Michael Tsuk
-
- Electromagnetic Compatibility and Noise Suppression 12
- Electromagnetic Simulation and Numerical Methods 4
- Electrostatic Discharge in Electronics 3
- Electromagnetic Compatibility and Measurements 3
- Electronic Packaging and Soldering Technologies 2
-
- Lightning and Electromagnetic Phenomena 4
-
- Electromagnetic Scattering and Analysis 3
-
- Advanced Antenna and Metasurface Technologies 3
- Journals
- IEEE Transactions on Electromagnetic Compatibility (1 paper)Electromagnetic waves (1 paper)SAE International journal of commercial vehicles (1 paper)
- Partner nations
- United States
In The Last Decade
Michael Tsuk
16 papers receiving 309 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 284
- Astronomy and Astrophysics 45
- Condensed Matter Physics 30
- Atomic and Molecular Physics, and Optics 76
- Aerospace Engineering 54
Countries citing papers authored by Michael Tsuk
This map shows the geographic impact of Michael Tsuk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Tsuk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Tsuk more than expected).
Fields of papers citing papers by Michael Tsuk
This network shows the impact of papers produced by Michael Tsuk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Tsuk. The network helps show where Michael Tsuk may publish in the future.
Co-authorship network
The 10 scholars most cited alongside Michael Tsuk, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 13 | |
| 2 | 2012 | 1 | |
| 3 | 2010 | 2 | |
| 4 | 2009 | 7 | |
| 5 | 2009 | 1 | |
| 6 | 2004 | 13 | |
| 7 | 2003 | 24 | |
| 8 | 2002 | 11 | |
| 9 | 2002 | 2 | |
| 10 | 1996 | 0 | |
| 11 | 1995 | 5 | |
| 12 | 1995 | 31 | |
| 13 | 1994 | 13 | |
| 14 | 1993 | 68 | |
| 15 | 1993 | 38 | |
| 16 | 1992 | 4 | |
| 17 | 1991 | 100 |
About Michael Tsuk
Michael Tsuk is a scholar working on Electrical and Electronic Engineering, Astronomy and Astrophysics and Aerospace Engineering, having authored 17 papers that have together received 333 indexed citations. Recurring topics across this work include Electromagnetic Compatibility and Noise Suppression (12 papers), Lightning and Electromagnetic Phenomena (4 papers), Electromagnetic Simulation and Numerical Methods (4 papers), Electrostatic Discharge in Electronics (3 papers), Advanced Antenna and Metasurface Technologies (3 papers), Electromagnetic Scattering and Analysis (3 papers), Electromagnetic Compatibility and Measurements (3 papers) and Electronic Packaging and Soldering Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (284 citations), Astronomy and Astrophysics (45 citations) and Condensed Matter Physics (30 citations). Michael Tsuk has collaborated with scholars based in United States. Frequent co-authors include J. A. Kong, Jacob White, M. Kamon, R.T. Shin, P. P. Nguyen, D.E. Oates, Robin J. Evans, K.J. Bois, Xiao Hu and Benjamin H. Kirk. Their work appears in journals such as IEEE Transactions on Electromagnetic Compatibility, Electromagnetic waves, SAE International journal of commercial vehicles, Journal of Electromagnetic Waves and Applications and IEEE Transactions on Microwave Theory and Techniques.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.