J. M. Killiany

401 total citations
13 papers, 266 citations indexed

About

J. M. Killiany is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Bioengineering. According to data from OpenAlex, J. M. Killiany has authored 13 papers receiving a total of 266 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Electrical and Electronic Engineering, 4 papers in Aerospace Engineering and 3 papers in Bioengineering. Recurrent topics in J. M. Killiany's work include CCD and CMOS Imaging Sensors (10 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Infrared Target Detection Methodologies (4 papers). J. M. Killiany is often cited by papers focused on CCD and CMOS Imaging Sensors (10 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Infrared Target Detection Methodologies (4 papers). J. M. Killiany collaborates with scholars based in United States. J. M. Killiany's co-authors include D. Scribner, M. Kruer, N. S. Saks, D. F. Barbe, H.L. Hughes, U. D. Desai and James Waterman and has published in prestigious journals such as Applied Physics Letters, Proceedings of the IEEE and IEEE Transactions on Electron Devices.

In The Last Decade

J. M. Killiany

13 papers receiving 246 citations

Peers

J. M. Killiany
Freeman D. Shepherd United States
Benjamin W. Frazier United States
J. Borg Sweden
M. Otsuka Japan
Freeman D. Shepherd United States
J. M. Killiany
Citations per year, relative to J. M. Killiany J. M. Killiany (= 1×) peers Freeman D. Shepherd

Countries citing papers authored by J. M. Killiany

Since Specialization
Citations

This map shows the geographic impact of J. M. Killiany's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. M. Killiany with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. M. Killiany more than expected).

Fields of papers citing papers by J. M. Killiany

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. M. Killiany. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. M. Killiany. The network helps show where J. M. Killiany may publish in the future.

Co-authorship network of co-authors of J. M. Killiany

This figure shows the co-authorship network connecting the top 25 collaborators of J. M. Killiany. A scholar is included among the top collaborators of J. M. Killiany based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. M. Killiany. J. M. Killiany is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
1.
Scribner, D., M. Kruer, & J. M. Killiany. (1991). Infrared focal plane array technology. Proceedings of the IEEE. 79(1). 66–85. 164 indexed citations
2.
Kruer, M., D. Scribner, & J. M. Killiany. (1987). Infrared Focal Plane Array Technology Development For Navy Applications. Optical Engineering. 26(3). 263182–263182. 9 indexed citations
3.
Waterman, James & J. M. Killiany. (1983). 2 MeV Electron Irradiation Effects in (HG,CD) TE CCDS. IEEE Transactions on Nuclear Science. 30(6). 4209–4215. 4 indexed citations
4.
Killiany, J. M., et al.. (1981). Gamma Radiation Induced Noise in a CCD Imager. IEEE Transactions on Nuclear Science. 28(6). 4161–4165. 3 indexed citations
5.
Killiany, J. M. & N. S. Saks. (1980). <title>Metal Insulated Semiconductor (MIS) Radiation Effects Considerations For Infrared Focal-Plane Arrays</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 217. 192–201. 1 indexed citations
6.
Saks, N. S., et al.. (1979). A Radiation Hard MNOS CCD for Low Temperature Applications. IEEE Transactions on Nuclear Science. 26(6). 5074–5079. 16 indexed citations
7.
Killiany, J. M.. (1978). Radiation Effects on Silicon Charge-Coupled Devices. IEEE Transactions on Components Hybrids and Manufacturing Technology. 1(4). 353–365. 19 indexed citations
8.
Killiany, J. M.. (1977). Low-Temperature Radiation Damage Effects in a Room-Temperature Radiation-Hard Surface Channel CCD. IEEE Transactions on Nuclear Science. 24(6). 2194–2198. 7 indexed citations
9.
Killiany, J. M., et al.. (1975). Effects of Ionizing Radiation on a 256-Stage Linear CCD Imager. IEEE Transactions on Nuclear Science. 22(6). 2634–2638. 8 indexed citations
10.
Killiany, J. M., et al.. (1974). Effects of radiation on buried-channel CCDs with doped polysilicon gates and undoped polysilicon interelectrode isolation. Applied Physics Letters. 24(10). 506–508. 3 indexed citations
11.
Killiany, J. M., et al.. (1974). Effects of ionizing radiation on charge-coupled device structures. IEEE Transactions on Nuclear Science. 21(6). 193–200. 15 indexed citations
12.
Barbe, D. F., J. M. Killiany, & H.L. Hughes. (1973). Effects of gamma radiation on charge-coupled devices. Applied Physics Letters. 23(7). 400–402. 9 indexed citations
13.
Desai, U. D., et al.. (1968). Effects of electric fields on annealing of radiation damage in MOSFET's. IEEE Transactions on Electron Devices. 15(10). 751–756. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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