Chihiro Hamaguchi
About
In The Last Decade
Chihiro Hamaguchi
279 papers receiving 3.2k citations
Peers
Comparison fields: 5 of 70
- Electrical and Electronic Engineering 2.2k
- Atomic and Molecular Physics, and Optics 2.1k
- Materials Chemistry 829
- Condensed Matter Physics 306
- Biomedical Engineering 265
Countries citing papers authored by Chihiro Hamaguchi
This map shows the geographic impact of Chihiro Hamaguchi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chihiro Hamaguchi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chihiro Hamaguchi more than expected).
Fields of papers citing papers by Chihiro Hamaguchi
This network shows the impact of papers produced by Chihiro Hamaguchi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chihiro Hamaguchi. The network helps show where Chihiro Hamaguchi may publish in the future.
Co-authorship network of co-authors of Chihiro Hamaguchi
This figure shows the co-authorship network connecting the top 25 collaborators of Chihiro Hamaguchi. A scholar is included among the top collaborators of Chihiro Hamaguchi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Chihiro Hamaguchi. Chihiro Hamaguchi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 13 | |
| 3 | Raman Spectra of CuInSe2 Thin Films Prepared by Chemical Spray Pyrolysis. | 5 |
| 4 | 1 | |
| 5 | Nonlocal Impact Ionization Model and Its Application to Substrate Current Simulation of n-MOSFET's | 2 |
| 6 | Thickness Dependence of Furnace N 2 O-Oxynitridation Effects on Breakdown of Thermal Oxides | 2 |
| 7 | Degradation mechanisms of thin film SIMOX SOI-MOSFET characteristics - optical and electrical evaluation - | 6 |
| 8 | Degradation Mechanisms of Thin Film SIMOX SOI-MOSFET Characteristics : Optical and Electrical Evaluation (Special Issue on Quarter Micron Si Device and Process Technologies) | 2 |
| 9 | 1 | |
| 10 | 10 | |
| 11 | 25 | |
| 12 | 22 | |
| 13 | 39 | |
| 14 | 11 | |
| 15 | 9 | |
| 16 | 1 | |
| 17 | 5 | |
| 18 | 3 | |
| 19 | 14 | |
| 20 | 3 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.