N.B. Koster
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 17
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis 10
- Computational Mechanics top 10%
- Ion-surface interactions and analysis 4
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- Force Microscopy Techniques and Applications 3
- Semiconductor materials and interfaces 3
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- Advancements in Photolithography Techniques 20
- Integrated Circuits and Semiconductor Failure Analysis 6
- Semiconductor materials and devices 4
N.B. Koster
36 papers receiving 304 citations
Peers
Comparison fields: 5 of 32
- Surfaces, Coatings and Films 90
- Radiation 59
- Structural Biology 5
- Computational Mechanics 68
- Atomic and Molecular Physics, and Optics 101
Countries citing papers authored by N.B. Koster
This map shows the geographic impact of N.B. Koster's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N.B. Koster with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N.B. Koster more than expected).
Fields of papers citing papers by N.B. Koster
This network shows the impact of papers produced by N.B. Koster. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N.B. Koster. The network helps show where N.B. Koster may publish in the future.
Co-authorship network
The 25 scholars most cited alongside N.B. Koster, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2021 | 1 | |
| 2 | 2019 | 3 | |
| 3 | 2019 | 12 | |
| 4 | 2017 | 1 | |
| 5 | 2017 | 3 | |
| 6 | 2017 | 3 | |
| 7 | 2017 | 0 | |
| 8 | 2016 | 8 | |
| 9 | 2016 | 1 | |
| 10 | 2014 | 1 | |
| 11 | 2014 | 17 | |
| 12 | 2012 | 0 | |
| 13 | 2011 | 1 | |
| 14 | New developments in cleaning of EUVL mirrors and reticles | 2009 | 2 |
| 15 | 2003 | 11 | |
| 16 | 2001 | 9 | |
| 17 | 1998 | 38 | |
| 18 | 1995 | 19 | |
| 19 | 1994 | 37 | |
| 20 | 1994 | 1 |
About N.B. Koster
N.B. Koster is a scholar working on Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, Bioengineering and Atomic and Molecular Physics, and Optics, having authored 38 papers that have together received 316 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (20 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), X-ray Spectroscopy and Fluorescence Analysis (10 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Ion-surface interactions and analysis (4 papers), Semiconductor materials and devices (4 papers), Force Microscopy Techniques and Applications (3 papers) and Semiconductor materials and interfaces (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (90 citations), Radiation (59 citations), Structural Biology (5 citations), Computational Mechanics (68 citations) and Atomic and Molecular Physics, and Optics (101 citations). N.B. Koster has collaborated with scholars based in Netherlands, United States and Germany. Frequent co-authors include E. Louis, Hamed Sadeghian, F. Bijkerk, R.W. Herfst, Eberhard Spiller, H. A. Padmore, Rutger Schlatmann, R. Klein, J. Verhoeven and G. E. van Dorssen. Their work appears in journals such as Microelectronic Engineering, Fusion Engineering and Design, Journal of Applied Physics, Measurement and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.