Eric de Borniol
- Instrumentation top 5%
- Advanced Optical Sensing Technologies 15
- Aerospace Engineering top 10%
- Infrared Target Detection Methodologies 24
- Calibration and Measurement Techniques 5
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- Advanced Semiconductor Detectors and Materials 30
- CCD and CMOS Imaging Sensors 15
- Chalcogenide Semiconductor Thin Films 4
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- Optical and Acousto-Optic Technologies 4
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- Spectroscopy and Laser Applications 3
Eric de Borniol
42 papers receiving 278 citations
Peers
Comparison fields: 5 of 39
- Instrumentation 99
- Aerospace Engineering 112
- Acoustics and Ultrasonics 4
- Electrical and Electronic Engineering 224
- Atomic and Molecular Physics, and Optics 76
Countries citing papers authored by Eric de Borniol
This map shows the geographic impact of Eric de Borniol's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric de Borniol with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric de Borniol more than expected).
Fields of papers citing papers by Eric de Borniol
This network shows the impact of papers produced by Eric de Borniol. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric de Borniol. The network helps show where Eric de Borniol may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Eric de Borniol, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 2 | |
| 2 | 2023 | 1 | |
| 3 | 2023 | 1 | |
| 4 | 2021 | 7 | |
| 5 | 2019 | 1 | |
| 6 | 2017 | 3 | |
| 7 | 2016 | 4 | |
| 8 | 2012 | 6 | |
| 9 | 2011 | 11 | |
| 10 | 2010 | 10 | |
| 11 | 2009 | 7 | |
| 12 | 2008 | 22 | |
| 13 | 2008 | 10 | |
| 14 | 2007 | 12 | |
| 15 | 2007 | 13 | |
| 16 | 2006 | 1 | |
| 17 | 2005 | 1 | |
| 18 | 2004 | 1 | |
| 19 | 2004 | 19 | |
| 20 | 2003 | 9 |
About Eric de Borniol
Eric de Borniol is a scholar working on Instrumentation, Aerospace Engineering, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Radiation, having authored 45 papers that have together received 288 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (30 papers), Infrared Target Detection Methodologies (24 papers), CCD and CMOS Imaging Sensors (15 papers), Advanced Optical Sensing Technologies (15 papers), Calibration and Measurement Techniques (5 papers), Chalcogenide Semiconductor Thin Films (4 papers), Optical and Acousto-Optic Technologies (4 papers) and Spectroscopy and Laser Applications (3 papers). The work is most often cited by research in Instrumentation (99 citations), Aerospace Engineering (112 citations), Acoustics and Ultrasonics (4 citations), Electrical and Electronic Engineering (224 citations) and Atomic and Molecular Physics, and Optics (76 citations). Eric de Borniol has collaborated with scholars based in France and Germany. Frequent co-authors include Pierre Castelein, J. Rothman, Gérard Destefanis, O. Gravrand, Jean-Paul Chamonal, L. Mollard, A. Million, G. Destéfanis, J. Deschamps and Nicolas Guérineau. Their work appears in journals such as Journal of Electronic Materials, IEEE Transactions on Nuclear Science, Optics Letters, Optical Engineering and SPIRE - Sciences Po Institutional REpository.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.