John P. Reifenberg

2.5k total citations · 1 hit paper
22 papers, 2.0k citations indexed

About

John P. Reifenberg is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Polymers and Plastics. According to data from OpenAlex, John P. Reifenberg has authored 22 papers receiving a total of 2.0k indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Materials Chemistry, 14 papers in Electrical and Electronic Engineering and 9 papers in Polymers and Plastics. Recurrent topics in John P. Reifenberg's work include Phase-change materials and chalcogenides (20 papers), Chalcogenide Semiconductor Thin Films (9 papers) and Transition Metal Oxide Nanomaterials (9 papers). John P. Reifenberg is often cited by papers focused on Phase-change materials and chalcogenides (20 papers), Chalcogenide Semiconductor Thin Films (9 papers) and Transition Metal Oxide Nanomaterials (9 papers). John P. Reifenberg collaborates with scholars based in United States and Belgium. John P. Reifenberg's co-authors include Kenneth E. Goodson, H.‐S. Philip Wong, Mehdi Asheghi, Sang‐Bum Kim, Jiale Liang, Bipin Rajendran, Simone Raoux, D.L. Kencke, Matthew A. Panzer and Eric Pop and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Proceedings of the IEEE.

In The Last Decade

John P. Reifenberg

21 papers receiving 1.9k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Phase Change Memory

2010 1.4k citations H.‐S. Philip Wong, Simone Raoux et al. Proceedings of the IEEE profile →

Peers

Countries citing papers authored by John P. Reifenberg

Since Specialization

Citations

This map shows the geographic impact of John P. Reifenberg's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John P. Reifenberg with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John P. Reifenberg more than expected).

Fields of papers citing papers by John P. Reifenberg

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John P. Reifenberg. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John P. Reifenberg. The network helps show where John P. Reifenberg may publish in the future.

