S. Okayama

1.6k total citations · 1 hit paper
27 papers, 1.3k citations indexed

About

S. Okayama is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, S. Okayama has authored 27 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 15 papers in Atomic and Molecular Physics, and Optics and 9 papers in Surfaces, Coatings and Films. Recurrent topics in S. Okayama's work include Force Microscopy Techniques and Applications (9 papers), Advancements in Photolithography Techniques (8 papers) and Electron and X-Ray Spectroscopy Techniques (8 papers). S. Okayama is often cited by papers focused on Force Microscopy Techniques and Applications (9 papers), Advancements in Photolithography Techniques (8 papers) and Electron and X-Ray Spectroscopy Techniques (8 papers). S. Okayama collaborates with scholars based in Japan and Poland. S. Okayama's co-authors include Hisazo Kawakatsu, Hiroshi Tokumoto, Hiroshi Bando, Masanori Komuro, Hiroshi Hiroshima, Koji Kajimura, Wataru Mizutani, Yuichi Ono, Makoto Okano and Kazuhiko Endo and has published in prestigious journals such as Applied Physics Letters, Surface Science and Journal of Physics D Applied Physics.

In The Last Decade

S. Okayama

21 papers receiving 1.2k citations

Hit Papers

Penetration and energy-loss theory of electrons in solid ... 1972 2026 1990 2008 1972 250 500 750 1000

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Okayama Japan 8 633 432 423 257 204 27 1.3k
C. Le Gressus France 20 1.0k 1.6× 893 2.1× 373 0.9× 169 0.7× 175 0.9× 90 1.6k
P. H. Holloway United States 19 595 0.9× 358 0.8× 229 0.5× 244 0.9× 117 0.6× 68 1.1k
J. Verhoeven Netherlands 21 442 0.7× 496 1.1× 243 0.6× 285 1.1× 470 2.3× 73 1.4k
T. Sekine Japan 11 710 1.1× 804 1.9× 518 1.2× 509 2.0× 213 1.0× 24 1.8k
V. S. Sundaram United States 21 665 1.1× 357 0.8× 242 0.6× 655 2.5× 213 1.0× 67 1.4k
G. Möbus United Kingdom 22 313 0.5× 637 1.5× 373 0.9× 199 0.8× 297 1.5× 88 1.3k
Jingtao Zhu China 21 449 0.7× 402 0.9× 222 0.5× 264 1.0× 270 1.3× 114 1.2k
R. Vincent United Kingdom 16 258 0.4× 769 1.8× 298 0.7× 189 0.7× 218 1.1× 40 1.3k
S. Rigo France 19 1.0k 1.6× 627 1.5× 183 0.4× 148 0.6× 101 0.5× 75 1.4k
A. Kinomura Japan 19 803 1.3× 519 1.2× 174 0.4× 293 1.1× 93 0.5× 184 1.5k

Countries citing papers authored by S. Okayama

Since Specialization
Citations

This map shows the geographic impact of S. Okayama's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Okayama with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Okayama more than expected).

Fields of papers citing papers by S. Okayama

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Okayama. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Okayama. The network helps show where S. Okayama may publish in the future.

Co-authorship network of co-authors of S. Okayama

This figure shows the co-authorship network connecting the top 25 collaborators of S. Okayama. A scholar is included among the top collaborators of S. Okayama based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Okayama. S. Okayama is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
3.
Tamura, Keiji, S. Okayama, & R. Shimizu. (2010). Third-order spherical aberration correction using multistage self-aligned quadrupole correction-lens systems. Journal of Electron Microscopy. 59(3). 197–206. 6 indexed citations
4.
Okayama, S., Satoshi Haraichi, & Hirofumi Matsuhata. (2005). Reference sample for the evaluation of SEM image resolution at a high magnification—nanometer-scale Au particles on an HOPG substrate. Microscopy. 54(4). 345–350. 5 indexed citations
5.
Komuro, Masanori, Hiroshi Hiroshima, Satoshi Haraichi, et al.. (1996). Electron beam nano-fabrication by inorganic resist for MIM tunnel junction. Microelectronic Engineering. 30(1-4). 411–414. 4 indexed citations
6.
Okayama, S., S. Kimura, Ayumi Asai, & S. Maeda. (1996). Prospect and status of MITI's quantum functional device project. Microelectronic Engineering. 30(1-4). 17–26. 1 indexed citations
7.
Hiroshima, Hiroshi, et al.. (1995). Nanobeam process system: An ultrahigh vacuum electron beam lithography system with 3 nm probe size. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 2514–2517. 21 indexed citations
8.
Okayama, S.. (1989). Electron Beam Lithography Using A New Quadrupole Triplet. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1089. 74–74. 1 indexed citations
9.
Komuro, Masanori, et al.. (1989). Ion beam fabrication using piezo-actuator and liquid metal source. Microelectronic Engineering. 9(1-4). 285–288. 1 indexed citations
10.
Okayama, S., et al.. (1988). High resolution piezoelectric actuator for STM.. Journal of the Japan Society for Precision Engineering. 54(5). 817–821. 1 indexed citations
11.
Okayama, S., Masanori Komuro, Wataru Mizutani, et al.. (1988). Observation of microfabricated patterns by scanning tunneling microscopy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 6(2). 440–444. 14 indexed citations
12.
Okayama, S.. (1988). Electron-beam lithography system using a quadrupole triplet. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 6(1). 199–203. 3 indexed citations
13.
Kajimura, K., Hiroshi Bando, Kazuhiko Endo, et al.. (1987). Construction of an STM and observation of 2H-NbSe2 atomic images. Surface Science. 181(1-2). 165–173. 10 indexed citations
14.
Komuro, Masanori, et al.. (1987). Nanometer structure fabricated by FIB and its observation by STM. Microelectronic Engineering. 6(1-4). 343–348. 1 indexed citations
15.
Kajimura, Koji, Hiroshi Bando, Hiroshi Tokumoto, et al.. (1987). Scanning tunneling microscopy.. Hyomen Kagaku. 8(1). 2–13. 4 indexed citations
16.
Tokumoto, Hiroshi, Hiroshi Bando, Wataru Mizutani, et al.. (1986). Observation of Atomic Image of 2H-NbSe2 Surface by Scanning Tunneling Microscope. Japanese Journal of Applied Physics. 25(8A). L621–L621. 6 indexed citations
17.
Okayama, S. & Hisazo Kawakatsu. (1982). A new correction lens. Journal of Physics E Scientific Instruments. 15(5). 580–586. 7 indexed citations
18.
Okayama, S. & Hisazo Kawakatsu. (1978). Potential distribution and focal properties of electrostatic quadrupole lenses. Journal of Physics E Scientific Instruments. 11(3). 211–216. 8 indexed citations
19.
Okayama, S., et al.. (1972). Penetration and energy-loss theory of electrons in solid targets. Journal of Physics D Applied Physics. 5(1). 43–58. 1112 indexed citations breakdown →
20.
Kanaya, K. & S. Okayama. (1969). THIRD-ORDER ABERRATIONS OF AN ELECTROSTATIC QUADRUPOLE LENS FOR A MODIFIED BELL-SHAPED MODEL.. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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