M. L. Polignano

846 total citations
94 papers, 643 citations indexed

About

M. L. Polignano is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, M. L. Polignano has authored 94 papers receiving a total of 643 indexed citations (citations by other indexed papers that have themselves been cited), including 86 papers in Electrical and Electronic Engineering, 39 papers in Atomic and Molecular Physics, and Optics and 12 papers in Computational Mechanics. Recurrent topics in M. L. Polignano's work include Silicon and Solar Cell Technologies (64 papers), Integrated Circuits and Semiconductor Failure Analysis (46 papers) and Semiconductor materials and interfaces (34 papers). M. L. Polignano is often cited by papers focused on Silicon and Solar Cell Technologies (64 papers), Integrated Circuits and Semiconductor Failure Analysis (46 papers) and Semiconductor materials and interfaces (34 papers). M. L. Polignano collaborates with scholars based in Italy, Switzerland and Czechia. M. L. Polignano's co-authors include G. F. Cerofolini, H. Bender, C. Claeys, G. Queirolo, G. Pavia, V. Soncini, Salvatore Grasso, F. Priolo, P. Cappelletti and Gilles Tessier and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Applied Surface Science.

In The Last Decade

M. L. Polignano

85 papers receiving 608 citations

Peers

M. L. Polignano

EEE

AMPO

Marie Fontaine Canada

Mark Feldman United States

W Murray Bullis United States

K G Svantesson Sweden

P. Kamiński Poland

G. Vergara Spain

Dae-gil Kim South Korea

Nigel R. Farrar United States

T.C. Holloway United States

L. Henry United States

Marie Fontaine Canada

M. L. Polignano

350 ×0.6

EEE

204 ×0.8

AMPO

110 ×1.1

47 ×0.7

74 ×1.1

Citations per year, relative to M. L. Polignano M. L. Polignano (= 1×) peers Marie Fontaine

Countries citing papers authored by M. L. Polignano

Since Specialization

Citations

This map shows the geographic impact of M. L. Polignano's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. L. Polignano with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. L. Polignano more than expected).

Fields of papers citing papers by M. L. Polignano

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. L. Polignano. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. L. Polignano. The network helps show where M. L. Polignano may publish in the future.

Co-authorship network of co-authors of M. L. Polignano

This figure shows the co-authorship network connecting the top 25 collaborators of M. L. Polignano. A scholar is included among the top collaborators of M. L. Polignano based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. L. Polignano. M. L. Polignano is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Polignano, M. L., et al.. (2018). Characterization Techniques for Ion-Implanted Layers in Silicon. 30. 144–152.

Polignano, M. L., D. Magni, Frédéric Jay, et al.. (2018). Analysis of Near-Surface Metal Contamination by Photoluminescence Measurements. ECS Journal of Solid State Science and Technology. 7(3). R12–R16. 2 indexed citations

Polignano, M. L., et al.. (2017). Dark Current Spectroscopy of Transition Metals in CMOS Image Sensors. ECS Journal of Solid State Science and Technology. 6(5). P217–P226. 17 indexed citations

Polignano, M. L., et al.. (2015). Review—Characterization of Metal-Contamination Effects in Silicon. ECS Journal of Solid State Science and Technology. 5(4). P3048–P3058. 5 indexed citations

Polignano, M. L., et al.. (2012). Tellurium Contamination in Silicon. ECS Journal of Solid State Science and Technology. 2(1). N28–N34. 3 indexed citations

Polignano, M. L., et al.. (2007). Molybdenum Contamination in Indium and Boron Implantation Processes. ECS Transactions. 10(1). 85–94. 6 indexed citations

Ghidini, G., et al.. (2006). Oxide Thinning in Shallow Trench Isolation. 42. 379–384. 2 indexed citations

Tessier, Gilles, et al.. (2005). High resolution thermoreflectance imaging on transistor arrays with defect-induced leakage. Journal de Physique IV (Proceedings). 125. 423–425. 7 indexed citations

Caputo, D., M. L. Polignano, P. Lazzeri, et al.. (2004). Quantitative Evaluation of Iron at the Silicon Surface after Wet Cleaning Treatments. Journal of The Electrochemical Society. 151(5). G289–G289. 9 indexed citations

10.

Polignano, M. L., et al.. (2001). Interface properties of annealed and nitrided HTO layers. Microelectronic Engineering. 59(1-4). 379–384. 2 indexed citations

11.

Polignano, M. L., et al.. (2000). Surface characterization by photocurrent measurements. Applied Surface Science. 154-155. 276–282. 1 indexed citations

12.

Polignano, M. L., et al.. (1998). Denuded Zone Thickness from Surface Photovoltage Measurements: Comparison with Microscopy Techniques. Journal of The Electrochemical Society. 145(5). 1632–1639. 1 indexed citations

13.

Polignano, M. L., et al.. (1998). Quantitative evaluation of bulk-diffused metal contamination by lifetime techniques. Materials Science and Engineering B. 55(1-2). 21–33. 15 indexed citations

14.

Queirolo, G. & M. L. Polignano. (1992). Incremental sheet resistance and spreading resistance: A comparison. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(1). 408–412. 4 indexed citations

15.

Cerofolini, G. F. & M. L. Polignano. (1987). Self-interstitials and generation lifetime in silicon p-n junctions. physica status solidi (a). 100(1). 177–186. 10 indexed citations

16.

Polignano, M. L., et al.. (1987). The Role of Oxygen in Silicon p–n Junction Gettering. physica status solidi (a). 103(1). 307–316. 11 indexed citations

17.

Cerofolini, G. F. & M. L. Polignano. (1984). Gettering for VLSI. AIP conference proceedings. 122. 225–239.

18.

Cerofolini, G. F., M. L. Polignano, F. Nava, & G. Ottaviani. (1982). On the mechanism responsible for phosphorus inactivation in heavily doped silicon. Thin Solid Films. 97(4). 363–367. 4 indexed citations

19.

Polignano, M. L., et al.. (1981). An Anomalous Effect in Angle Lapping and Staining Ion‐Implanted Layers. Journal of The Electrochemical Society. 128(9). 2034–2036. 1 indexed citations

20.

Polignano, M. L., et al.. (1981). Phosphorus Silica Glass as Dopant Source: II . Validity of the Etch Rate Datum. Journal of The Electrochemical Society. 128(9). 2037–2038. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact