Martin Jak

434 total citations
19 papers, 337 citations indexed

About

Martin Jak is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Martin Jak has authored 19 papers receiving a total of 337 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 9 papers in Surfaces, Coatings and Films and 8 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Martin Jak's work include Advancements in Photolithography Techniques (7 papers), Optical Coatings and Gratings (7 papers) and Advanced Surface Polishing Techniques (4 papers). Martin Jak is often cited by papers focused on Advancements in Photolithography Techniques (7 papers), Optical Coatings and Gratings (7 papers) and Advanced Surface Polishing Techniques (4 papers). Martin Jak collaborates with scholars based in Netherlands, Germany and Finland. Martin Jak's co-authors include J.W.M. Frenken, J. Verhoeven, Maarten M. J. W. van Herpen, Vadim Banine, Hugo J. Cornelissen, Roberto Caputo, Dick K. G. de Boer, Luciano De Sio, Andreas Fuchs and Andrei M. Yakunin and has published in prestigious journals such as Optics Letters, Optics Express and Applied Surface Science.

In The Last Decade

Martin Jak

19 papers receiving 319 citations

Peers

Countries citing papers authored by Martin Jak

Since Specialization

Citations

This map shows the geographic impact of Martin Jak's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Martin Jak with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Martin Jak more than expected).

Fields of papers citing papers by Martin Jak

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Martin Jak. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Martin Jak. The network helps show where Martin Jak may publish in the future.

Co-authorship network of co-authors of Martin Jak

This figure shows the co-authorship network connecting the top 25 collaborators of Martin Jak. A scholar is included among the top collaborators of Martin Jak based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Martin Jak. Martin Jak is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

19 of 19 papers shown

#	Work	Indexed citations
1	A complete methodology towards accuracy and lot-to-lot robustness in on-product overlay metrology using flexible wavelength selection 2017 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Arie den Boef, (unknown), (unknown), Grzegorz Grzela, Andreas Fuchs, Martin Jak, (unknown), Ken Chang, (unknown), (unknown), (unknown), Cathy Wang, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown)	11
2	Reducing the overlay metrology sensitivity to perturbations of the measurement stack 2017 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yue Zhou, (unknown), (unknown), (unknown), (unknown), Sung Yong Bae, Nicholas Stokes, Aiqin Jiang, (unknown), (unknown), A. Donini, Bart Visser, (unknown), Grzegorz Grzela, (unknown), Martin Jak, (unknown), Stephen P. Morgan	3
3	New approaches in diffraction based optical metrology 2016 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Martin Ebert, Peter Vanoppen, Martin Jak, (unknown), (unknown), (unknown), (unknown)	3
4	Holistic approach using accuracy of diffraction-based integrated metrology to improve on-product performance, reduce cycle time, and cost at litho 2015 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Arie den Boef, Martin Jak, Gary Zhang, (unknown), (unknown), (unknown), Andreas Fuchs, Youping Zhang, (unknown), (unknown), (unknown), (unknown), Cathy Wang, (unknown), (unknown)	19
5	Sub-nanometer in-die overlay metrology: measurement and simulation at the edge of finiteness 2013 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Martin Jak, Arie den Boef, M. van Schijndel, M. Bozkurt, Andreas Fuchs, (unknown), S. Meyer, Stephen P. Morgan, (unknown), (unknown), (unknown), (unknown)	6
6	Atomic-hydrogen cleaning of Sn from Mo/Si and DLC/Si extreme ultraviolet multilayer mirrors 2012 ·Journal of Micro/Nanolithography MEMS and MOEMS ·(unknown), Maarten M. J. W. van Herpen, Martin Jak, Peter Gawlitza, Stefan Braun, Н. Н. Салащенко, Н. И. Чхало, Vadim Banine	13
7	Evaluation of a novel ultra small target technology supporting on-product overlay measurements 2012 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Arie den Boef, (unknown), Martin Jak, M. van Schijndel, Andreas Fuchs, (unknown), S. Meyer, Stephen P. Morgan, (unknown), (unknown), Cathy Wang, (unknown), (unknown), (unknown), (unknown), (unknown)	29
8	DLC/Si multilayer mirrors for EUV radiation 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Peter Gawlitza, Stefan Braun, Andreas Leson, (unknown), Martin Jak, Vadim Banine	1
9	Extreme ultraviolet multilayer mirror with near-zero IR reflectance 2009 ·Optics Letters ·(unknown), Peter Gawlitza, Maarten M. J. W. van Herpen, Martin Jak, Stefan Braun, (unknown), Vadim Banine	18
10	Grid spectral purity filters for suppression of infrared radiation in laser-produced plasma EUV sources 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Martin Jak, Andrei M. Yakunin, Maarten M. J. W. van Herpen, Vadim Banine	22
11	Color‐separating backlight for improved LCD efficiency 2008 ·Journal of the Society for Information Display ·Martin Jak, Roberto Caputo, (unknown), Luciano De Sio, Dick K. G. de Boer, Hugo J. Cornelissen	10
12	Short period holographic structures for backlight display applications 2007 ·Optics Express ·Roberto Caputo, Luciano De Sio, Martin Jak, (unknown), Dick K. G. de Boer, Hugo J. Cornelissen	20
13	Diffractive grating structures for colour-separating backlights 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Roberto Caputo, Hugo J. Cornelissen, (unknown), (unknown), Martin Jak	9
14	Hybrid spatial‐temporal color synthesis and its applications 2005 ·Journal of the Society for Information Display ·Louis D. Silverstein, S. J. Roosendaal, Martin Jak	6
15	25.3: Spectrum Sequential Liquid Crystal Display 2005 ·SID Symposium Digest of Technical Papers ·Martin Jak, (unknown), (unknown), (unknown), (unknown), (unknown)	5
16	The effect of stoichiometry on the stability of steps on TiO2(1 1 0) 2002 ·Applied Surface Science ·Martin Jak, (unknown), J. Verhoeven, J.W.M. Frenken	10
17	Automated detection of particles, clusters and islands in scanning probe microscopy images 2001 ·Surface Science ·Martin Jak, (unknown), (unknown), J. Verhoeven, Raoul van Gastel, J.W.M. Frenken	16
18	The influence of substrate defects on the growth rate of palladium nanoparticles on a TiO2(110) surface 2001 ·Surface Science ·Martin Jak, (unknown), (unknown), (unknown), J. Verhoeven, J.W.M. Frenken	53
19	Scanning tunnelling microscopy study of the growth of small palladium particles on TiO2(110) 2000 ·Surface Science ·Martin Jak, (unknown), (unknown), J. Verhoeven, J.W.M. Frenken	83

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact