M.R. Brozel
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- Semiconductor materials and interfaces 26
- Semiconductor Quantum Structures and Devices 17
- Surface and Thin Film Phenomena 7
- Nuclear Energy and Engineering top 10%
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- Semiconductor materials and devices 23
- Silicon and Solar Cell Technologies 14
- Advanced Semiconductor Detectors and Materials 8
- Surfaces, Coatings and Films top 10%
- Condensed Matter Physics top 10%
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- Particle Detector Development and Performance 9
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- Radiation Detection and Scintillator Technologies 6
- Cited by
- Atomic and Molecular Physics, and OpticsNuclear Energy and EngineeringElectrical and Electronic Engineering
- Journals
- Journal of Crystal Growth (8 papers)Applied Physics Letters (6 papers)Semiconductor Science and Technology (4 papers)
- Partner nations
- United KingdomFranceAlgeria
In The Last Decade
M.R. Brozel
57 papers receiving 928 citations
Peers
Comparison fields: 5 of 54
- Atomic and Molecular Physics, and Optics 638
- Nuclear Energy and Engineering 8
- Electrical and Electronic Engineering 750
- Surfaces, Coatings and Films 73
- Condensed Matter Physics 94
Countries citing papers authored by M.R. Brozel
This map shows the geographic impact of M.R. Brozel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.R. Brozel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.R. Brozel more than expected).
Fields of papers citing papers by M.R. Brozel
This network shows the impact of papers produced by M.R. Brozel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.R. Brozel. The network helps show where M.R. Brozel may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M.R. Brozel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 1 | |
| 2 | 1996 | 2 | |
| 3 | 1996 | 11 | |
| 4 | 1992 | 1 | |
| 5 | 1992 | 2 | |
| 6 | 1991 | 2 | |
| 7 | 1990 | 8 | |
| 8 | 1989 | 0 | |
| 9 | 1987 | 9 | |
| 10 | 1987 | 1 | |
| 11 | 1986 | 29 | |
| 12 | 1984 | 23 | |
| 13 | 1983 | 83 | |
| 14 | 1983 | 9 | |
| 15 | 1983 | 1 | |
| 16 | 1982 | 15 | |
| 17 | 1982 | 13 | |
| 18 | 1978 | 51 | |
| 19 | 1978 | 29 | |
| 20 | 1978 | 25 |
About M.R. Brozel
M.R. Brozel is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 63 papers that have together received 1.0k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (26 papers), Semiconductor materials and devices (23 papers), Semiconductor Quantum Structures and Devices (17 papers), Silicon and Solar Cell Technologies (14 papers), Particle Detector Development and Performance (9 papers), Advanced Semiconductor Detectors and Materials (8 papers), Surface and Thin Film Phenomena (7 papers) and Radiation Detection and Scintillator Technologies (6 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (638 citations), Nuclear Energy and Engineering (8 citations) and Electrical and Electronic Engineering (750 citations). M.R. Brozel has collaborated with scholars based in United Kingdom, France and Algeria. Frequent co-authors include Inspec, G. E. Stillman, R. C. Newman, D. J. Stirland, I. Grant, R.M. Ware, J. B. Clegg, M. S. Skolnick, B. Tuck and T. Evans. Their work appears in journals such as Journal of Crystal Growth, Applied Physics Letters, Semiconductor Science and Technology, Materials Science and Engineering B and Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.