Michael Belyansky

891 total citations
29 papers, 262 citations indexed

About

Michael Belyansky is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Michael Belyansky has authored 29 papers receiving a total of 262 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 9 papers in Biomedical Engineering and 6 papers in Materials Chemistry. Recurrent topics in Michael Belyansky's work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Michael Belyansky is often cited by papers focused on Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Michael Belyansky collaborates with scholars based in United States, Russia and France. Michael Belyansky's co-authors include Michael Trenary, C. Leland Ellison, Oleg Gluschenkov, Nelson Felix, Alexander Gaskov, N. Klymko, Vinayan C. Menon, Timothy A. Brunner, Christopher P. Ausschnitt and Hugo Celio and has published in prestigious journals such as The Journal of Chemical Physics, Chemistry of Materials and The Journal of Physical Chemistry B.

In The Last Decade

Michael Belyansky

29 papers receiving 245 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Michael Belyansky United States 12 191 101 52 36 35 29 262
Xianglong Yang China 12 224 1.2× 98 1.0× 65 1.3× 19 0.5× 50 1.4× 42 325
Pascal Dubreuil France 10 162 0.8× 32 0.3× 66 1.3× 15 0.4× 28 0.8× 39 245
L. M. Landsberger Canada 9 271 1.4× 109 1.1× 140 2.7× 10 0.3× 24 0.7× 38 324
Chuck Hsu Taiwan 13 306 1.6× 228 2.3× 63 1.2× 14 0.4× 39 1.1× 23 390
Bernd Hähnlein Germany 10 127 0.7× 188 1.9× 130 2.5× 35 1.0× 37 1.1× 37 336
Martin Rejhon Czechia 11 173 0.9× 187 1.9× 90 1.7× 34 0.9× 27 0.8× 29 332
Tomoyuki Suwa Japan 12 434 2.3× 97 1.0× 56 1.1× 10 0.3× 9 0.3× 86 488
Yasushi Hiroshima Japan 13 302 1.6× 209 2.1× 95 1.8× 39 1.1× 10 0.3× 39 396
Jeff Gambino United States 10 310 1.6× 62 0.6× 48 0.9× 27 0.8× 23 0.7× 59 344
Takayuki Miyazaki Japan 13 245 1.3× 187 1.9× 82 1.6× 36 1.0× 15 0.4× 37 384

Countries citing papers authored by Michael Belyansky

Since Specialization
Citations

This map shows the geographic impact of Michael Belyansky's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Belyansky with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Belyansky more than expected).

Fields of papers citing papers by Michael Belyansky

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael Belyansky. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Belyansky. The network helps show where Michael Belyansky may publish in the future.

Co-authorship network of co-authors of Michael Belyansky

This figure shows the co-authorship network connecting the top 25 collaborators of Michael Belyansky. A scholar is included among the top collaborators of Michael Belyansky based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael Belyansky. Michael Belyansky is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Sakuma, Katsuyuki, et al.. (2024). D2W and W2W Hybrid Bonding System with Below 2.5 Micron Pitch for 3D Chiplet AI Applications. 1–4. 1 indexed citations
3.
Belyansky, Michael, et al.. (2023). Overlay performance in permanent bonded wafer integration schemes. 40–40. 2 indexed citations
4.
Sakuma, Katsuyuki, Michael Belyansky, Spyridon Skordas, et al.. (2022). Surface Energy Characterization for Die-Level Cu Hybrid Bonding. 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC). 312–316. 12 indexed citations
5.
Shen, Tian, Kôji Watanabe, Huimei Zhou, et al.. (2020). A new technique for evaluating stacked nanosheet inner spacer TDDB reliability. 1–5. 7 indexed citations
6.
Silva, Anuja De, Indira Seshadri, Abraham Arceo, et al.. (2016). Study of alternate hardmasks for extreme ultraviolet patterning. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 34(6). 12 indexed citations
7.
Brunner, Timothy A., Vinayan C. Menon, Nelson Felix, et al.. (2014). Characterization and mitigation of overlay error on silicon wafers with nonuniform stress. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9052. 90520U–90520U. 15 indexed citations
8.
Brunner, Timothy A., Vinayan C. Menon, Oleg Gluschenkov, et al.. (2013). Characterization of wafer geometry and overlay error on silicon wafers with nonuniform stress. Journal of Micro/Nanolithography MEMS and MOEMS. 12(4). 43002–43002. 36 indexed citations
9.
Cai, Ming, et al.. (2010). Stress Liner Effects for 32-nm SOI MOSFETs With HKMG. IEEE Transactions on Electron Devices. 57(7). 1706–1709. 13 indexed citations
10.
Belyansky, Michael, et al.. (2009). Strain characterization: techniques and applications. Solid State Technology. 52(2). 26–29. 11 indexed citations
11.
Yuan, Jun, V. Chan, N. Rovedo, et al.. (2009). Blanket SMT With In Situ N2 Plasma Treatment on the $\langle \hbox{100} \rangle$ Wafer for the Low-Cost Low-Power Technology Application. IEEE Electron Device Letters. 30(9). 916–918. 1 indexed citations
12.
Belyansky, Michael, M. A. Chace, Oleg Gluschenkov, et al.. (2008). Methods of producing plasma enhanced chemical vapor deposition silicon nitride thin films with high compressive and tensile stress. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 26(3). 517–521. 26 indexed citations
13.
Cai, Ming, B. Greene, J. Strane, et al.. (2008). Extending dual stress liner process to high performance 32nm node SOI CMOS manufacturing. 17–18. 2 indexed citations
14.
Divakaruni, R., C. Radens, Michael Belyansky, et al.. (2004). Technologies for scaling vertical transistor DRAM cells to 70 nm. 59–60. 3 indexed citations
15.
Belyansky, Michael & Michael Trenary. (1999). Comparison of the surface chemical reactivity of hafnium diboride and hafnium. Inorganica Chimica Acta. 289(1-2). 191–197. 17 indexed citations
16.
Belyansky, Michael & Michael Trenary. (1997). Reflection adsorption infrared spectroscopy of the oxidation of thin films of boron and hafnium diboride grown on Hf(0001). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 15(6). 3065–3068. 11 indexed citations
17.
Jentz, David, et al.. (1996). Formation of hydrogen bonded aggregates of aminomethylidyne on Pt(111). The Journal of Chemical Physics. 105(8). 3250–3257. 16 indexed citations
18.
Belyansky, Michael, Michael Trenary, Shigeki Otani, & T. Tanaka. (1996). Comparison of the Hafnium Diboride(0001) and Hafnium(0001) Surfaces. MRS Proceedings. 441. 2 indexed citations
19.
Belyansky, Michael, et al.. (1994). Influence of the boundary on the interdiffusion in heterostructures. Materials Science and Engineering B. 26(2-3). 147–149. 1 indexed citations
20.
Belyansky, Michael, Michael Trenary, & C. Leland Ellison. (1994). Boron Chemical Shifts in B6O. Surface Science Spectra. 3(2). 147–150. 25 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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