Kenji Okada

815 total citations
66 papers, 593 citations indexed

About

Kenji Okada is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Mechanical Engineering. According to data from OpenAlex, Kenji Okada has authored 66 papers receiving a total of 593 indexed citations (citations by other indexed papers that have themselves been cited), including 44 papers in Electrical and Electronic Engineering, 13 papers in Mechanics of Materials and 7 papers in Mechanical Engineering. Recurrent topics in Kenji Okada's work include Semiconductor materials and devices (40 papers), Advancements in Semiconductor Devices and Circuit Design (29 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). Kenji Okada is often cited by papers focused on Semiconductor materials and devices (40 papers), Advancements in Semiconductor Devices and Circuit Design (29 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). Kenji Okada collaborates with scholars based in Japan, United States and Netherlands. Kenji Okada's co-authors include Kenji Taniguchi, Hiroyuki Ota, Toshihide Nabatame, Akira Toriumi, K. Yoneda, M. Niwa, Naoya Yoshioka, Masayuki Kamei, Koji Eriguchi and Takashi Kouzaki and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

Kenji Okada

58 papers receiving 548 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Kenji Okada Japan 14 505 107 39 37 37 66 593
Takashi Imaoka Japan 8 367 0.7× 153 1.4× 29 0.7× 16 0.4× 109 2.9× 16 462
Jun‐Mo Yang South Korea 9 258 0.5× 129 1.2× 61 1.6× 21 0.6× 42 1.1× 54 348
Per Ericsson Sweden 15 347 0.7× 143 1.3× 34 0.9× 12 0.3× 86 2.3× 37 468
Ken McCarley United States 8 183 0.4× 204 1.9× 19 0.5× 16 0.4× 63 1.7× 14 350
Tom Blomberg Germany 12 249 0.5× 212 2.0× 55 1.4× 39 1.1× 92 2.5× 30 377
R. Wächter Germany 9 241 0.5× 259 2.4× 8 0.2× 66 1.8× 18 0.5× 11 362
Karine Kenis Belgium 10 244 0.5× 82 0.8× 6 0.2× 26 0.7× 107 2.9× 50 363
Toshio Sasaki Japan 11 134 0.3× 117 1.1× 72 1.8× 16 0.4× 108 2.9× 26 337
Satomi Hamada Japan 11 178 0.4× 171 1.6× 45 1.2× 42 1.1× 319 8.6× 54 401

Countries citing papers authored by Kenji Okada

Since Specialization
Citations

This map shows the geographic impact of Kenji Okada's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kenji Okada with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kenji Okada more than expected).

Fields of papers citing papers by Kenji Okada

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kenji Okada. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kenji Okada. The network helps show where Kenji Okada may publish in the future.

Co-authorship network of co-authors of Kenji Okada

This figure shows the co-authorship network connecting the top 25 collaborators of Kenji Okada. A scholar is included among the top collaborators of Kenji Okada based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kenji Okada. Kenji Okada is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Okada, Kenji, et al.. (2016). Anomalous TDDB Statistics of Gate Dielectrics Caused by Charging-Induced Dynamic Stress Relaxation Under Constant–Voltage Stress. IEEE Transactions on Electron Devices. 63(6). 2268–2274. 18 indexed citations
3.
Okada, Kenji, et al.. (2015). Intrinsic mechanism of non-linearity in Weibull TDDB lifetime and its impact on lifetime prediction. 47. 2A.4.1–2A.4.5. 5 indexed citations
4.
Okada, Kenji, et al.. (2014). A Study on Estimation of <i>S</i>-<i>N</i> Curves for Structural Steels Based on their Static Mechanical Properties. Advanced materials research. 891-892. 1639–1644. 2 indexed citations
5.
Sakai, Tatsuo, et al.. (2012). Historical Background, Attainment and Future Prospects of JSMS Databases on Fatigue Strength of Metallic Materials:III : Establishment and Diffusion of JSMS Standard Regression Method of S-N Curves. 61(5). 475–480. 4 indexed citations
6.
Okada, Kenji, et al.. (2012). Analytical Results of Fatigue Reliability for Structural Steels Based on “Database on Fatigue Strength of Metallic Materials”. Journal of the Society of Materials Science Japan. 61(2). 98–105. 6 indexed citations
7.
Minami, Tadatsugu, et al.. (2009). Transparent conducting impurity-doped ZnO thin films prepared using oxide targets sintered by millimeter-wave heating. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 27(4). 1006–1011. 7 indexed citations
8.
Sakai, Tatsuo, Masaki Nakajima, Kazuaki SHIOZAWA, et al.. (2006). Development of Multi-type Fatigue Testing Machine in Axial Loading and Verification of Its Fundamental Performance. TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A. 72(718). 886–894. 5 indexed citations
9.
Okada, Kenji, Wataru Mizubayashi, Naoki Yasuda, et al.. (2005). Degradation mechanism of HfAlOX∕SiO2 stacked gate dielectrics studied by transient and steady-state leakage current analysis. Journal of Applied Physics. 97(7). 4 indexed citations
10.
11.
Okada, Kenji, et al.. (2001). Statistical Fatigue Properties of Nonferrous Metals Based on the Statistical Aspect of Crack Initiation and Propagation Behaviors.. Journal of the Society of Materials Science Japan. 50(1). 19–25. 1 indexed citations
12.
Okada, Kenji. (2000). Analysis of the relationship between defect site generation and dielectric breakdown utilizing A-mode stress induced leakage current. IEEE Transactions on Electron Devices. 47(6). 1225–1230. 23 indexed citations
13.
14.
Uno, Shigeyasu, et al.. (1999). A Study of Trap Profiles in Thin Silicon Dioxide Films at Dielectric Breakdown Using Percolation Model. MRS Proceedings. 592. 1 indexed citations
15.
Okada, Kenji, et al.. (1998). Statistical Analysis of Fatigue Properties of High Strength Steels Based on MSDRD.. TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A. 64(618). 249–256. 3 indexed citations
16.
Niwa, M., Kenji Okada, & Robert Sinclair. (1996). Atomically flat, ultrathin-SiO2/Si(001)interface formation by UHV heating. Applied Surface Science. 100-101. 425–430. 8 indexed citations
17.
18.
Okada, Kenji, et al.. (1990). Analysis of particle trajectories of small particles in flotation when the particles and bubbles are both charged. The Canadian Journal of Chemical Engineering. 68(4). 614–621. 25 indexed citations
19.
Okada, Kenji, et al.. (1982). Rheological Behavior of Kaolin and Calcium Carbonate Slurries, from a Small Distortion to Rupture. Nihon Reoroji Gakkaishi. 10(4). 165–168. 1 indexed citations
20.
TANAKA, Tsuneshichi, Tatsuo Sakai, & Kenji Okada. (1981). Statistical Aspect of Fatigue Crack Propagation from Micro Surface Defects. Journal of the Society of Materials Science Japan. 30(332). 172. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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