J. M. Killiany

401 citations
13 papers · 266 indexed · h-index 8
Topics
CCD and CMOS Imaging Sensors (10 papers)Integrated Circuits and Semiconductor Failure Analysis (5 papers)Infrared Target Detection Methodologies (4 papers)
Partner nations
United States

In The Last Decade

J. M. Killiany

13 papers receiving 246 citations

Peers

J. M. Killiany
Comparison fields: 5 of 47
  • Electrical and Electronic Engineering 206
  • Aerospace Engineering 140
  • Atomic and Molecular Physics, and Optics 29
  • Mechanics of Materials 28
  • Instrumentation 24
Replace Freeman D. Shepherd with:
Freeman D. Shepherd United States
J. Borg Sweden
Zujun Wang China
Serena Rizzolo France
Benjamin W. Frazier United States
Marc C. Decreton Belgium
Frédéric Zamkotsian France
Q. Kerns United States
R. M. Brubaker United States
Zhengang Yang China
J. M. Killiany relative to Freeman D. Shepherd United States Freeman D. Shepherd's profile →
Citations per field
00.5×
Freeman D. Shepherd · 1×
Citations per year

Countries citing papers authored by J. M. Killiany

Since Specialization
Citations

This map shows the geographic impact of J. M. Killiany's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. M. Killiany with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. M. Killiany more than expected).

Fields of papers citing papers by J. M. Killiany

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. M. Killiany. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. M. Killiany. The network helps show where J. M. Killiany may publish in the future.

Co-authorship network of co-authors of J. M. Killiany

This figure shows the co-authorship network connecting the top 25 collaborators of J. M. Killiany. A scholar is included among the top collaborators of J. M. Killiany based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. M. Killiany. J. M. Killiany is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
#WorkIndexed citations
1 164
2 9
3 4
4 3
5 1
6 16
7 19
8 7
9 8
10 3
11 15
12 9
13 8

About J. M. Killiany

J. M. Killiany is a scholar working on Bioengineering, Instrumentation and Electrical and Electronic Engineering, having authored 13 papers that have together received 266 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (10 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Infrared Target Detection Methodologies (4 papers). The work is most often cited by research in Instrumentation (24 citations), Aerospace Engineering (140 citations) and Electrical and Electronic Engineering (206 citations). J. M. Killiany has collaborated with scholars based in United States. Frequent co-authors include D. Scribner, M. Kruer, N. S. Saks, D. F. Barbe, H.L. Hughes, U. D. Desai and James Waterman. Their work appears in journals such as Applied Physics Letters, Proceedings of the IEEE and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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