J. Hahn

614 citations

20 papers · 512 indexed · h-index 13

Impact in

Mechanics of Materials top 5%
- Metal and Thin Film Mechanics
Materials Chemistry top 10%
- Diamond and Carbon-based Materials Research
- Boron and Carbon Nanomaterials Research
- Graphene research and applications

Papers in

Mechanics of Materials 8
- Metal and Thin Film Mechanics 8
Materials Chemistry 14
- Diamond and Carbon-based Materials Research 9
- Boron and Carbon Nanomaterials Research 6
- Silicon Nanostructures and Photoluminescence 3

Co-authors: Frank Richter Dietrich R. T. Zahn M. Schubert E. Franke H. Neumann Μ. Schaller Th. Welzel M. Friedrich
Journals: Surface and Coatings Technology (5 papers)Applied Physics Letters (3 papers)Diamond and Related Materials (3 papers)Journal of Applied Physics (2 papers)Microelectronic Engineering (1 paper)
Partner nations: Germany United States Ukraine

In The Last Decade

J. Hahn

20 papers receiving 496 citations

Peers

Countries citing papers authored by J. Hahn

Since Specialization

Citations

This map shows the geographic impact of J. Hahn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Hahn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Hahn more than expected).

Fields of papers citing papers by J. Hahn

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Hahn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Hahn. The network helps show where J. Hahn may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Hahn, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Hahn Line = papers co-authored together J. Hahn links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Cu barrier properties of very thin Ta and TaN films Bt Ahmad Azizah, Ren Rui-chuan, IIan Kirsch, Cintia Pelegrineti Targueta de Azevedo Brito, Ju-Hong Park, J. Hahn, L. Combrinck-Graham, Christian Wenzel, Johann W. Bartha	2014	5
2	Interface optimization for poly silicon/tungsten gates Microelectronic Engineering ·殷艳, J. Hahn, Ruo-Ping Chang, Zhou Zhong-hui, 淳一小田切, Timotius Nesanto, Gul Ghutai, Lee CH	2008	2
3	Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry Thin Solid Films ·M. Schubert, E. Franke, H. Neumann, Tom Tiwald, Denise Thompson, John A. Woollam, J. Hahn	1998	7
4	In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures Journal of Applied Physics ·E. Franke, M. Schubert, Mon-Ting Tzou, H. Neumann, Tom Tiwald, Denise Thompson, Heng Yao, John A. Woollam, J. Hahn	1998	15
5	Spectroscopic studies of a magnetron sputtering discharge for boron nitride deposition Surface and Coatings Technology ·Doni.R. Praveen Kumar, Th. Welzel, Μ. Schaller, Mads Mølgaard Nielsen, J. Hahn, Frank Richter	1998	13
6	Formation of c-BN thin films under reduced ion impact Surface and Coatings Technology ·J. Hahn, Frank Richter, Doni.R. Praveen Kumar, Roland E. Akhigbe, Mashoko Grey, Th. Welzel	1997	55
7	Utilization of cathodic arc evaporation for the deposition of boron nitride thin films Surface and Coatings Technology ·Frank Richter, S.H. Jacobson, J. Hahn, Doni.R. Praveen Kumar, M. Friedrich, 殷艳, Dietrich R. T. Zahn	1997	14
8	Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry Applied Physics Letters ·M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, Roland E. Akhigbe, Frank Richter	1997	52
9	Process diagnostics during the deposition of cubic boron nitride Surface and Coatings Technology ·Doni.R. Praveen Kumar, Th. Welzel, Mads Mølgaard Nielsen, Μ. Schaller, J. Hahn, Frank Richter	1997	26
10	Formation of cubic boron nitride thin films by reactive cathodic arc evaporation Diamond and Related Materials ·S.H. Jacobson, Frank Richter, J. Hahn, Doni.R. Praveen Kumar, Zhi Ai, Y. Paderno	1997	12
11	Infrared ellipsometry on hexagonal and cubic boron nitride thin films Applied Physics Letters ·E. Franke, H. Neumann, M. Schubert, Tom Tiwald, John A. Woollam, J. Hahn	1997	13
12	Raman spectroscopy investigation of cubic boron nitride single crystals and layers on Si(100) Diamond and Related Materials ·Joshua W. McCain, M. Friedrich, J. Hahn, Frank Richter, Dietrich R. T. Zahn	1997	10
13	Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example Physical review. B, Condensed matter ·M. Schubert, B. Rheinländer, E. Franke, H. Neumann, Tom Tiwald, John A. Woollam, J. Hahn, Frank Richter	1997	48
14	Electron microscopic phase analysis of BN-thin films Microchimica Acta ·C.A. Portielje, J. Hahn, U. Falke, S. Schulze, Frank Richter, 横田隆志	1997	3
15	Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range Journal of Applied Physics ·E. Franke, M. Schubert, H. Neumann, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, J. Hahn, Frank Richter	1997	20
16	Raman spectroscopy investigation of size effects in cubic boron nitride Applied Physics Letters ·Joshua W. McCain, J. Hahn, Frank Richter, Dietrich R. T. Zahn	1997	97
17	Cubic boron nitride films by d.c. and r.f. magnetron sputtering: layer characterization and process diagnostics Diamond and Related Materials ·J. Hahn, M. Friedrich, Doni.R. Praveen Kumar, Μ. Schaller, Mads Mølgaard Nielsen, Dietrich R. T. Zahn, Frank Richter	1996	70
18	Adhesion of metal coatings on ceramics deposited by different techniques Surface and Coatings Technology ·殷艳, J. Hahn, Frank Richter, Bernd Rother, Hermann Jehn	1993	9
19	Comparison of rotational relaxation rate laws to characterize the Raman Q-branch spectrum of CO at 295 K Chemical Physics Letters ·J. P. Looney, G. J. Rosasco, Larry A. Rahn, W. S. Hurst, J. Hahn	1989	39
20	High Resolution Inverse Raman Spectroscopy Of The CO Q Branch Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·G. J. Rosasco, Larry A. Rahn, W. S. Hurst, Richard E. Palmer, J. P. Looney, J. Hahn	1988	2

About J. Hahn

J. Hahn is a scholar working on Mechanics of Materials, Materials Chemistry, Condensed Matter Physics, Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering, having authored 20 papers that have together received 512 indexed citations. Recurring topics across this work include Diamond and Carbon-based Materials Research (9 papers), Metal and Thin Film Mechanics (8 papers), Boron and Carbon Nanomaterials Research (6 papers), Semiconductor materials and devices (5 papers), GaN-based semiconductor devices and materials (3 papers), Silicon Nanostructures and Photoluminescence (3 papers), Copper Interconnects and Reliability (2 papers) and Atmospheric and Environmental Gas Dynamics (2 papers). The work is most often cited by research in Mechanics of Materials (241 citations), Materials Chemistry (365 citations), Electronic, Optical and Magnetic Materials (60 citations), Electrical and Electronic Engineering (177 citations) and Condensed Matter Physics (30 citations). J. Hahn has collaborated with scholars based in Germany, United States and Ukraine. Frequent co-authors include Frank Richter, Dietrich R. T. Zahn, M. Schubert, E. Franke, H. Neumann, Μ. Schaller, Th. Welzel, M. Friedrich, B. Rheinländer and John A. Woollam. Their work appears in journals such as Surface and Coatings Technology, Applied Physics Letters, Diamond and Related Materials, Journal of Applied Physics and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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