Mingfu Li

2.4k citations

161 papers · 1.9k indexed · h-index 22

Impact in

Electrical and Electronic Engineering top 2%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
Computer Networks and Communications top 5%

Papers in ⓘ

Electrical and Electronic Engineering 111
- Semiconductor materials and devices 70
- Advancements in Semiconductor Devices and Circuit Design 54
- Ferroelectric and Negative Capacitance Devices 24
- Integrated Circuits and Semiconductor Failure Analysis 18
- Advanced MIMO Systems Optimization 11
Atomic and Molecular Physics, and Optics 40
- Semiconductor materials and interfaces 21
- Semiconductor Quantum Structures and Devices 15

Co-authors: Hung‐Ju Lin (1 shared paper)Daming Huang (21 shared papers)H.Y. Yu (12 shared papers)G. F. Jiao (6 shared papers)Chunxiang Zhu (11 shared papers)Dim‐Lee Kwong (14 shared papers)Shi‐Jin Ding (6 shared papers)Wei Cao (2 shared papers)
Journals: IEEE Transactions on Electron Devices (16 papers)IEEE Electron Device Letters (11 papers)Applied Physics Letters (8 papers)Physical review. B, Condensed matter (6 papers)Solid-State Electronics (3 papers)
Partner nations: China Singapore Taiwan

In The Last Decade

Mingfu Li

150 papers receiving 1.8k citations

Peers

Countries citing papers authored by Mingfu Li

Since Specialization

Citations

This map shows the geographic impact of Mingfu Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mingfu Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mingfu Li more than expected).

Fields of papers citing papers by Mingfu Li

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mingfu Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mingfu Li. The network helps show where Mingfu Li may publish in the future.

