N. Baier
- Instrumentation top 10%
- Aerospace Engineering top 10%
- Infrared Target Detection Methodologies 20
- Calibration and Measurement Techniques 5
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- Advanced Semiconductor Detectors and Materials 33
- Chalcogenide Semiconductor Thin Films 12
- CCD and CMOS Imaging Sensors 3
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- Semiconductor Quantum Structures and Devices 4
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- Thermography and Photoacoustic Techniques 5
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- Advanced X-ray and CT Imaging 3
- Co-authors
- O. GravrandL. MollardG. DestéfanisLaurent RubaldoJ. RothmanJ. P. ZanattaA. KerlainO. Boulade
- Journals
- Journal of Electronic Materials (16 papers)Applied Physics Letters (1 paper)Acta Materialia (1 paper)
- Partner nations
- FranceUnited Kingdom
In The Last Decade
N. Baier
31 papers receiving 445 citations
Peers
Comparison fields: 5 of 28
- Instrumentation 32
- Aerospace Engineering 175
- Electrical and Electronic Engineering 400
- Atomic and Molecular Physics, and Optics 117
- Radiation 30
Countries citing papers authored by N. Baier
This map shows the geographic impact of N. Baier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Baier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Baier more than expected).
Fields of papers citing papers by N. Baier
This network shows the impact of papers produced by N. Baier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Baier. The network helps show where N. Baier may publish in the future.
Co-authorship network
The 25 scholars most cited alongside N. Baier, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 2 | |
| 2 | 2023 | 1 | |
| 3 | 2021 | 4 | |
| 4 | 2019 | 5 | |
| 5 | 2017 | 2 | |
| 6 | 2017 | 4 | |
| 7 | 2016 | 4 | |
| 8 | 2016 | 51 | |
| 9 | 2014 | 4 | |
| 10 | 2014 | 27 | |
| 11 | 2014 | 18 | |
| 12 | 2014 | 4 | |
| 13 | 2013 | 28 | |
| 14 | 2012 | 13 | |
| 15 | 2011 | 29 | |
| 16 | 2009 | 36 | |
| 17 | 2009 | 28 | |
| 18 | 2009 | 6 | |
| 19 | 2009 | 8 | |
| 20 | 2006 | 4 |
About N. Baier
N. Baier is a scholar working on Aerospace Engineering, Instrumentation and Electrical and Electronic Engineering, having authored 34 papers that have together received 470 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (33 papers), Infrared Target Detection Methodologies (20 papers), Chalcogenide Semiconductor Thin Films (12 papers), Thermography and Photoacoustic Techniques (5 papers), Calibration and Measurement Techniques (5 papers), Semiconductor Quantum Structures and Devices (4 papers), CCD and CMOS Imaging Sensors (3 papers) and Advanced X-ray and CT Imaging (3 papers). The work is most often cited by research in Instrumentation (32 citations), Aerospace Engineering (175 citations) and Electrical and Electronic Engineering (400 citations). N. Baier has collaborated with scholars based in France and United Kingdom. Frequent co-authors include O. Gravrand, L. Mollard, G. Destéfanis, Laurent Rubaldo, J. Rothman, J. P. Zanatta, A. Kerlain, O. Boulade, G. Bourgeois and C. Cervera. Their work appears in journals such as Journal of Electronic Materials, Applied Physics Letters, Acta Materialia, Physical Review B and Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.