A. Zöller

435 total citations
23 papers, 338 citations indexed

About

A. Zöller is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Electrical and Electronic Engineering. According to data from OpenAlex, A. Zöller has authored 23 papers receiving a total of 338 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Surfaces, Coatings and Films, 14 papers in Computational Mechanics and 10 papers in Electrical and Electronic Engineering. Recurrent topics in A. Zöller's work include Optical Coatings and Gratings (15 papers), Surface Roughness and Optical Measurements (13 papers) and Semiconductor Lasers and Optical Devices (5 papers). A. Zöller is often cited by papers focused on Optical Coatings and Gratings (15 papers), Surface Roughness and Optical Measurements (13 papers) and Semiconductor Lasers and Optical Devices (5 papers). A. Zöller collaborates with scholars based in Germany, United States and Russia. A. Zöller's co-authors include Norbert Kaiser, D. H. Cushing, J. Verdú, A. Marcilla, J.M. Williams, Alexander V. Tikhonravov and Michael K. Trubetskov and has published in prestigious journals such as Materials Science and Engineering A, Thin Solid Films and Polymer Engineering and Science.

In The Last Decade

A. Zöller

18 papers receiving 305 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Zöller Germany 7 213 128 120 80 75 23 338
Basile Lazaridès France 7 216 1.0× 173 1.4× 119 1.0× 105 1.3× 172 2.3× 10 439
G. K. M. Thutupalli India 10 275 1.3× 175 1.4× 91 0.8× 76 0.9× 84 1.1× 30 436
S. Harkema Netherlands 12 264 1.2× 166 1.3× 94 0.8× 196 2.5× 294 3.9× 20 526
W. Erfurth Germany 11 177 0.8× 130 1.0× 31 0.3× 158 2.0× 65 0.9× 23 350
Tim Brown Canada 7 118 0.6× 113 0.9× 204 1.7× 107 1.3× 69 0.9× 8 325
Mitsuaki Morigami Japan 6 291 1.4× 79 0.6× 100 0.8× 269 3.4× 49 0.7× 11 444
Patrick J. Paniez France 10 240 1.1× 53 0.4× 67 0.6× 133 1.7× 28 0.4× 54 333
J. Benedict United States 8 205 1.0× 140 1.1× 63 0.5× 79 1.0× 29 0.4× 19 351
Jungna Heo South Korea 11 180 0.8× 217 1.7× 73 0.6× 72 0.9× 19 0.3× 19 336
J.-G. Fan United States 7 90 0.4× 151 1.2× 162 1.4× 154 1.9× 56 0.7× 8 361

Countries citing papers authored by A. Zöller

Since Specialization
Citations

This map shows the geographic impact of A. Zöller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Zöller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Zöller more than expected).

Fields of papers citing papers by A. Zöller

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Zöller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Zöller. The network helps show where A. Zöller may publish in the future.

Co-authorship network of co-authors of A. Zöller

This figure shows the co-authorship network connecting the top 25 collaborators of A. Zöller. A scholar is included among the top collaborators of A. Zöller based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Zöller. A. Zöller is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Zöller, A., et al.. (2015). Advanced optical monitoring system using a new developed low noise wideband spectrometer system. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9627. 962712–962712. 2 indexed citations
2.
Zöller, A., et al.. (2015). High efficiency RF-plasma source with increased energy range. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9627. 96270O–96270O. 1 indexed citations
3.
Verdú, J., A. Zöller, & A. Marcilla. (2012). Plastisol foaming process. Decomposition of the foaming agent, polymer behavior in the corresponding temperature range and resulting foam properties. Polymer Engineering and Science. 53(8). 1712–1718. 8 indexed citations
4.
Zöller, A., et al.. (2010). High Performance Coatings with Large RF Plasma Source. Optical Interference Coatings. MB8–MB8. 1 indexed citations
5.
Zöller, A., et al.. (2010). Precision Filter Manufacture Using Direct Optical Monitoring. Optical Interference Coatings. TuC8–TuC8. 5 indexed citations
6.
Zöller, A.. (2009). Computer Simulation of Monitoring of Narrow Bandpass filters at Non-Turning Points. 2 indexed citations
7.
Zöller, A., et al.. (2008). Computer simulation of coating processes with monochromatic monitoring. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7101. 71010G–71010G. 27 indexed citations
8.
Trubetskov, Michael K., et al.. (2007). Software tools for studying optical manufacturability with modern monochromatic monitoring devices. 57–57. 1 indexed citations
9.
Zöller, A.. (2007). Direct optical monitoring on the rotating substrate holder. Vakuum in Forschung und Praxis. 19(3). 6–10. 1 indexed citations
10.
Zöller, A., et al.. (2005). Oxide and fluoride coatings for the excimer wavelength 193nm. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4 indexed citations
11.
Kaiser, Norbert, et al.. (1998). Room-temperature deposition of indium tin oxide thin films with plasma ion-assisted evaporation. Thin Solid Films. 335(1-2). 1–5. 140 indexed citations
12.
Zöller, A.. (1997). Plasmaunterstütztes Aufdampfverfahren eröffnet neue Perspektiven in der Brillen‐ und Feinoptik. Vakuum in Forschung und Praxis. 9(1). 19–24. 1 indexed citations
13.
Zöller, A., et al.. (1996). Temperature-stable bandpass filters deposited with plasma ion-assisted deposition. Applied Optics. 35(28). 5609–5609. 43 indexed citations
14.
Zöller, A., et al.. (1995). Shift free interference coatings deposited with plasma ion assisted deposition. Optical Interference Coatings. TuA7–TuA7.
15.
Zöller, A., et al.. (1992). Plasma ion-assisted deposition: A promising technique for optical coatings. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 1897–1904. 61 indexed citations
16.
Zöller, A., et al.. (1992). PLASMA ION-ASSISTED EVAPORATIVE DEPOSITION OF SURFACE LAYERS. Annual Review of Materials Science. 22(1). 279–294. 7 indexed citations
17.
Zöller, A., et al.. (1991). Ion-assisted deposition with a new plasma source. Materials Science and Engineering A. 140. 523–527. 20 indexed citations
18.
Zöller, A., et al.. (1989). Optical Thickness Monitoring Of Dielectric Optical Filters Using A New In-Situ Photometer With High Signal Resolution And Excellent Long-Term-Stability. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1019. 106–106. 4 indexed citations
19.
Zöller, A., et al.. (1986). Optical Monitoring: Comparison Of Different Monitoring Strategies With Respect To The Resulting Reproducibility To The Completed Layer Systems. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 652. 21–21. 2 indexed citations
20.
Zöller, A., et al.. (1983). <title>Automated Control Of Optical Layer Fabrication Processes</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 401. 83–92. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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