G. E. Stillman
Impact in
- Instrumentation top 5%
- Advanced Optical Sensing Technologies
-
- Semiconductor Quantum Structures and Devices
- Semiconductor materials and interfaces
Papers in
-
- Advanced Optical Sensing Technologies 9
-
- Semiconductor Quantum Structures and Devices 47
- Semiconductor materials and interfaces 11
- Quantum and electron transport phenomena 9
G. E. Stillman
77 papers receiving 1.9k citations
Peers
Comparison fields: 5 of 55
- Instrumentation 243
- Atomic and Molecular Physics, and Optics 1.5k
- Electrical and Electronic Engineering 1.7k
- Condensed Matter Physics 201
- Surfaces, Coatings and Films 62
Countries citing papers authored by G. E. Stillman
This map shows the geographic impact of G. E. Stillman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. E. Stillman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. E. Stillman more than expected).
Fields of papers citing papers by G. E. Stillman
This network shows the impact of papers produced by G. E. Stillman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. E. Stillman. The network helps show where G. E. Stillman may publish in the future.
Co-authors
The 25 scholars most cited alongside G. E. Stillman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1992 | 1 | |
| 2 | 1988 | 18 | |
| 3 | 1985 | 36 | |
| 4 | 1985 | 12 | |
| 5 | 1983 | 41 | |
| 6 | 1982 | 122 | |
| 7 | 1982 | 5 | |
| 8 | 1982 | 59 | |
| 9 | 1982 | 20 | |
| 10 | 1981 | 13 | |
| 11 | 1980 | 162 | |
| 12 | 1979 | 37 | |
| 13 | 1978 | 11 | |
| 14 | 1977 | 3 | |
| 15 | 1976 | 13 | |
| 16 | 1974 | 53 | |
| 17 | 1974 | 22 | |
| 18 | 1970 | 28 | |
| 19 | 1966 | 31 | |
| 20 | 1966 | 32 |
About G. E. Stillman
G. E. Stillman is a scholar working on Instrumentation, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films and Condensed Matter Physics, having authored 79 papers that have together received 2.1k indexed citations. Recurring topics across this work include Semiconductor Quantum Structures and Devices (47 papers), Semiconductor materials and devices (26 papers), Advanced Semiconductor Detectors and Materials (15 papers), Photonic and Optical Devices (14 papers), Semiconductor materials and interfaces (11 papers), Semiconductor Lasers and Optical Devices (11 papers), Quantum and electron transport phenomena (9 papers) and Advanced Optical Sensing Technologies (9 papers). The work is most often cited by research in Instrumentation (243 citations), Atomic and Molecular Physics, and Optics (1.5k citations), Electrical and Electronic Engineering (1.7k citations), Condensed Matter Physics (201 citations) and Surfaces, Coatings and Films (62 citations). G. E. Stillman has collaborated with scholars based in United States and Germany. Frequent co-authors include V. M. Robbins, G. E. Bulman, C. M. Wolfe, L. W. Cook, M.R. Brozel, Inspec, K. Hess, N. Holonyak, J. A. Rossi and T. H. Windhorn. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Electron Devices, Journal of The Electrochemical Society and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.