Co-authorship network of co-authors of John P. Reifenberg

This figure shows the co-authorship network connecting the top 25 collaborators of John P. Reifenberg. A scholar is included among the top collaborators of John P. Reifenberg based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John P. Reifenberg. John P. Reifenberg is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	THERMAL TRANSPORT IN PHASE CHANGE MEMORY MATERIALS 2013 ·Annual Reviews of Heat Transfer ·Elah Bozorg-Grayeli, John P. Reifenberg, Mehdi Asheghi, H.‐S. Philip Wong, Kenneth E. Goodson	18
2	Thermal conductivity anisotropy and grain structure in Ge2Sb2Te5 films 2011 ·Journal of Applied Physics ·Jaeho Lee, Zijian Li, John P. Reifenberg, Sang‐Chul Lee, Robert Sinclair, Mehdi Asheghi, Kenneth E. Goodson	69
3	Grain Boundaries, Phase Impurities, and Anisotropic Thermal Conduction in Phase-Change Memory 2011 ·IEEE Electron Device Letters ·Zijian Li, Jaeho Lee, John P. Reifenberg, Mehdi Asheghi, Rakesh Jeyasingh, H.‐S. Philip Wong, Kenneth E. Goodson	14
4	Temperature-Dependent Thermal Properties of Phase-Change Memory Electrode Materials 2011 ·IEEE Electron Device Letters ·Elah Bozorg-Grayeli, John P. Reifenberg, Matthew A. Panzer, Jeremy Rowlette, Kenneth E. Goodson	19
5	Resistance and Threshold Switching Voltage Drift Behavior in Phase-Change Memory and Their Temperature Dependence at Microsecond Time Scales Studied Using a Micro-Thermal Stage 2011 ·IEEE Transactions on Electron Devices ·Sang‐Bum Kim, Byoungil Lee, Mehdi Asheghi, (unknown), John P. Reifenberg, Kenneth E. Goodson, H.‐S. Philip Wong	57
6	High Temperature Thermal Characterization of Ge2Sb2Te5 for Phase Change Memory 2011 ·ASME/JSME 2011 8th Thermal Engineering Joint Conference ·Jaeho Lee, John P. Reifenberg, Mehdi Asheghi, Kenneth E. Goodson	0
7	Phase Change Memory breakdown → 2010 ·Proceedings of the IEEE ·H.‐S. Philip Wong, Simone Raoux, Sang‐Bum Kim, Jiale Liang, John P. Reifenberg, Bipin Rajendran, Mehdi Asheghi, Kenneth E. Goodson	1402
8	In-Plane Thermal Conduction and Conductivity Anisotropy in Ge2Sb2Te5 Films for Phase Change Memory 2010 ·Zijian Li, Jaeho Lee, John P. Reifenberg, Mehdi Asheghi, H.‐S. Philip Wong, Kenneth E. Goodson	1
9	Phase Change Memory A comprehensive and thorough review of PCM technologies, including a discussion of material and device issues, is provided in this paper. 2010 ·Hoilun Wong, Simone Raoux, Sang‐Bum Kim, Jiale Liang, John P. Reifenberg, Bipin Rajendran, Mehdi Asheghi, Kenneth E. Goodson	1
10	Thermal phenomena in phase change memory 2010 ·John P. Reifenberg	4
11	Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage 2010 ·Sang‐Bum Kim, Byoungil Lee, Mehdi Asheghi, G.A.M. Hurkx, John P. Reifenberg, Kenneth E. Goodson, H.‐S. Philip Wong	27
12	Thermal conductivity and boundary resistance measurements of GeSbTe and electrode materials using nanosecond thermoreflectance 2010 ·Elah Bozorg-Grayeli, John P. Reifenberg, (unknown), Matthew A. Panzer, Kenneth E. Goodson	16
13	Thermal Boundary Resistance Measurements for Phase-Change Memory Devices 2009 ·IEEE Electron Device Letters ·John P. Reifenberg, Kuo‐Wei Chang, Matthew A. Panzer, Sang‐Bum Kim, Jeremy Rowlette, Mehdi Asheghi, H.‐S. Philip Wong, Kenneth E. Goodson	101
14	Measurement of anisotropy in the thermal conductivity of Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf> films 2009 ·Jaeho Lee, John P. Reifenberg, Zijian Li, (unknown), Mehdi Asheghi, Sang‐Bum Kim, H.‐S. Philip Wong, K.E. Goodson	1
15	The Impact of Thermal Boundary Resistance in Phase-Change Memory Devices 2008 ·IEEE Electron Device Letters ·John P. Reifenberg, D.L. Kencke, Kenneth E. Goodson	102
16	Compact thermal model for phase change memory nanodevices 2008 ·Roseanne Warren, John P. Reifenberg, Kenneth E. Goodson	10
17	Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films 2007 ·Applied Physics Letters ·John P. Reifenberg, Matthew A. Panzer, Sang‐Bum Kim, (unknown), Yuan Zhang, S.S. Wong, H.‐S. Philip Wong, Eric Pop, Kenneth E. Goodson	107
18	The Role of Interfaces in Damascene Phase-Change Memory 2007 ·D.L. Kencke, I. V. Karpov, (unknown), (unknown), D. Kau, S. J. Hudgens, John P. Reifenberg, Semyon D. Savransky, Jingyan Zhang, M.D. Giles, (unknown)	29
19	Multiphysics Modeling and Impact of Thermal Boundary Resistance in Phase Change Memory Devices 2006 ·John P. Reifenberg, Eric Pop, (unknown), S.S. Wong, Kenneth E. Goodson	19
20	Thermal Conductivity Measurements of Thin Aluminum Layers Using Steady State Joule Heating and Electrical Resistance Thermometry in Suspended Bridges 2003 ·John P. Reifenberg, (unknown), (unknown), Walter Schmitt, Ying Yang, Shahab Shojaei-Zadeh, (unknown), Sakineh Sadeghipour, Mehdi Asheghi	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact