F.H. Gaensslen

4.8k total citations · 1 hit paper
35 papers, 3.2k citations indexed

About

F.H. Gaensslen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Infectious Diseases. According to data from OpenAlex, F.H. Gaensslen has authored 35 papers receiving a total of 3.2k indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 6 papers in Atomic and Molecular Physics, and Optics and 0 papers in Infectious Diseases. Recurrent topics in F.H. Gaensslen's work include Advancements in Semiconductor Devices and Circuit Design (34 papers), Semiconductor materials and devices (32 papers) and Silicon Carbide Semiconductor Technologies (15 papers). F.H. Gaensslen is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (34 papers), Semiconductor materials and devices (32 papers) and Silicon Carbide Semiconductor Technologies (15 papers). F.H. Gaensslen collaborates with scholars based in United States and Canada. F.H. Gaensslen's co-authors include V.L. Rideout, R.H. Dennard, A. LeBlanc, E. Bassous, R.C. Jaeger, E.J. Walker, H.N. Yu, L. Kuhn, Peter W. Cook and S.E. Laux and has published in prestigious journals such as Proceedings of the IEEE, IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.

In The Last Decade

F.H. Gaensslen

35 papers receiving 2.9k citations

Hit Papers

Design of ion-implanted MOSFET's with very small physical... 1974 2026 1991 2008 1974 500 1000 1.5k 2.0k

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F.H. Gaensslen United States 15 2.8k 457 307 305 273 35 3.2k
A. LeBlanc United States 7 2.0k 0.7× 418 0.9× 251 0.8× 286 0.9× 185 0.7× 9 2.4k
E. Bassous United States 16 2.6k 1.0× 440 1.0× 572 1.9× 304 1.0× 339 1.2× 28 3.2k
V.L. Rideout United States 14 3.0k 1.1× 431 0.9× 388 1.3× 289 0.9× 821 3.0× 25 3.5k
P. Olivo Italy 29 3.2k 1.2× 695 1.5× 142 0.5× 677 2.2× 290 1.1× 194 3.7k
M. Bohr United States 28 3.6k 1.3× 513 1.1× 569 1.9× 215 0.7× 344 1.3× 51 4.0k
Tohru Ishihara Japan 20 1.2k 0.4× 1.1k 2.3× 240 0.8× 525 1.7× 113 0.4× 186 2.1k
Sung-Mo Kang United States 26 2.8k 1.0× 427 0.9× 382 1.2× 245 0.8× 79 0.3× 129 3.0k
V. Natarajan India 24 1.7k 0.6× 813 1.8× 492 1.6× 243 0.8× 126 0.5× 112 2.2k
Samuel H. Fuller United States 16 561 0.2× 423 0.9× 237 0.8× 454 1.5× 89 0.3× 55 1.5k
Hirotaka Tamura Japan 23 1.6k 0.6× 177 0.4× 547 1.8× 137 0.4× 212 0.8× 149 2.2k

Countries citing papers authored by F.H. Gaensslen

Since Specialization
Citations

This map shows the geographic impact of F.H. Gaensslen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F.H. Gaensslen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F.H. Gaensslen more than expected).

Fields of papers citing papers by F.H. Gaensslen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F.H. Gaensslen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F.H. Gaensslen. The network helps show where F.H. Gaensslen may publish in the future.

Co-authorship network of co-authors of F.H. Gaensslen

This figure shows the co-authorship network connecting the top 25 collaborators of F.H. Gaensslen. A scholar is included among the top collaborators of F.H. Gaensslen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F.H. Gaensslen. F.H. Gaensslen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Dennard, R.H., et al.. (2007). Design of Ion-Implanted MOSFET's with Very Small Physical Dimensions. 12(1). 38–50. 76 indexed citations
2.
Dennard, R.H., et al.. (1999). Design Of Ion-implanted MOSFET's with Very Small Physical Dimensions. Proceedings of the IEEE. 87(4). 668–678. 81 indexed citations
3.
Gaensslen, F.H. & R.C. Jaeger. (1990). Low Temperature Microelectronics. 8 indexed citations
4.
Gaensslen, F.H., et al.. (1987). Foreword. IEEE Transactions on Electron Devices. 34(1). 1–3. 10 indexed citations
5.
Laux, S.E. & F.H. Gaensslen. (1987). A study of channel avalanche breakdown in scaled n-MOSFET's. IEEE Transactions on Electron Devices. 34(5). 1066–1073. 23 indexed citations
6.
Gaensslen, F.H.. (1986). Liquid nitrogen cooled CMOS. 226–227. 1 indexed citations
7.
Chamberlain, S.G., A. Husain, & F.H. Gaensslen. (1984). Nonuniform displacement of MOSFET channel pinchoff. IEEE Journal of Solid-State Circuits. 19(1). 118–122. 1 indexed citations
8.
Laux, S.E. & F.H. Gaensslen. (1984). A study of avalanche breakdown in scaled n-MOSFETs. 84–87. 4 indexed citations
9.
Jaeger, R.C. & F.H. Gaensslen. (1984). Anomalous MOS capacitance behavior in depletion-mode structures. IEEE Transactions on Electron Devices. 31(12). 1916–1918. 1 indexed citations
10.
Jaeger, R.C., F.H. Gaensslen, & S. E. Diehl. (1983). An Efficient Numerical Algorithm for Simulation of MOS Capacitance. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2(2). 111–116. 16 indexed citations
11.
Jaeger, R.C., S. E. Diehl, & F.H. Gaensslen. (1982). Numerical simulation of MOS capacitance for a wide range of temperatures, impurity profiles and surface state densities. 27. 14–15. 4 indexed citations
12.
Chamberlain, S.G., A. Husain, & F.H. Gaensslen. (1982). Nonuniform displacement of MOSFET channel pinchoff. 745–748. 2 indexed citations
13.
Gaensslen, F.H. & R.C. Jaeger. (1981). Behavior of electrically small depletion mode MOSFETs at low temperature. Solid-State Electronics. 24(3). 215–220. 12 indexed citations
14.
Jaeger, R.C. & F.H. Gaensslen. (1980). Simulation of impurity freezeout through numerical solution of Poisson's equation with application to MOS device behavior. IEEE Transactions on Electron Devices. 27(5). 914–920. 78 indexed citations
15.
Gaensslen, F.H. & R.C. Jaeger. (1979). Temperature dependent threshold behavior of depletion mode MOSFETs. Solid-State Electronics. 22(4). 423–430. 67 indexed citations
16.
Jaeger, R.C. & F.H. Gaensslen. (1979). Simple analytical models for the temperature dependent threshold behavior of depletion-mode devices. IEEE Journal of Solid-State Circuits. 14(2). 423–429. 8 indexed citations
17.
Dennard, R.H., F.H. Gaensslen, E.J. Walker, & Peter W. Cook. (1979). 1 µm MOSFET VLSI technology: Part II—Device designs and characteristics for high-performance logic applications. IEEE Transactions on Electron Devices. 26(4). 325–333. 64 indexed citations
18.
Dennard, R.H., et al.. (1974). Design of ion-implanted MOSFET's with very small physical dimensions. IEEE Journal of Solid-State Circuits. 9(5). 256–268. 2196 indexed citations breakdown →
19.
Rideout, V.L., F.H. Gaensslen, & A. LeBlanc. (1973). Device design considerations for ion implanted MOSFETs. 148–151. 7 indexed citations
20.
Gaensslen, F.H.. (1972). Low power MOSFET memory cells using Schottky-barrier diodes. 50–52. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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