Olivier Palais

757 total citations
69 papers, 558 citations indexed

About

Olivier Palais is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Olivier Palais has authored 69 papers receiving a total of 558 indexed citations (citations by other indexed papers that have themselves been cited), including 63 papers in Electrical and Electronic Engineering, 24 papers in Atomic and Molecular Physics, and Optics and 15 papers in Materials Chemistry. Recurrent topics in Olivier Palais's work include Silicon and Solar Cell Technologies (38 papers), Thin-Film Transistor Technologies (29 papers) and Semiconductor materials and interfaces (23 papers). Olivier Palais is often cited by papers focused on Silicon and Solar Cell Technologies (38 papers), Thin-Film Transistor Technologies (29 papers) and Semiconductor materials and interfaces (23 papers). Olivier Palais collaborates with scholars based in France, Canada and Germany. Olivier Palais's co-authors include S. Martinuzzi, Sébastien Dubois, Laurent Ottaviani, A. Lyoussi, M. Pasquinelli, David Maestre, F. Gourbilleau, Céline Ternon, Christian Dufour and C. Jaussaud and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Olivier Palais

66 papers receiving 546 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Olivier Palais France 15 473 182 176 89 41 69 558
M. Wagener South Africa 12 443 0.9× 280 1.5× 203 1.2× 81 0.9× 8 0.2× 47 521
Marko Yli‐Koski Finland 17 930 2.0× 351 1.9× 211 1.2× 136 1.5× 41 1.0× 71 976
M. L. Polignano Italy 14 563 1.2× 259 1.4× 96 0.5× 66 0.7× 22 0.5× 94 643
F.A. Rubinelli Argentina 16 843 1.8× 220 1.2× 496 2.8× 90 1.0× 15 0.4× 58 894
Peter G. Muzykov United States 18 610 1.3× 232 1.3× 148 0.8× 49 0.6× 56 1.4× 49 672
Kenichiro Takakura Japan 14 492 1.0× 315 1.7× 237 1.3× 32 0.4× 16 0.4× 63 648
J. G. Werthen United States 17 664 1.4× 378 2.1× 193 1.1× 88 1.0× 16 0.4× 48 720
L.C. Riewe United States 16 1.4k 2.9× 90 0.5× 160 0.9× 33 0.4× 33 0.8× 24 1.4k
Wugen Pan Japan 13 519 1.1× 303 1.7× 273 1.6× 114 1.3× 24 0.6× 43 637
W Murray Bullis United States 11 485 1.0× 291 1.6× 122 0.7× 134 1.5× 21 0.5× 23 603

Countries citing papers authored by Olivier Palais

Since Specialization
Citations

This map shows the geographic impact of Olivier Palais's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Olivier Palais with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Olivier Palais more than expected).

Fields of papers citing papers by Olivier Palais

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Olivier Palais. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Olivier Palais. The network helps show where Olivier Palais may publish in the future.

Co-authorship network of co-authors of Olivier Palais

This figure shows the co-authorship network connecting the top 25 collaborators of Olivier Palais. A scholar is included among the top collaborators of Olivier Palais based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Olivier Palais. Olivier Palais is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Vervisch, V., et al.. (2024). Silicon carbide PIN diode for tritium detection. Vacuum. 230. 113707–113707.
2.
Barakel, Damien, et al.. (2023). Ion implantation investigation for the passivation of cut edge solar cells. AIP conference proceedings. 2826. 30006–30006. 1 indexed citations
3.
Desrues, Thibaut, et al.. (2023). Edge passivation of shingled poly-Si/SiOxpassivated contacts solar cells. EPJ Photovoltaics. 14. 22–22. 1 indexed citations
4.
Djeziri, Mohand, et al.. (2022). Solar cell modeling in normal and degraded operations for simulation and monitoring. Sustainable Energy Technologies and Assessments. 51. 101990–101990. 6 indexed citations
5.
Barakel, Damien, et al.. (2021). Nickel and gold identification in p-type silicon through TDLS: a modeling study. The European Physical Journal Applied Physics. 94(1). 10101–10101. 2 indexed citations
6.
7.
Barakel, Damien, Olivier Palais, Marisa Di Sabatino, et al.. (2019). Role of Impurities in Silicon Solidification and Electrical Properties Studied by Complementary In Situ and Ex Situ Methods. physica status solidi (a). 216(17). 6 indexed citations
8.
Barakel, Damien, Ludovic Escoubas, F. Flory, et al.. (2018). CARACTERISATIONS DES MATERIAUX ET DES DISPOSITIFS POUR LE PHOTOVOLTAIQUE. HAL (Le Centre pour la Communication Scientifique Directe). 1 indexed citations
9.
Palais, Olivier, et al.. (2015). Simple Method for Phosphorus Diffusion on <100> Oriented P-Type Silicon Using New Phosphorus Gel as Dopant. Applied Physics Research. 7(2). 2 indexed citations
10.
Ottaviani, Laurent, Mihai Lazar, F. Milési, et al.. (2015). 4H-SiC P<sup>+</sup>N UV Photodiodes for Space Applications. Materials science forum. 821-823. 644–647. 2 indexed citations
11.
Ottaviani, Laurent, Olivier Palais, F. Milési, et al.. (2014). 4H-SiC P+N UV Photodiodes: Influence of Temperature and Irradiation. MRS Proceedings. 1693. 2 indexed citations
12.
Ottaviani, Laurent, Mihai Lazar, Dominique Planson, et al.. (2011). 4H-SiC P +N UV photodiodes: A comparison between beam and plasma doping processes. SPIRE - Sciences Po Institutional REpository. 1 indexed citations
13.
Dubois, Sébastien, et al.. (2010). Light‐induced degradation in compensated n‐type Czochralski silicon solar cells. physica status solidi (a). 208(3). 572–575. 14 indexed citations
14.
Palais, Olivier, et al.. (2010). Is n-type multicrystalline silicon the best candidate for short-term high-efficiency lower-cost solar cells?. Renewable Energy and Power Quality Journal. 1(8). 1398–1403. 2 indexed citations
15.
Ottaviani, Laurent, Olivier Palais, Damien Barakel, & M. Pasquinelli. (2009). Minority Carrier Lifetime Measurements in Specific Epitaxial 4H-SiC Layers by the Microwave Photoconductivity Decay. Materials science forum. 615-617. 295–298. 1 indexed citations
16.
Dubois, Sébastien, et al.. (2006). Influence of iron contamination on the performances of single-crystalline silicon solar cells: Computed and experimental results. Journal of Applied Physics. 100(2). 29 indexed citations
17.
Dubois, Sébastien, Olivier Palais, M. Pasquinelli, S. Martinuzzi, & C. Jaussaud. (2006). Influence of substitutional metallic impurities on the performances of p-type crystalline silicon solar cells: The case of gold. Journal of Applied Physics. 100(12). 15 indexed citations
18.
Pasquinelli, M., et al.. (2006). Hysteresis phenomena in reverse biased InAsSbP∕InAs heterostructure. Applied Physics Letters. 89(2). 3 indexed citations
19.
Palais, Olivier, et al.. (2005). Relationship between structure, segregation and electrical activity in grain boundaries. Journal of Materials Science. 40(12). 3163–3167. 2 indexed citations
20.
Palais, Olivier, J.-L. Gervais, E. B. Yakimov, & S. Martinuzzi. (2000). Contactless mapping of lifetime and diffusion length scan map of minority carriers in silicon wafers. The European Physical Journal Applied Physics. 10(2). 157–162. 16 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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