Michael Belyansky
Impact in
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- Semiconductor materials and devices
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- 3D IC and TSV technologies
Papers in ⓘ
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- Semiconductor materials and devices 14
- Advancements in Semiconductor Devices and Circuit Design 8
- Integrated Circuits and Semiconductor Failure Analysis 7
- 3D IC and TSV technologies 4
- Advancements in Photolithography Techniques 4
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- Advanced Surface Polishing Techniques 5
- Co-authors
- Michael Trenary (7 shared papers)C. Leland Ellison (1 shared paper)Oleg Gluschenkov (3 shared papers)Nelson Felix (3 shared papers)Alexander Gaskov (4 shared papers)Vinayan C. Menon (2 shared papers)Timothy A. Brunner (2 shared papers)N. Klymko (5 shared papers)
- Journals
- Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)Materials Science and Engineering B (3 papers)IEEE Electron Device Letters (1 paper)Chemistry of Materials (1 paper)The Journal of Chemical Physics (1 paper)
- Partner nations
- United StatesRussiaCanada
In The Last Decade
Michael Belyansky
29 papers receiving 245 citations
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 191
- Ceramics and Composites 19
- Materials Chemistry 101
- Surfaces, Coatings and Films 14
- Computational Mathematics 1
Countries citing papers authored by Michael Belyansky
This map shows the geographic impact of Michael Belyansky's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Belyansky with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Belyansky more than expected).
Fields of papers citing papers by Michael Belyansky
This network shows the impact of papers produced by Michael Belyansky. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Belyansky. The network helps show where Michael Belyansky may publish in the future.
Co-authors
The 25 scholars most cited alongside Michael Belyansky, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 36 | |
| 2 | 2008 | 26 | |
| 3 | 1994 | 25 | |
| 4 | 1999 | 17 | |
| 5 | 1996 | 16 | |
| 6 | 2014 | 15 | |
| 7 | 1997 | 15 | |
| 8 | 2010 | 13 | |
| 9 | 2022 | 12 | |
| 10 | 2016 | 12 | |
| 11 | Strain characterization: techniques and applications | 2009 | 11 |
| 12 | 1997 | 11 | |
| 13 | 2021 | 8 | |
| 14 | 2020 | 7 | |
| 15 | 1992 | 7 | |
| 16 | 1994 | 5 | |
| 17 | 1995 | 4 | |
| 18 | 2004 | 3 | |
| 19 | 2010 | 3 | |
| 20 | 2008 | 2 |
About Michael Belyansky
Michael Belyansky is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 29 papers that have together received 262 indexed citations. Recurring topics across this work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Advanced Surface Polishing Techniques (5 papers), 3D IC and TSV technologies (4 papers), Advancements in Photolithography Techniques (4 papers), Electron and X-Ray Spectroscopy Techniques (3 papers) and Metal and Thin Film Mechanics (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (191 citations), Ceramics and Composites (19 citations), Materials Chemistry (101 citations), Surfaces, Coatings and Films (14 citations) and Computational Mathematics (1 citation). Michael Belyansky has collaborated with scholars based in United States, Russia and Canada. Frequent co-authors include Michael Trenary, C. Leland Ellison, Oleg Gluschenkov, Nelson Felix, Alexander Gaskov, Vinayan C. Menon, Timothy A. Brunner, N. Klymko, Christopher P. Ausschnitt and Hugo Celio. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Materials Science and Engineering B, IEEE Electron Device Letters, Chemistry of Materials and The Journal of Chemical Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.