Co-authors

The 25 scholars most cited alongside Mingfu Li, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Mingfu Li Line = papers co-authored together Mingfu Li links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 161 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Design and Implementation of Smart Home Control Systems Based on Wireless Sensor Networks and Power Line Communications IEEE Transactions on Industrial Electronics ·Mingfu Li, Hung‐Ju Lin	2014	215
2	Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure IEEE Transactions on Electron Devices ·Wei Cao, Chengjun Yao, G. F. Jiao, Daming Huang, H.Y. Yu, Mingfu Li	2011	118
3	RF, DC, and reliability characteristics of ALD HfO/sub 2/-Al/sub 2/O/sub 3/ laminate MIM capacitors for Si RF IC applications IEEE Transactions on Electron Devices ·Shi‐Jin Ding, Hang Hu, Chunxiang Zhu, Sun Jung Kim, Xiongfei Yu, Mingfu Li, Byung Jin Cho, D.S.H. Chan, Mingbin Yu, S.C. Rustagi, Albert Chin, Dim‐Lee Kwong	2004	68
4	Understand NBTI Mechanism by Developing Novel Measurement Techniques IEEE Transactions on Device and Materials Reliability ·Mingfu Li, Daming Huang, Chen Shen, Tianzhi Yang, W.J. Liu, Zhiying Liu	2008	60
5	Effect of Interface Traps and Oxide Charge on Drain Current Degradation in Tunneling Field-Effect Transistors IEEE Electron Device Letters ·X. Huang, G. F. Jiao, Wei Cao, Daming Huang, H.Y. Yu, Zhenhong Chen, Navab Singh, G. Q. Lo, Dim‐Lee Kwong, Mingfu Li	2010	58
6	Tuning effective metal gate work function by a novel gate dielectric HfLaO for nMOSFETs IEEE Electron Device Letters ·X.P. Wang, Mingfu Li, C. Ren, Yu Xi, Chen Shen, Huan Ma, Albert Chin, Chunxiang Zhu, Jiang Ning, Mingbin Yu, Dim-Lee Kwong	2005	55
7	New degradation mechanisms and reliability performance in tunneling field effect transistors G. F. Jiao, Zhixian Chen, H.Y. Yu, X. Huang, Daming Huang, Navab Singh, G. Q. Lo, Dim‐Lee Kwong, Mingfu Li	2009	53
8	Spatial Distribution of Charge Traps in a SONOS-Type Flash Memory Using a High- $k$ Trapping Layer IEEE Transactions on Electron Devices ·Gang Zhang, Xinpeng Wang, Won Jong Yoo, Mingfu Li	2007	46
9	On-The-Fly Interface Trap Measurement and Its Impact on the Understanding of NBTI Mechanism for p-MOSFETs with SiON Gate Dielectric National University of Singapore ·W.J. Liu, Z.Y. Liu, Darning Huang, Chi‐Hung Liao, L.F. Zhang, Zheng Gan, Waisum Wong, Chen Shen, Mingfu Li	2007	42
10	Atomic-layer-deposited Al2O3–HfO2–Al2O3 dielectrics for metal-insulator-metal capacitor applications Applied Physics Letters ·Shi‐Jin Ding, Chunxiang Zhu, Mingfu Li, David Wei Zhang	2005	41
11	n-MOSFET With Silicon Carbon Source/Drain for Enhancement of Carrier Transport IEEE Transactions on Electron Devices ·King-Jien Chui, Kah‐Wee Ang, Narayanan Balasubramanian, Mingfu Li, Ganesh S. Samudra, Yee‐Chia Yeo	2007	41
12	Multistacked Al2O3∕HfO2∕SiO2 tunnel layer for high-density nonvolatile memory application Applied Physics Letters ·Wei Chen, Wenjun Liu, Min Zhang, Shi‐Jin Ding, David Wei Zhang, Mingfu Li	2007	36
13	Investigation of hole-tunneling current through ultrathin oxynitride/oxide stack gate dielectrics in p-MOSFETs IEEE Transactions on Electron Devices ·H.Y. Yu, Yong-Tian Hou, Mingfu Li, Dim‐Lee Kwong	2002	35
14	Metal-insulator-metal RF bypass capacitor using niobium oxide (Nb/sub 2/O/sub 5/) with HfO/sub 2//Al/sub 2/O/sub 3/ barriers IEEE Electron Device Letters ·Sun-Jung Kim, Byung Jin Cho, Ming Yu, Mingfu Li, Yong‐Zhong Xiong, Chunxiang Zhu, Albert Chin, Dim-Lee Kwong	2005	30
15	The modified firefly algorithm considering fireflies’ visual range and its application in assembly sequences planning The International Journal of Advanced Manufacturing Technology ·Mingfu Li, Yuyan Zhang, Bing Zeng, Houming Zhou, Jingang Liu	2015	28
16	Spin-orbit splitting of GaAs and InSb bands near Γ Physical review. B, Condensed matter ·Michael P. Surh, Mingfu Li, Steven G. Louie	1991	26
17	Hot Stamping of Door Impact Beam Procedia Engineering ·Mingfu Li, Tzu-Shin Chiang, Jiun-Hau Tseng, Chia-Nung Tsai	2014	25
18	Thin body silicon-on-insulator N-MOSFET with silicon-carbon source/drain regions for performance enhancement Kah‐Wee Ang, King-Jien Chui, Vladimir Bliznetsov, Yihua Wang, Lai-Yin Wong, Chih-Hang Tung, N. Balasubramanian, Mingfu Li, Ganesh Samudra, Yee-Chia Yeo	2006	24
19	New techniques of capacitance-voltage measurements of semiconductor junctions Solid-State Electronics ·Mingfu Li, Chih‐Tang Sah	1982	24
20	A cost-effective and real-time QoE evaluation method for multimedia streaming services Telecommunication Systems ·Mingfu Li, Chen‐Yu Lee	2014	24

About Mingfu Li

Mingfu Li is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Computer Networks and Communications, Computer Vision and Pattern Recognition and Materials Chemistry, having authored 161 papers that have together received 1.9k indexed citations. Recurring topics across this work include Semiconductor materials and devices (70 papers), Advancements in Semiconductor Devices and Circuit Design (54 papers), Ferroelectric and Negative Capacitance Devices (24 papers), Semiconductor materials and interfaces (21 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Semiconductor Quantum Structures and Devices (15 papers), Advanced MIMO Systems Optimization (11 papers) and Image and Video Quality Assessment (11 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.5k citations), Computer Networks and Communications (263 citations), Atomic and Molecular Physics, and Optics (235 citations), Materials Chemistry (275 citations) and Computer Vision and Pattern Recognition (120 citations). Mingfu Li has collaborated with scholars based in China, Singapore and Taiwan. Frequent co-authors include Hung‐Ju Lin, Daming Huang, H.Y. Yu, G. F. Jiao, Chunxiang Zhu, Dim‐Lee Kwong, Shi‐Jin Ding, Wei Cao, Chih‐Tang Sah and Chengjun Yao. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Applied Physics Letters, Physical review. B, Condensed matter and Solid-State Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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