J.P. Teixeira
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
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- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- VLSI and FPGA Design Techniques
Papers in
-
- VLSI and Analog Circuit Testing 68
-
- Integrated Circuits and Semiconductor Failure Analysis 57
- Radiation Effects in Electronics 35
- Low-power high-performance VLSI design 24
- Advancements in Semiconductor Devices and Circuit Design 23
- VLSI and FPGA Design Techniques 20
- Semiconductor materials and devices 20
- Co-authors
- I.C. TeixeiraMarcelino SantosF.M. GonçalvesJ. SemiãoVictor ChampacFabian VargasJosé T. de SousaJuan J. Rodríguez-Andina
In The Last Decade
J.P. Teixeira
109 papers receiving 832 citations
Peers
Comparison fields: 5 of 38
- Hardware and Architecture 564
- Electrical and Electronic Engineering 733
- Software 45
- Radiation 39
- Nuclear and High Energy Physics 42
Countries citing papers authored by J.P. Teixeira
This map shows the geographic impact of J.P. Teixeira's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.P. Teixeira with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.P. Teixeira more than expected).
Fields of papers citing papers by J.P. Teixeira
This network shows the impact of papers produced by J.P. Teixeira. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.P. Teixeira. The network helps show where J.P. Teixeira may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J.P. Teixeira, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 3 | |
| 2 | 2016 | 5 | |
| 3 | 2016 | 3 | |
| 4 | IP core to leverage RTOS-based embedded systems reliability to Electromagnetic Interference | 2011 | 1 |
| 5 | 2010 | 20 | |
| 6 | 2008 | 3 | |
| 7 | 2006 | 3 | |
| 8 | 2004 | 6 | |
| 9 | 2004 | 3 | |
| 10 | 2003 | 5 | |
| 11 | 2002 | 3 | |
| 12 | 1999 | 5 | |
| 13 | 1998 | 2 | |
| 14 | 1996 | 3 | |
| 15 | 1996 | 35 | |
| 16 | 1995 | 47 | |
| 17 | 1991 | 2 | |
| 18 | 1990 | 2 | |
| 19 | On the Physical Design of Testable CMOS Digital Circuits | 1990 | 0 |
| 20 | A logical timing simulator for CMOS circuits based on an accurate formulation of the propagation delay | 1989 | 1 |
About J.P. Teixeira
J.P. Teixeira is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Radiation, Software and Nuclear and High Energy Physics, having authored 117 papers that have together received 863 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (68 papers), Integrated Circuits and Semiconductor Failure Analysis (57 papers), Radiation Effects in Electronics (35 papers), Low-power high-performance VLSI design (24 papers), Advancements in Semiconductor Devices and Circuit Design (23 papers), VLSI and FPGA Design Techniques (20 papers), Semiconductor materials and devices (20 papers) and Radiation Detection and Scintillator Technologies (10 papers). The work is most often cited by research in Hardware and Architecture (564 citations), Electrical and Electronic Engineering (733 citations), Software (45 citations), Radiation (39 citations) and Nuclear and High Energy Physics (42 citations). J.P. Teixeira has collaborated with scholars based in Portugal, Brazil and Spain. Frequent co-authors include I.C. Teixeira, Marcelino Santos, F.M. Gonçalves, J. Semião, Victor Champac, Fabian Vargas, José T. de Sousa, Juan J. Rodríguez-Andina, C. Leong and Roberto dos Reis. Their work appears in journals such as IEEE Transactions on Nuclear Science, Fusion Engineering and Design, Journal of Electronic Testing, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Nanotechnology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.