Régis Rogel

464 total citations
44 papers, 354 citations indexed

About

Régis Rogel is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Régis Rogel has authored 44 papers receiving a total of 354 indexed citations (citations by other indexed papers that have themselves been cited), including 41 papers in Electrical and Electronic Engineering, 17 papers in Biomedical Engineering and 17 papers in Materials Chemistry. Recurrent topics in Régis Rogel's work include Thin-Film Transistor Technologies (30 papers), Silicon Nanostructures and Photoluminescence (16 papers) and Nanowire Synthesis and Applications (15 papers). Régis Rogel is often cited by papers focused on Thin-Film Transistor Technologies (30 papers), Silicon Nanostructures and Photoluminescence (16 papers) and Nanowire Synthesis and Applications (15 papers). Régis Rogel collaborates with scholars based in France, China and Saudi Arabia. Régis Rogel's co-authors include Laurent Pichon, Emmanuel Jacques, Anne‐Claire Salaün, O. Bonnaud, Tayeb Mohammed‐Brahim, Pere Roca i Cabarrocas, Liang Ni, G. Patriarche, P. Pareige and F. Raoult and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Régis Rogel

44 papers receiving 340 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Régis Rogel France 12 296 205 134 49 25 44 354
Milo Holt United States 9 259 0.9× 195 1.0× 407 3.0× 63 1.3× 34 1.4× 10 492
M. Kramkowska Poland 9 474 1.6× 465 2.3× 190 1.4× 90 1.8× 10 0.4× 13 604
Yinxiao Yang United States 6 233 0.8× 92 0.4× 337 2.5× 61 1.2× 11 0.4× 11 381
J. Bablet France 9 314 1.1× 222 1.1× 54 0.4× 35 0.7× 20 0.8× 17 415
T. Ivanov Bulgaria 11 301 1.0× 73 0.4× 99 0.7× 132 2.7× 21 0.8× 38 380
G. S. Bocharov Russia 9 84 0.3× 151 0.7× 268 2.0× 33 0.7× 6 0.2× 37 337
Jiushuai Xu Germany 12 294 1.0× 264 1.3× 68 0.5× 184 3.8× 111 4.4× 40 411
T.S.Y. Moh Netherlands 8 287 1.0× 183 0.9× 40 0.3× 139 2.8× 36 1.4× 18 369
B. Kloeck Switzerland 7 317 1.1× 205 1.0× 88 0.7× 98 2.0× 91 3.6× 14 373
Herman A. Lopez United States 9 207 0.7× 152 0.7× 195 1.5× 144 2.9× 6 0.2× 19 338

Countries citing papers authored by Régis Rogel

Since Specialization
Citations

This map shows the geographic impact of Régis Rogel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Régis Rogel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Régis Rogel more than expected).

Fields of papers citing papers by Régis Rogel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Régis Rogel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Régis Rogel. The network helps show where Régis Rogel may publish in the future.

Co-authorship network of co-authors of Régis Rogel

This figure shows the co-authorship network connecting the top 25 collaborators of Régis Rogel. A scholar is included among the top collaborators of Régis Rogel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Régis Rogel. Régis Rogel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Zhang, Peng, Emmanuel Jacques, Régis Rogel, Laurent Pichon, & Olivier Bonnaud. (2022). Elucidation of electric characteristics for P and N type polycrystalline silicon vertical thin film transistors. Journal of Physics D Applied Physics. 55(49). 495109–495109. 1 indexed citations
2.
Zhang, Peng, Emmanuel Jacques, Régis Rogel, Laurent Pichon, & Olivier Bonnaud. (2021). In-depth analysis of electrical characteristics for polycrystalline silicon vertical thin film transistors. Solid-State Electronics. 178. 107981–107981. 2 indexed citations
3.
Zhang, Peng, Emmanuel Jacques, Régis Rogel, Laurent Pichon, & Olivier Bonnaud. (2020). Characterization and electrical modeling of polycrystalline silicon vertical thin film transistors. Solid-State Electronics. 171. 107798–107798. 2 indexed citations
4.
Pichon, Laurent, et al.. (2018). Bacteria electrical detection using 3D silicon nanowires based resistor. Sensors and Actuators B Chemical. 273. 1794–1799. 16 indexed citations
5.
Rogel, Régis, et al.. (2016). Spontaneous Buckling of Multiaxially Flexible and Stretchable Interconnects Using PDMS/Fibrous Composite Substrates. Advanced Materials Interfaces. 4(3). 15 indexed citations
6.
Pichon, Laurent, Régis Rogel, & Emmanuel Jacques. (2015). Electrical properties of phosphorus in situ doped Au-catalyst vapor liquid solid silicon nanowires. Journal of Applied Physics. 118(18). 4 indexed citations
7.
Rogel, Régis, et al.. (2014). Polycrystalline Silicon Nanowires Synthesis Compatible With CMOS Technology for Integrated Gas Sensing Applications. IEEE Transactions on Electron Devices. 61(2). 598–604. 5 indexed citations
8.
Anaya, J., A. Torres, V. Hortelano, et al.. (2013). Raman spectrum of Si nanowires: temperature and phonon confinement effects. Applied Physics A. 114(4). 1321–1331. 15 indexed citations
9.
Ni, Liang, et al.. (2012). VLS Silicon Nanowires based Resistors for Chemical Sensor Applications. Procedia Engineering. 47. 240–243. 11 indexed citations
10.
Yu, Linwei, Wanghua Chen, Benedict O’Donnell, et al.. (2011). Growth-in-place deployment of in-plane silicon nanowires. Applied Physics Letters. 99(20). 51 indexed citations
11.
Pichon, Laurent, et al.. (2010). Fabrication of amorphous silicon nanoribbons by atomic force microscope tip-induced local oxidation for thin film device applications. Semiconductor Science and Technology. 25(6). 65001–65001. 2 indexed citations
12.
Pichon, Laurent, et al.. (2009). Fabrication of polycrystalline silicon nanowires using conventional UV lithography. IOP Conference Series Materials Science and Engineering. 6. 12014–12014. 20 indexed citations
13.
Rogel, Régis, et al.. (2007). High polysilicon TFT field effect mobility reached thanks to slight phosphorus content in the active layer. Materials Science and Engineering C. 28(5-6). 1010–1013. 3 indexed citations
14.
Carvou, Erwann, et al.. (2004). Hall effect magnetic sensors based on polysilicon TFTs. IEEE Sensors Journal. 4(5). 597–602. 7 indexed citations
15.
Rogel, Régis, et al.. (2003). Influence of precursors gases on LPCVD TFT's characteristics. Thin Solid Films. 427(1-2). 108–112. 5 indexed citations
16.
17.
Gautier, Gaël, et al.. (2003). Towards Complementary Metal-Oxide-Silicon Thin-Film Devices with a New Structure. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 93. 429–434. 1 indexed citations
18.
Rogel, Régis, et al.. (2000). High quality unhydrogenated low-pressure chemical vapor deposited polycrystalline silicon. Journal of Non-Crystalline Solids. 266-269. 141–145. 6 indexed citations
19.
Haji, L., et al.. (2000). Crystallization of amorphous silicon–germanium films deposited by low pressure chemical vapor deposition. Journal of Non-Crystalline Solids. 266-269. 689–693. 2 indexed citations
20.
Raoult, F., et al.. (1997). Hot-Wire Hydrogen Passivation of Polycrystalline Silicon TFT's. MRS Proceedings. 471. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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