-bit/cell nitride-trapping device by quasi-two-dimensional model 2005 ·IEEE Transactions on Electron Devices ·Hang-Ting Lue, Tzu‐Hsuan Hsu, (unknown), Kuang-Yeu Hsieh, R. Liu, Chih-Yuan Lu	31
15	An access-transistor-free (0T/1R) non-volatile resistance random access memory (RRAM) using a novel threshold switching, self-rectifying chalcogenide device 2004 ·Yi‐Chou Chen, (unknown), (unknown), (unknown), (unknown), (unknown), R. Liu, Chih-Yuan Lu	69
16	A Transient Analysis Method to Characterize the Trap Vertical Location in Nitride-Trapping Devices 2004 ·IEEE Electron Device Letters ·Hang-Ting Lue, Yang‐Hsin Shih, K. Y. Hsieh, R. Liu, Chien-Yuan Lu	43
17	Investigation of Maximum Current Sensing Window for Two-Side Operation, Four-bit/cell MLC Nitride-Trapping Nonvolatile Flash Memories 2004 ·IEEE Electron Device Letters ·(unknown), (unknown), J. Y. Wu, H.L. Lung, R. Liu, C.-Y. Lu	10

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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