Hideki Satake

1.6k total citations
92 papers, 1.2k citations indexed

About

Hideki Satake is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Hideki Satake has authored 92 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 83 papers in Electrical and Electronic Engineering, 25 papers in Materials Chemistry and 11 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Hideki Satake's work include Semiconductor materials and devices (79 papers), Advancements in Semiconductor Devices and Circuit Design (50 papers) and Integrated Circuits and Semiconductor Failure Analysis (24 papers). Hideki Satake is often cited by papers focused on Semiconductor materials and devices (79 papers), Advancements in Semiconductor Devices and Circuit Design (50 papers) and Integrated Circuits and Semiconductor Failure Analysis (24 papers). Hideki Satake collaborates with scholars based in Japan. Hideki Satake's co-authors include Akira Toriumi, Yuichiro Mitani, Shinichi Takagi, Noburu Fukushima, Naoki Yasuda, Takeshi Yamaguchi, Tomohisa Mizuno, Naoharu Sugiyama, A. Kurobe and M. Nagamine and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Hideki Satake

89 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Hideki Satake Japan 20 1.1k 288 131 91 78 92 1.2k
Jinhyung Lee South Korea 15 547 0.5× 196 0.7× 99 0.8× 48 0.5× 138 1.8× 41 686
S. Matsui Japan 13 359 0.3× 221 0.8× 112 0.9× 36 0.4× 160 2.1× 29 644
Santosh Kurinec United States 17 607 0.5× 372 1.3× 184 1.4× 101 1.1× 186 2.4× 82 824
Chun‐An Lu Taiwan 13 358 0.3× 209 0.7× 70 0.5× 78 0.9× 80 1.0× 33 480
Wenting Hou United States 13 322 0.3× 207 0.7× 100 0.8× 129 1.4× 82 1.1× 31 609
Jean-Charles Souriau France 13 424 0.4× 236 0.8× 114 0.9× 17 0.2× 76 1.0× 49 509
Fumiaki Yamada Japan 15 346 0.3× 90 0.3× 134 1.0× 67 0.7× 83 1.1× 68 600
Michel Depas Belgium 13 1.6k 1.4× 399 1.4× 261 2.0× 128 1.4× 88 1.1× 27 1.6k
Hiroshi Nakao Japan 12 288 0.3× 185 0.6× 167 1.3× 116 1.3× 86 1.1× 47 465
Joo Tae Moon South Korea 15 683 0.6× 371 1.3× 71 0.5× 125 1.4× 82 1.1× 61 806

Countries citing papers authored by Hideki Satake

Since Specialization
Citations

This map shows the geographic impact of Hideki Satake's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hideki Satake with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hideki Satake more than expected).

Fields of papers citing papers by Hideki Satake

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hideki Satake. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hideki Satake. The network helps show where Hideki Satake may publish in the future.

Co-authorship network of co-authors of Hideki Satake

This figure shows the co-authorship network connecting the top 25 collaborators of Hideki Satake. A scholar is included among the top collaborators of Hideki Satake based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hideki Satake. Hideki Satake is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Satake, Hideki, et al.. (2010). Rapid analysis of polybrominated diphenyl ethers by ion attachment mass spectrometry. Analytical Methods. 2(6). 701–701. 9 indexed citations
2.
Mitani, Yuichiro, Hideki Satake, & Akira Toriumi. (2008). Influence of Nitrogen on Negative Bias Temperature Instability in Ultrathin SiON. IEEE Transactions on Device and Materials Reliability. 8(1). 6–13. 42 indexed citations
3.
Mitani, Yuichiro & Hideki Satake. (2008). Reconsideration of Hydrogen Release at Ultra Thin Gate Oxide Interface. Japanese Journal of Applied Physics. 47(3R). 1456–1456. 3 indexed citations
4.
Nabatame, Toshihide, Kouji Segawa, Masaru Kadoshima, et al.. (2006). The effect of oxygen in Ru gate electrode on effective work function of Ru/HfO2 stack structure. Materials Science in Semiconductor Processing. 9(6). 975–979. 15 indexed citations
5.
Watanabe, Yasushi, et al.. (2006). Self-organized (111) faceted NiSi2source and drain for advanced SOI MOSFETs. 32. 170–175. 2 indexed citations
6.
7.
Okada, Kenji, Wataru Mizubayashi, Naoki Yasuda, et al.. (2005). Degradation mechanism of HfAlOX∕SiO2 stacked gate dielectrics studied by transient and steady-state leakage current analysis. Journal of Applied Physics. 97(7). 4 indexed citations
8.
Mitani, Yuichiro & Hideki Satake. (2005). Influence of direct-tunneling gate current on negative bias temperature instability in ultra-thin gate oxides. 143–146. 1 indexed citations
9.
Yamaguchi, Takeshi, et al.. (2004). Defect generation and dielectric breakdown mechanism of HfSiO(N). 104(135). 71–76. 1 indexed citations
10.
Mitani, Yuichiro, M. Nagamine, Hideki Satake, & Akira Toriumi. (2003). NBTI mechanism in ultra-thin gate dielectric - nitrogen-originated mechanism in SiON. 509–512. 71 indexed citations
11.
Yagi, M., et al.. (2002). Magnetic Properties of Fe-Based Amorphous Powder Cores Produced by the Cold-Pressing Method.. Journal of the Magnetics Society of Japan. 26(4). 513–517. 10 indexed citations
12.
Nagamine, M., H. Itoh, Hideki Satake, & Akira Toriumi. (2002). Radical oxygen (O/sup */) process for highly-reliable SiO/sub 2/ with higher film-density and smoother SiO/sub 2//Si interface. 593–596. 8 indexed citations
13.
Toriumi, Akira, J. Koga, Hideki Satake, & Akiko Ohata. (2002). Performance and reliability concerns of ultra-thin SOI and ultra-thin gate oxide MOSFETs. 847–850. 16 indexed citations
14.
Yasuda, Naoki, et al.. (2002). Applicability limits of the two-frequency capacitance measurement technique for the thickness extraction of ultrathin gate oxide. IEEE Transactions on Semiconductor Manufacturing. 15(2). 209–213. 46 indexed citations
17.
Mizuno, Tomohisa, Shinichi Takagi, Naoharu Sugiyama, et al.. (2000). Electron and hole mobility enhancement in strained-Si MOSFET's on SiGe-on-insulator substrates fabricated by SIMOX technology. IEEE Electron Device Letters. 21(5). 230–232. 165 indexed citations
19.
Satake, Hideki & Akira Toriumi. (1999). Dielectric breakdown mechanism of thin-SiO/sub 2/ studied by the post-breakdown resistance statistics. 61–62. 5 indexed citations
20.
Shigyo, N., et al.. (1992). An Improved Bandgap Narrowing Model Based on Corrected Intrinsic Carrier Concentration. Transactions of the Institute of Electronics, Information and Communication Engineers. 75(2). 156–160. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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