Haifan You
- Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials 21
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- Ga2O3 and related materials 22
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- ZnO doping and properties 7
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- Advanced Optical Sensing Technologies 4
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- Photocathodes and Microchannel Plates 5
- Photoacoustic and Ultrasonic Imaging 2
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- Semiconductor Quantum Structures and Devices 4
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- CCD and CMOS Imaging Sensors 2
- Co-authors
- Hai LuYoudou ZhengDunjun ChenBin LiuRong ZhangHui GuoJin WangQing Cai
- Journals
- Nature Communications (1 paper)Applied Physics Letters (4 papers)ACS Applied Materials & Interfaces (2 papers)
- Partner nations
- ChinaUnited StatesMalaysia
In The Last Decade
Haifan You
29 papers receiving 584 citations
Hit Papers
Peers
Comparison fields: 5 of 34
- Condensed Matter Physics 308
- Electronic, Optical and Magnetic Materials 440
- Materials Chemistry 298
- Instrumentation 17
- Biomedical Engineering 164
Countries citing papers authored by Haifan You
This map shows the geographic impact of Haifan You's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Haifan You with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Haifan You more than expected).
Fields of papers citing papers by Haifan You
This network shows the impact of papers produced by Haifan You. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Haifan You. The network helps show where Haifan You may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Haifan You, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2025 | 0 | |
| 3 | 2025 | 6 | |
| 4 | 2025 | 0 | |
| 5 | 2025 | 0 | |
| 6 | 2024 | 2 | |
| 7 | 2024 | 1 | |
| 8 | 2024 | 1 | |
| 9 | 2023 | 1 | |
| 10 | 2023 | 11 | |
| 11 | 2023 | 5 | |
| 12 | 2022 | 9 | |
| 13 | 2021 | 7 | |
| 14 | Progress on AlGaN-based solar-blind ultraviolet photodetectors and focal plane arraysbreakdown → | 2021 | 349 |
| 15 | 2020 | 9 | |
| 16 | 2020 | 6 | |
| 17 | 2019 | 5 | |
| 18 | 2019 | 3 | |
| 19 | 2017 | 10 | |
| 20 | 2011 | 2 |
About Haifan You
Haifan You is a scholar working on Condensed Matter Physics, Electronic, Optical and Magnetic Materials and Instrumentation, having authored 33 papers that have together received 603 indexed citations. Recurring topics across this work include Ga2O3 and related materials (22 papers), GaN-based semiconductor devices and materials (21 papers), ZnO doping and properties (7 papers), Photocathodes and Microchannel Plates (5 papers), Semiconductor Quantum Structures and Devices (4 papers), Advanced Optical Sensing Technologies (4 papers), CCD and CMOS Imaging Sensors (2 papers) and Photoacoustic and Ultrasonic Imaging (2 papers). The work is most often cited by research in Condensed Matter Physics (308 citations), Electronic, Optical and Magnetic Materials (440 citations) and Materials Chemistry (298 citations). Haifan You has collaborated with scholars based in China, United States and Malaysia. Frequent co-authors include Hai Lu, Youdou Zheng, Dunjun Chen, Bin Liu, Rong Zhang, Hui Guo, Jin Wang, Qing Cai, Zili Xie and Dunjun Chen. Their work appears in journals such as Nature Communications, Applied Physics Letters and ACS Applied Materials & Interfaces.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.