G. Zoth

891 citations
10 papers · 710 · h-index 5

Impact in

Papers in

G. Zoth

8 papers receiving 672 citations

Peers

G. Zoth
Comparison fields: 5 of 37
  • Electrical and Electronic Engineering 570
  • Atomic and Molecular Physics, and Optics 286
  • Materials Chemistry 306
  • Surfaces, Coatings and Films 23
  • Computational Mechanics 53
Replace H. Flietner with:
H. Flietner Germany
J. F. Bresse France
R. E. Hollingsworth United States
S. Guerri Italy
L. Bailón Spain
Sebastian Bleikamp Germany
Wolfgang Mehr Germany
Ch. Sommerhalter Germany
T. Kanata Japan
М. В. Степихова Russia
G. Zoth relative to H. Flietner Germany H. Flietner's profile →
Citations per field
00.5×5.3×
H. Flietner · 1×
Citations per year

Countries citing papers authored by G. Zoth

Since Specialization
Citations

This map shows the geographic impact of G. Zoth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Zoth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Zoth more than expected).

Fields of papers citing papers by G. Zoth

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Zoth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Zoth. The network helps show where G. Zoth may publish in the future.

Co-authors

The 25 scholars most cited alongside G. Zoth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with G. Zoth Line = papers co-authored together G. Zoth links everyone, so they are left out of the graph.

All Works

10 of 10 papers shown
#Work
1 1990299
2 2015237
3 1982125
4 199224
5 198813
6 19914
7 19913
8 20013
9 20011
10 19831

About G. Zoth

G. Zoth is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Mechanics of Materials, General Materials Science and Materials Chemistry, having authored 10 papers that have together received 710 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (7 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Semiconductor materials and interfaces (4 papers), Advanced Semiconductor Detectors and Materials (2 papers), Semiconductor materials and devices (2 papers), Thermography and Photoacoustic Techniques (2 papers), Metallurgical and Alloy Processes (1 paper) and Industrial Vision Systems and Defect Detection (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (570 citations), Atomic and Molecular Physics, and Optics (286 citations), Materials Chemistry (306 citations), Surfaces, Coatings and Films (23 citations) and Computational Mechanics (53 citations). G. Zoth has collaborated with scholars based in Germany, Sweden and Cambodia. Frequent co-authors include W. Bergholz, W. Schröter, V. V. Kveder, Yu. A. Osip’yan, Sam Vaziri, Aleksandra Krajewska, Julia Kitzmann, I. Costina, Max C. Lemme and Christian Wenger. Their work appears in journals such as physica status solidi (b), Journal of Applied Physics, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, ACS Nano and Philosophical Magazine B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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