Franco Zanon

945 total citations · 1 hit paper
18 papers, 789 citations indexed

About

Franco Zanon is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Franco Zanon has authored 18 papers receiving a total of 789 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 12 papers in Condensed Matter Physics and 3 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Franco Zanon's work include GaN-based semiconductor devices and materials (12 papers), Semiconductor materials and devices (11 papers) and Silicon Carbide Semiconductor Technologies (7 papers). Franco Zanon is often cited by papers focused on GaN-based semiconductor devices and materials (12 papers), Semiconductor materials and devices (11 papers) and Silicon Carbide Semiconductor Technologies (7 papers). Franco Zanon collaborates with scholars based in Italy, Belgium and United States. Franco Zanon's co-authors include Gaudenzio Meneghesso, Enrico Zanoni, Francesca Danesin, Augusto Tazzoli, G. Verzellesi, Matteo Meneghini, Fabiana Rampazzo, Michael J. Uren, Bart Vandevelde and N. Ronchi and has published in prestigious journals such as The Lancet Oncology, IEEE Electron Device Letters and European Journal of Clinical Investigation.

In The Last Decade

Franco Zanon

18 papers receiving 761 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives

2008 531 citations Gaudenzio Meneghesso, G. Verzellesi et al. IEEE Transactions on Device and Materials Reliability profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Franco Zanon Italy	9	688	628	218	161	146	18	789
Hassan Maher France	13	397 0.6×	498 0.8×	152 0.7×	118 0.7×	136 0.9×	71	632
J. Milligan United States	8	822 1.2×	866 1.4×	181 0.8×	197 1.2×	144 1.0×	13	1.0k
N. Killat United Kingdom	11	428 0.6×	385 0.6×	92 0.4×	66 0.4×	171 1.2×	18	480
Hu Liang Belgium	14	536 0.8×	438 0.7×	260 1.2×	161 1.0×	136 0.9×	41	669
D.C. Dumka United States	15	517 0.8×	689 1.1×	90 0.4×	191 1.2×	274 1.9×	39	834
T. Wisleder United States	7	1.2k 1.7×	948 1.5×	412 1.9×	316 2.0×	243 1.7×	8	1.2k
Seema Vinayak India	15	292 0.4×	327 0.5×	128 0.6×	160 1.0×	119 0.8×	39	478
J. O'Shea United States	9	312 0.5×	357 0.6×	72 0.3×	332 2.1×	157 1.1×	14	611
T. Ogura Japan	16	623 0.9×	927 1.5×	255 1.2×	163 1.0×	121 0.8×	37	1.1k
Daisuke Ueda Japan	6	931 1.4×	815 1.3×	451 2.1×	148 0.9×	172 1.2×	13	1.1k

Countries citing papers authored by Franco Zanon

Since Specialization

Citations

This map shows the geographic impact of Franco Zanon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Franco Zanon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Franco Zanon more than expected).

Fields of papers citing papers by Franco Zanon

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Franco Zanon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Franco Zanon. The network helps show where Franco Zanon may publish in the future.

Co-authorship network of co-authors of Franco Zanon

This figure shows the co-authorship network connecting the top 25 collaborators of Franco Zanon. A scholar is included among the top collaborators of Franco Zanon based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Franco Zanon. Franco Zanon is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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18 of 18 papers shown

Vandevelde, Bart, Alessio Griffoni, Franco Zanon, & Geert Willems. (2018). Methodology for Solder-Joint Lifetime Prediction of LED-Based PCB Assemblies. IEEE Transactions on Device and Materials Reliability. 18(3). 377–382. 8 indexed citations

Kauffmann, Steven Kenneth, et al.. (2017). Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems. Microelectronics Reliability. 76-77. 42–46. 8 indexed citations

Vandevelde, Bart, Davy Pissoort, Johan De Baets, et al.. (2017). Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components. Microelectronics Reliability. 74. 131–135. 10 indexed citations

Vandevelde, Bart, Franco Zanon, Alessio Griffoni, et al.. (2015). Impact of solder-joint tilting on the reliability of LED-based PCB assemblies: A combined experimental and FEM analysis. Padua Research Archive (University of Padova). 16. 1–4. 3 indexed citations

Zanoni, Enrico, Gaudenzio Meneghesso, Matteo Meneghini, et al.. (2009). Long-term stability of Gallium Nitride High Electron Mobility Transistors: a reliability physics approach. IRIS UNIMORE (University of Modena and Reggio Emilia). 212–217. 5 indexed citations

Meneghesso, Gaudenzio, Franco Zanon, Michael J. Uren, & Enrico Zanoni. (2009). Anomalous Kink Effect in GaN High Electron Mobility Transistors. IEEE Electron Device Letters. 30(2). 100–102. 89 indexed citations

Verzellesi, G., Mustapha Faqir, Alessandro Chini, et al.. (2009). False surface-trap signatures induced by buffer traps in AlGaN-GaN HEMTs. IRIS UNIMORE (University of Modena and Reggio Emilia). 732–735. 8 indexed citations

Ghio, Luciana, Mariano Ferraresso, Graziella Zacchello, et al.. (2009). Longitudinal evaluation of mycophenolic acid pharmacokinetics in pediatric kidney transplant recipients. The role of post‐transplant clinical and therapeutic variables. Clinical Transplantation. 23(2). 264–270. 16 indexed citations

Ronchi, N., et al.. (2009). Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test. Microelectronics Reliability. 49(9-11). 1207–1210. 9 indexed citations

10.

Chini, Alessandro, F. Fantini, Valerio Di Lecce, et al.. (2009). Correlation between DC and rf degradation due to deep levels in AlGaN/GaN HEMTs. IRIS UNIMORE (University of Modena and Reggio Emilia). 1–4. 32 indexed citations

11.

Zanon, Franco. (2008). Hybrid substrates employment for the development of Gallium Nitride HEMTs: study of reliability and failure modes. The Lancet Oncology. 3(4). 199–199. 2 indexed citations

12.

Meneghesso, Gaudenzio, G. Verzellesi, Francesca Danesin, et al.. (2008). Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives. IEEE Transactions on Device and Materials Reliability. 8(2). 332–343. 531 indexed citations breakdown →

13.

Tazzoli, Augusto, Gaudenzio Meneghesso, Franco Zanon, et al.. (2008). Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields. Microelectronics Reliability. 48(8-9). 1370–1374. 1 indexed citations

14.

Danesin, Francesca, Augusto Tazzoli, Franco Zanon, et al.. (2008). Thermal storage effects on AlGaN/GaN HEMT. Microelectronics Reliability. 48(8-9). 1361–1365. 12 indexed citations

15.

Meneghesso, Gaudenzio, Francesca Danesin, Fabiana Rampazzo, et al.. (2008). Light emission in GaN HEMTs: a powerful characterization and reliability tool. Research Padua Archive (University of Padua). 298–298. 1 indexed citations

16.

Zanoni, Enrico, Gaudenzio Meneghesso, G. Verzellesi, et al.. (2007). A review of failure modes and mechanisms of GaN-based HEMTs. IRIS UNIMORE (University of Modena and Reggio Emilia). 381–384. 42 indexed citations

17.

Danesin, Francesca, Franco Zanon, Simone Gerardin, et al.. (2006). Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability. 46(9-11). 1750–1753. 7 indexed citations

18.

Pengo, Vittorio, et al.. (1989). The optimal therapeutic range for oral anticoagulant treatment as suggested by fibrinopeptide A (FpA) levels in patients with heart valve prostheses. European Journal of Clinical Investigation. 19(2). 181–184. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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