H. Hayashida

430 total citations
21 papers, 321 citations indexed

About

H. Hayashida is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Materials Chemistry. According to data from OpenAlex, H. Hayashida has authored 21 papers receiving a total of 321 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 6 papers in Mechanics of Materials and 6 papers in Materials Chemistry. Recurrent topics in H. Hayashida's work include Semiconductor materials and devices (10 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and Metal and Thin Film Mechanics (4 papers). H. Hayashida is often cited by papers focused on Semiconductor materials and devices (10 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and Metal and Thin Film Mechanics (4 papers). H. Hayashida collaborates with scholars based in Japan, South Korea and Italy. H. Hayashida's co-authors include Y. Toyoshima, K. Maeguchi, Hiroshi Iwai, F. Matsuoka, T. Hara, Shozo Sekioka, Akihiro Ametani, M. Nagamatsu, Makoto Noda and Koh Hashimoto and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics.

In The Last Decade

H. Hayashida

19 papers receiving 298 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H. Hayashida Japan 8 263 49 41 39 34 21 321
H.K. Dirks Germany 7 394 1.5× 22 0.4× 11 0.3× 17 0.4× 86 2.5× 14 432
D.E. Bockelman United States 7 770 2.9× 68 1.4× 53 1.3× 13 0.3× 33 1.0× 9 805
Jungsoo Kim South Korea 12 308 1.2× 49 1.0× 65 1.6× 25 0.6× 33 1.0× 45 351
Yo Yamaguchi Japan 10 357 1.4× 54 1.1× 16 0.4× 10 0.3× 19 0.6× 64 394
Michael Tsuk United States 9 284 1.1× 24 0.5× 45 1.1× 11 0.3× 76 2.2× 17 333
M. Wurzer Germany 18 853 3.2× 159 3.2× 18 0.4× 21 0.5× 116 3.4× 55 879
Kyung Suk Oh United States 8 338 1.3× 29 0.6× 41 1.0× 32 0.8× 88 2.6× 15 363
Krishna Bharath United States 9 368 1.4× 12 0.2× 48 1.2× 13 0.3× 20 0.6× 28 384
Weimin Wu United States 15 700 2.7× 72 1.5× 10 0.2× 31 0.8× 32 0.9× 51 726
Taichi Sugai Japan 10 295 1.1× 15 0.3× 8 0.2× 6 0.2× 93 2.7× 65 368

Countries citing papers authored by H. Hayashida

Since Specialization
Citations

This map shows the geographic impact of H. Hayashida's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Hayashida with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Hayashida more than expected).

Fields of papers citing papers by H. Hayashida

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Hayashida. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Hayashida. The network helps show where H. Hayashida may publish in the future.

Co-authorship network of co-authors of H. Hayashida

This figure shows the co-authorship network connecting the top 25 collaborators of H. Hayashida. A scholar is included among the top collaborators of H. Hayashida based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Hayashida. H. Hayashida is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hayashida, H., et al.. (2005). Reducing costs for first one mile FTTH lines. OFC/NFOEC Technical Digest. Optical Fiber Communication Conference, 2005.. 3 pp. Vol. 3–3 pp. Vol. 3. 1 indexed citations
2.
Matsuoka, F., et al.. (2003). Drain avalanche hot hole injection mode on PMOSFETs. 18–21. 2 indexed citations
3.
Hayashida, H., Y. Toyoshima, H. Shinagawa, et al.. (2002). Manufacturable local interconnect technology fully compatible with titanium salicide process. 34. 332–334.
4.
Norishima, M., et al.. (2002). High-performance 0.5 mu m CMOS technology for logic LSIs with embedded large capacity SRAMs. 32. 489–492. 1 indexed citations
5.
Takayanagi, T., K. Sawada, Masaru Takahashi, et al.. (2002). 2.6 Gbyte/sec bandwidth cache/TLB macro for high-performance RISC processor. 10.2/1–10.2/4. 3 indexed citations
6.
Sekioka, Shozo, H. Hayashida, T. Hara, & Akihiro Ametani. (1998). Measurements of grounding resistances for high impulse currents. IEE Proceedings - Generation Transmission and Distribution. 145(6). 693–693. 46 indexed citations
7.
Hayashida, H., et al.. (1998). New process for producing an extrusion laminated film without any chemical primer—non anchor coating extrusion laminating process. Polymer Engineering and Science. 38(10). 1633–1639. 2 indexed citations
8.
Iguchi, Ienari, Takeshi Kusumori, & H. Hayashida. (1993). Effect of Film Resistance on Characteristics of High-Tc Multilayer Junctions. Japanese Journal of Applied Physics. 32(8R). 3442–3442. 2 indexed citations
9.
Okada, T., et al.. (1993). RISC-based multichip modules for workstation performance comparison among types of MCMs. 230–237. 4 indexed citations
10.
Nagamatsu, M., S. Tanaka, Makoto Noda, et al.. (1991). A 10 ns 54*54 b parallel structured full array multiplier with 0.5 mu m CMOS technology. IEEE Journal of Solid-State Circuits. 26(4). 600–606. 88 indexed citations
11.
Tagami, Keiko, et al.. (1990). Seek durability for CoCrTa perpendicular flexible disks. IEEE Transactions on Magnetics. 26(5). 2694–2696. 1 indexed citations
12.
Matsuoka, F., et al.. (1990). Analysis of hot-carrier-induced degradation mode on pMOSFET's. IEEE Transactions on Electron Devices. 37(6). 1487–1495. 45 indexed citations
13.
Nagamatsu, M., S. Tanaka, Makoto Noda, et al.. (1990). A 10 ns 54×54-bit parallel structured full array multiplier with 0.5 μm CMOS technology. 125–126. 7 indexed citations
14.
Toyoshima, Y., Hiroshi Iwai, F. Matsuoka, et al.. (1990). Analysis on gate-oxide thickness dependence of hot-carrier-induced degradation in thin-gate oxide nMOSFET's. IEEE Transactions on Electron Devices. 37(6). 1496–1503. 48 indexed citations
15.
Hayashida, H., et al.. (1989). Dopant redistribution in dual gate W-polycide CMOS and its improvement by RTA. Symposium on VLSI Technology. 1989. 29–30. 26 indexed citations
16.
Toyoshima, Y., F. Matsuoka, H. Hayashida, Hiroshi Iwai, & K. Kanzaki. (1988). Study on gate oxide thickness dependence of hot carrier induced degradation for n-MOSFETs.. Symposium on VLSI Technology. 39–40. 8 indexed citations
17.
Tagami, Keiko, et al.. (1988). Ta additive effect on RF magnetron sputtered CoCr films. IEEE Transactions on Magnetics. 24(6). 2347–2349. 11 indexed citations
18.
Tagami, Keiko, et al.. (1988). Pass wear resistance for perpendicular recording media. IEEE Transactions on Magnetics. 24(6). 2655–2657. 5 indexed citations
19.
Tagami, Keiko & H. Hayashida. (1987). Corrosion rate activation energy of sputtered CoCr perpendicular media. IEEE Transactions on Magnetics. 23(5). 3648–3650. 5 indexed citations
20.
Hayashida, H., et al.. (1978). Development of wear resistant and anti-shelling high strength rails in Japan. 127. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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