N.B. Koster

443 total citations
38 papers, 316 citations indexed

About

N.B. Koster is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Radiation. According to data from OpenAlex, N.B. Koster has authored 38 papers receiving a total of 316 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 17 papers in Surfaces, Coatings and Films and 11 papers in Radiation. Recurrent topics in N.B. Koster's work include Advancements in Photolithography Techniques (20 papers), Electron and X-Ray Spectroscopy Techniques (17 papers) and X-ray Spectroscopy and Fluorescence Analysis (10 papers). N.B. Koster is often cited by papers focused on Advancements in Photolithography Techniques (20 papers), Electron and X-Ray Spectroscopy Techniques (17 papers) and X-ray Spectroscopy and Fluorescence Analysis (10 papers). N.B. Koster collaborates with scholars based in Netherlands, United States and Germany. N.B. Koster's co-authors include E. Louis, Hamed Sadeghian, F. Bijkerk, R.W. Herfst, Eberhard Spiller, H. A. Padmore, Rutger Schlatmann, R. Klein, J. Verhoeven and G. E. van Dorssen and has published in prestigious journals such as Journal of Applied Physics, Applied Surface Science and Measurement.

In The Last Decade

N.B. Koster

36 papers receiving 304 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
N.B. Koster Netherlands 12 183 101 90 83 75 38 316
Sergiy Yulin Germany 12 178 1.0× 119 1.2× 111 1.2× 75 0.9× 95 1.3× 42 386
Roel Moors Netherlands 9 209 1.1× 72 0.7× 87 1.0× 67 0.8× 76 1.0× 11 310
Peter Gawlitza Germany 10 107 0.6× 61 0.6× 65 0.7× 71 0.9× 63 0.8× 42 320
B. Kaufmann Germany 12 212 1.2× 108 1.1× 50 0.6× 147 1.8× 64 0.9× 32 385
John P. Lehan United States 10 216 1.2× 78 0.8× 54 0.6× 141 1.7× 43 0.6× 46 399
P. Costa Pinto Switzerland 8 310 1.7× 74 0.7× 91 1.0× 144 1.7× 150 2.0× 33 479
Elisa García‐Tabarés Spain 11 266 1.5× 135 1.3× 40 0.4× 93 1.1× 90 1.2× 33 387
Řeža Valizadeh United Kingdom 13 333 1.8× 68 0.7× 73 0.8× 156 1.9× 135 1.8× 70 545
V.E. Storizhko Ukraine 11 125 0.7× 46 0.5× 77 0.9× 47 0.6× 36 0.5× 46 296
A.G. Ponomarev Ukraine 14 193 1.1× 46 0.5× 174 1.9× 139 1.7× 59 0.8× 70 485

Countries citing papers authored by N.B. Koster

Since Specialization
Citations

This map shows the geographic impact of N.B. Koster's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N.B. Koster with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N.B. Koster more than expected).

Fields of papers citing papers by N.B. Koster

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N.B. Koster. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N.B. Koster. The network helps show where N.B. Koster may publish in the future.

Co-authorship network of co-authors of N.B. Koster

This figure shows the co-authorship network connecting the top 25 collaborators of N.B. Koster. A scholar is included among the top collaborators of N.B. Koster based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N.B. Koster. N.B. Koster is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Koster, N.B., et al.. (2021). On the Opportunity of Liquid Metal Rotated Anode for High Brightness X-Ray Source. IEEE Transactions on Plasma Science. 49(2). 770–775. 1 indexed citations
2.
Bekman, H. H. P. Th., et al.. (2019). EBL2 an EUV (Extreme Ultra-Violet) lithography beam line irradiation facility. 4–4. 3 indexed citations
3.
Verlaan, Ad, Chien‐Ching Wu, M. Smith, et al.. (2019). UWAVS first mirror after long plasma cleaning: Surface properties and material re-deposition issues. Fusion Engineering and Design. 146. 1559–1563. 12 indexed citations
4.
Koster, N.B., et al.. (2017). Characterization of EBL2 EUV exposure facility. 78–78. 1 indexed citations
5.
Koster, N.B., et al.. (2017). First light at EBL2. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10143. 101431N–101431N. 3 indexed citations
6.
Koster, N.B., et al.. (2017). First light and results on EBL2. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10454. 104540O–104540O. 3 indexed citations
7.
Maas, Diederik, et al.. (2017). Lab- and field-test results of MFIG, the first real-time vacuum-contamination sensor. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10145. 101452I–101452I.
8.
Koster, N.B., et al.. (2016). EBL2, a flexible, controlled EUV exposure and surface analysis facility. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9984. 99840R–99840R. 8 indexed citations
9.
Veldhoven, Jacqueline van, et al.. (2016). Towards a Carbon-contamination-tolerant EUV power sensor. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9776. 97762T–97762T. 1 indexed citations
10.
Koster, N.B., et al.. (2014). Carbon removal from trenches on EUV reticles. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9235. 923517–923517. 1 indexed citations
11.
Herfst, R.W., et al.. (2014). Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems. Measurement. 56. 104–116. 17 indexed citations
12.
Jong, A.J. de, et al.. (2012). Contamination control: removing small particles from increasingly large wafers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8324. 832423–832423.
13.
Koster, N.B., et al.. (2011). Towards defect free EUVL reticles: carbon and particle removal by single dry cleaning proces and pattern repair by HIM. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7969. 79690X–79690X. 1 indexed citations
14.
Koster, N.B., et al.. (2009). New developments in cleaning of EUVL mirrors and reticles. TNO Repository. 2 indexed citations
15.
Koster, N.B., et al.. (2003). EUV time-resolved studies on carbon growth and cleaning. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5037. 95–95. 11 indexed citations
16.
Klein, R., Alexander Gottwald, Frank Scholze, et al.. (2001). <title>Lifetime testing of EUV optics using intense synchrotron radiation at the PTB Radiometry Laboratory</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4506. 105–112. 9 indexed citations
17.
Louis, E., et al.. (1998). Temperature induced diffusion in Mo/Si multilayer mirrors. Journal of Applied Physics. 83(9). 4700–4708. 38 indexed citations
18.
Louis, E., N.B. Koster, F. Bijkerk, et al.. (1995). Multilayer coated reflective optics for Extreme UV lithography. Microelectronic Engineering. 27(1-4). 235–238. 19 indexed citations
19.
Louis, E., N.B. Koster, Л. А. Шмаенок, et al.. (1994). Enhancement of reflectivity of multilayer mirrors for soft x-ray projection lithography by temperature optimization and ion bombardment. Microelectronic Engineering. 23(1-4). 215–218. 37 indexed citations
20.
Christensen, Flemming, Salim Abdali, Peter K. Frederiksen, et al.. (1994). Some applications of nanometer scale structures for current and future X-ray space research. Journal de Physique III. 4(9). 1599–1612. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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