J. Rothman
- Instrumentation top 2%
- Advanced Optical Sensing Technologies 42
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- Magnetic properties of thin films 21
- Semiconductor Quantum Structures and Devices 19
- Condensed Matter Physics top 5%
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- Magnetic Properties and Applications 14
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- Advanced Semiconductor Detectors and Materials 76
- Chalcogenide Semiconductor Thin Films 11
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- Infrared Target Detection Methodologies 31
- Calibration and Measurement Techniques 13
- Co-authors
- J. A. C. BlandMathias KläuiL. López-Dı́azC. A. F. VazZ. CuiO. GravrandAndrew BlelochL. Mollard
- Journals
- Journal of Electronic Materials (28 papers)Journal of Magnetism and Magnetic Materials (8 papers)Journal of Applied Physics (7 papers)
- Partner nations
- FranceUnited KingdomUnited States
In The Last Decade
J. Rothman
138 papers receiving 2.8k citations
Peers
Comparison fields: 5 of 73
- Instrumentation 506
- Atomic and Molecular Physics, and Optics 1.5k
- Condensed Matter Physics 441
- Electronic, Optical and Magnetic Materials 688
- Electrical and Electronic Engineering 1.5k
Countries citing papers authored by J. Rothman
This map shows the geographic impact of J. Rothman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Rothman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Rothman more than expected).
Fields of papers citing papers by J. Rothman
This network shows the impact of papers produced by J. Rothman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Rothman. The network helps show where J. Rothman may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. Rothman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2023 | 1 | |
| 3 | 2023 | 2 | |
| 4 | 2018 | 3 | |
| 5 | 2017 | 2 | |
| 6 | 2017 | 1 | |
| 7 | 2017 | 22 | |
| 8 | 2016 | 4 | |
| 9 | 2016 | 51 | |
| 10 | 2013 | 4 | |
| 11 | 2013 | 28 | |
| 12 | 2011 | 11 | |
| 13 | 2009 | 36 | |
| 14 | 2008 | 10 | |
| 15 | 2008 | 24 | |
| 16 | 2006 | 281 | |
| 17 | 2004 | 6 | |
| 18 | 2001 | 395 | |
| 19 | 1995 | 7 | |
| 20 | 1993 | 30 |
About J. Rothman
J. Rothman is a scholar working on Instrumentation, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Aerospace Engineering and Electronic, Optical and Magnetic Materials, having authored 142 papers that have together received 2.9k indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (76 papers), Advanced Optical Sensing Technologies (42 papers), Infrared Target Detection Methodologies (31 papers), Magnetic properties of thin films (21 papers), Semiconductor Quantum Structures and Devices (19 papers), Magnetic Properties and Applications (14 papers), Calibration and Measurement Techniques (13 papers) and Chalcogenide Semiconductor Thin Films (11 papers). The work is most often cited by research in Instrumentation (506 citations), Atomic and Molecular Physics, and Optics (1.5k citations), Condensed Matter Physics (441 citations), Electronic, Optical and Magnetic Materials (688 citations) and Electrical and Electronic Engineering (1.5k citations). J. Rothman has collaborated with scholars based in France, United Kingdom and United States. Frequent co-authors include J. A. C. Bland, Mathias Kläui, L. López-Dı́az, C. A. F. Vaz, Z. Cui, O. Gravrand, Andrew Bleloch, L. Mollard, Jean-Paul Chamonal and Gérard Destefanis. Their work appears in journals such as Journal of Electronic Materials, Journal of Magnetism and Magnetic Materials, Journal of Applied Physics, IEEE Transactions on Magnetics and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.