Kenji Okada
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials
- Biomedical Engineering
- Co-authors
- Kenji TaniguchiHiroyuki OtaAkira ToriumiToshihide NabatameK. YonedaM. NiwaNaoya YoshiokaMasayuki Kamei
- Topics
- Semiconductor materials and devices (40 papers)Advancements in Semiconductor Devices and Circuit Design (29 papers)Integrated Circuits and Semiconductor Failure Analysis (16 papers)
- Partner nations
- JapanUnited StatesNetherlands
In The Last Decade
Kenji Okada
58 papers receiving 548 citations
Peers
Comparison fields: 5 of 46
- Electrical and Electronic Engineering 505
- Materials Chemistry 107
- Electronic, Optical and Magnetic Materials 39
- Mechanics of Materials 37
- Biomedical Engineering 37
Countries citing papers authored by Kenji Okada
This map shows the geographic impact of Kenji Okada's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kenji Okada with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kenji Okada more than expected).
Fields of papers citing papers by Kenji Okada
This network shows the impact of papers produced by Kenji Okada. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kenji Okada. The network helps show where Kenji Okada may publish in the future.
Co-authorship network of co-authors of Kenji Okada
This figure shows the co-authorship network connecting the top 25 collaborators of Kenji Okada. A scholar is included among the top collaborators of Kenji Okada based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kenji Okada. Kenji Okada is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 18 | |
| 3 | 5 | |
| 4 | 2 | |
| 5 | Historical Background, Attainment and Future Prospects of JSMS Databases on Fatigue Strength of Metallic Materials:III : Establishment and Diffusion of JSMS Standard Regression Method of S-N Curves | 4 |
| 6 | 6 | |
| 7 | 17 | |
| 8 | 5 | |
| 9 | 5 | |
| 10 | 4 | |
| 11 | 4 | |
| 12 | 3 | |
| 13 | 1 | |
| 14 | 23 | |
| 15 | 18 | |
| 16 | 3 | |
| 17 | 38 | |
| 18 | 25 | |
| 19 | 1 | |
| 20 | Statistical Aspect of Fatigue Crack Propagation from Micro Surface Defects | 1 |
About Kenji Okada
Kenji Okada is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Electronic, Optical and Magnetic Materials, having authored 66 papers that have together received 593 indexed citations. Recurring topics across this work include Semiconductor materials and devices (40 papers), Advancements in Semiconductor Devices and Circuit Design (29 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). The work is most often cited by research in Electrical and Electronic Engineering (505 citations), Surfaces, Coatings and Films (21 citations) and Materials Chemistry (107 citations). Kenji Okada has collaborated with scholars based in Japan, United States and Netherlands. Frequent co-authors include Kenji Taniguchi, Hiroyuki Ota, Akira Toriumi, Toshihide Nabatame, K. Yoneda, M. Niwa, Naoya Yoshioka, Masayuki Kamei, Koji Eriguchi and Takashi Kouzaki. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.